Xiangning Lu
- Electrical and Electronic Engineering top 10%
- Mechanical Engineering top 10%
- Mechanics of Materials top 5%
- Industrial and Manufacturing Engineering top 2%
- Control and Systems Engineering top 5%
- Topics
- Industrial Vision Systems and Defect Detection (22 papers)Integrated Circuits and Semiconductor Failure Analysis (15 papers)Electronic Packaging and Soldering Technologies (13 papers)
- Cited by
- Industrial and Manufacturing EngineeringControl and Systems EngineeringMechanics of Materials
- Partner nations
- ChinaUnited StatesTaiwan
In The Last Decade
Xiangning Lu
48 papers receiving 1.0k citations
Peers
Comparison fields: 5 of 77
- Electrical and Electronic Engineering 435
- Mechanical Engineering 313
- Mechanics of Materials 277
- Industrial and Manufacturing Engineering 265
- Control and Systems Engineering 262
Countries citing papers authored by Xiangning Lu
This map shows the geographic impact of Xiangning Lu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Xiangning Lu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Xiangning Lu more than expected).
Fields of papers citing papers by Xiangning Lu
This network shows the impact of papers produced by Xiangning Lu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Xiangning Lu. The network helps show where Xiangning Lu may publish in the future.
Co-authorship network of co-authors of Xiangning Lu
This figure shows the co-authorship network connecting the top 25 collaborators of Xiangning Lu. A scholar is included among the top collaborators of Xiangning Lu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Xiangning Lu. Xiangning Lu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 2 | |
| 3 | 3 | |
| 4 | 1 | |
| 5 | 1 | |
| 6 | 5 | |
| 7 | 1 | |
| 8 | 1 | |
| 9 | 0 | |
| 10 | 34 | |
| 11 | 17 | |
| 12 | 7 | |
| 13 | 11 | |
| 14 | 1 | |
| 15 | 37 | |
| 16 | 1 | |
| 17 | 22 | |
| 18 | 2 | |
| 19 | 8 | |
| 20 | 9 |
About Xiangning Lu
Xiangning Lu is a scholar working on Industrial and Manufacturing Engineering, Mechanics of Materials and Electrical and Electronic Engineering, having authored 50 papers that have together received 1.0k indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (22 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and Electronic Packaging and Soldering Technologies (13 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (265 citations), Control and Systems Engineering (262 citations) and Mechanics of Materials (277 citations). Xiangning Lu has collaborated with scholars based in China, United States and Taiwan. Frequent co-authors include Guanglan Liao, Tielin Shi, Jian Han, W.Y. Liu, Lei Su, Zhenzhi He, Baoping Tang, Ningning Hu, Ningning Hu and Liyi Li. Their work appears in journals such as Renewable and Sustainable Energy Reviews, ACS Applied Materials & Interfaces and Nano Energy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.