Zoltán Sárkány

408 total citations
47 papers, 286 citations indexed

About

Zoltán Sárkány is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Mechanical Engineering. According to data from OpenAlex, Zoltán Sárkány has authored 47 papers receiving a total of 286 indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Electrical and Electronic Engineering, 7 papers in Materials Chemistry and 5 papers in Mechanical Engineering. Recurrent topics in Zoltán Sárkány's work include Silicon Carbide Semiconductor Technologies (32 papers), Electromagnetic Compatibility and Noise Suppression (12 papers) and Electrostatic Discharge in Electronics (11 papers). Zoltán Sárkány is often cited by papers focused on Silicon Carbide Semiconductor Technologies (32 papers), Electromagnetic Compatibility and Noise Suppression (12 papers) and Electrostatic Discharge in Electronics (11 papers). Zoltán Sárkány collaborates with scholars based in Hungary, Germany and Austria. Zoltán Sárkány's co-authors include M. Rencz, Gábor Farkas, Marcin Janicki, Andrzej Napieralski, Robin Bornoff, Gusztáv Hantos, Árpád Farkas, Imre Balásházy, W. Hofmann and A. Poppe and has published in prestigious journals such as Energies, Inhalation Toxicology and International Journal of Environmental Health Research.

In The Last Decade

Zoltán Sárkány

43 papers receiving 266 citations

Peers

Zoltán Sárkány
Comparison fields: 5 of 47
  • Electrical and Electronic Engineering 223
  • Mechanical Engineering 45
  • Condensed Matter Physics 36
  • Materials Chemistry 31
  • Pulmonary and Respiratory Medicine 16
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Sounil Bhosle France
Hongxian Zhang China
Gusztáv Hantos Hungary
Antonio Pio Catalano Italy
Yang Xue China
Hubert Piquet France
M. Ponce Mexico
Magnar Hernes Norway
Ruiyun Fu United States
Philip Anthony United Kingdom
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Citations per field, relative to Zoltán Sárkány
Zoltán Sárkány · 1×
Citations per year, relative to Zoltán Sárkány
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Countries citing papers authored by Zoltán Sárkány

Since Specialization
Citations

This map shows the geographic impact of Zoltán Sárkány's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Zoltán Sárkány with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Zoltán Sárkány more than expected).

Fields of papers citing papers by Zoltán Sárkány

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Zoltán Sárkány. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Zoltán Sárkány. The network helps show where Zoltán Sárkány may publish in the future.

Co-authorship network of co-authors of Zoltán Sárkány

This figure shows the co-authorship network connecting the top 25 collaborators of Zoltán Sárkány. A scholar is included among the top collaborators of Zoltán Sárkány based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Zoltán Sárkány. Zoltán Sárkány is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
# Work Indexed citations
1 5
2
Issues in Testing Advanced Power Semiconductor Devices
2
3
Packaging and Characterization of Silicon and SiC-based Power Inverter Module with Double Sided Cooling
2
4
Reliability of Double Side Silver Sintered Devices with various Substrate Metallization
3
5 3
6 7
7 3
8 2
9 6
10 12
11 13
12
Thermal transient characterization of pHEMT devices
13
13
Evaluation of the effect of lung morphometry on the deposition of inhaled particles
1
14 2
15
Accurate thermal characterization of power semiconductor packages by thermal simulation and measurements
10
16 15
17 2
18
In-situ characterization of thermal interface materials
1
19
Method for in-situ reliability testing of TIM samples
5
20 8

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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