Yue Hu
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Safety, Risk, Reliability and Quality top 5%
- Automotive Engineering
- Aerospace Engineering
- Co-authors
- Curtis R. MenyukLizhong YangKeith J. WilliamsXiaoyu JuVincent J. UrickXiaodong ZhouYang PengO. V. Sinkin
- Topics
- Advanced Photonic Communication Systems (10 papers)Optical Network Technologies (10 papers)Photonic and Optical Devices (8 papers)
- Cited by
- Safety, Risk, Reliability and QualityAcoustics and UltrasonicsElectrical and Electronic Engineering
- Journals
- Journal of Applied PhysicsAdvanced Functional MaterialsJournal of Colloid and Interface Science
- Partner nations
- ChinaUnited StatesPoland
In The Last Decade
Yue Hu
45 papers receiving 333 citations
Peers
Comparison fields: 5 of 78
- Electrical and Electronic Engineering 227
- Atomic and Molecular Physics, and Optics 95
- Safety, Risk, Reliability and Quality 66
- Automotive Engineering 43
- Aerospace Engineering 33
Countries citing papers authored by Yue Hu
This map shows the geographic impact of Yue Hu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yue Hu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yue Hu more than expected).
Fields of papers citing papers by Yue Hu
This network shows the impact of papers produced by Yue Hu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yue Hu. The network helps show where Yue Hu may publish in the future.
Co-authorship network of co-authors of Yue Hu
This figure shows the co-authorship network connecting the top 25 collaborators of Yue Hu. A scholar is included among the top collaborators of Yue Hu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yue Hu. Yue Hu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 7 | |
| 3 | 3 | |
| 4 | 2 | |
| 5 | 1 | |
| 6 | 5 | |
| 7 | 22 | |
| 8 | 12 | |
| 9 | 3 | |
| 10 | 3 | |
| 11 | 0 | |
| 12 | 2 | |
| 13 | 5 | |
| 14 | 9 | |
| 15 | 20 | |
| 16 | 2 | |
| 17 | 3 | |
| 18 | 3 | |
| 19 | 10 | |
| 20 | 34 |
About Yue Hu
Yue Hu is a scholar working on Acoustics and Ultrasonics, Safety, Risk, Reliability and Quality and Structural Biology, having authored 51 papers that have together received 357 indexed citations. Recurring topics across this work include Advanced Photonic Communication Systems (10 papers), Optical Network Technologies (10 papers) and Photonic and Optical Devices (8 papers). The work is most often cited by research in Safety, Risk, Reliability and Quality (66 citations), Acoustics and Ultrasonics (5 citations) and Electrical and Electronic Engineering (227 citations). Yue Hu has collaborated with scholars based in China, United States and Poland. Frequent co-authors include Curtis R. Menyuk, Lizhong Yang, Keith J. Williams, Xiaoyu Ju, Vincent J. Urick, Xiaodong Zhou, Yang Peng, O. V. Sinkin, Maxim Bolshtyansky and A. N. Pilipetskiǐ. Their work appears in journals such as Journal of Applied Physics, Advanced Functional Materials and Journal of Colloid and Interface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.