X. H. Feng
- Ceramics and Composites top 5%
- Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis 11
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 8
- Materials Chemistry top 10%
- Silicon Nanostructures and Photoluminescence 9
-
- Semiconductor materials and interfaces 5
-
- Semiconductor materials and devices 8
- Thin-Film Transistor Technologies 3
-
- Ion-surface interactions and analysis 4
-
- Nanowire Synthesis and Applications 4
- Journals
- Nature (1 paper)The Journal of Chemical Physics (1 paper)Physical review. B, Condensed matter (2 papers)
- Partner nations
- CanadaUnited StatesChina
In The Last Decade
X. H. Feng
34 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 63
- Ceramics and Composites 154
- Radiation 163
- Surfaces, Coatings and Films 127
- Materials Chemistry 651
- Atomic and Molecular Physics, and Optics 250
Countries citing papers authored by X. H. Feng
This map shows the geographic impact of X. H. Feng's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by X. H. Feng with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites X. H. Feng more than expected).
Fields of papers citing papers by X. H. Feng
This network shows the impact of papers produced by X. H. Feng. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by X. H. Feng. The network helps show where X. H. Feng may publish in the future.
Co-authorship network
The 25 scholars most cited alongside X. H. Feng, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 1 | |
| 2 | 1996 | 3 | |
| 3 | 1995 | 21 | |
| 4 | 1995 | 111 | |
| 5 | 1995 | 113 | |
| 6 | 1995 | 28 | |
| 7 | High-resolution Si and P K- and L-edge XANES spectra of crystalline SiP2O7 and amorphous SiO2-P2O5 | 1994 | 30 |
| 8 | X-ray absorption spectroscopy of silicon dioxide (SiO2) polymorphs : the structural characterization of opal | 1994 | 114 |
| 9 | 1994 | 39 | |
| 10 | 1994 | 17 | |
| 11 | 1993 | 70 | |
| 12 | 1993 | 1 | |
| 13 | 1993 | 3 | |
| 14 | 1992 | 9 | |
| 15 | 1992 | 51 | |
| 16 | 1992 | 16 | |
| 17 | 1991 | 27 | |
| 18 | 1989 | 18 | |
| 19 | 1988 | 20 | |
| 20 | 1987 | 29 |
About X. H. Feng
X. H. Feng is a scholar working on Radiation, Surfaces, Coatings and Films and Ceramics and Composites, having authored 35 papers that have together received 1.2k indexed citations. Recurring topics across this work include X-ray Spectroscopy and Fluorescence Analysis (11 papers), Silicon Nanostructures and Photoluminescence (9 papers), Electron and X-Ray Spectroscopy Techniques (8 papers), Semiconductor materials and devices (8 papers), Semiconductor materials and interfaces (5 papers), Ion-surface interactions and analysis (4 papers), Nanowire Synthesis and Applications (4 papers) and Thin-Film Transistor Technologies (3 papers). The work is most often cited by research in Ceramics and Composites (154 citations), Radiation (163 citations) and Surfaces, Coatings and Films (127 citations). X. H. Feng has collaborated with scholars based in Canada, United States and China. Frequent co-authors include G.M. Bancroft, Michael E. Fleet, Dien Li, Bin Yang, M. Kasrai, K. H. Tan, Dawei Jiang, M. J. Graham, Zhaoming Lu and I. Coulthard. Their work appears in journals such as Nature, The Journal of Chemical Physics and Physical review. B, Condensed matter.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.