W. R. Runyan

1.0k total citations
13 papers, 704 citations indexed

About

W. R. Runyan is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, W. R. Runyan has authored 13 papers receiving a total of 704 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Electrical and Electronic Engineering, 3 papers in Materials Chemistry and 2 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in W. R. Runyan's work include Silicon and Solar Cell Technologies (4 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and solar cell performance optimization (2 papers). W. R. Runyan is often cited by papers focused on Silicon and Solar Cell Technologies (4 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and solar cell performance optimization (2 papers). W. R. Runyan collaborates with scholars based in United States. W. R. Runyan's co-authors include K.E. Bean, W Murray Bullis and Susanne E. Craig and has published in prestigious journals such as Journal of Applied Physics, Journal of The Electrochemical Society and IEEE Transactions on Electron Devices.

In The Last Decade

W. R. Runyan

13 papers receiving 638 citations

Peers

W. R. Runyan

EEE

MC

AMPO

BE

CM

R.V. D'Aiello United States

Peter Harrop United Kingdom

T. Warabisako Japan

Harry Robbins United States

P. Rai‐Choudhury United States

R. B. Comizzoli United States

Takayuki Aoyama Japan

Y. Danto France

P.K. Vasudev United States

Tan Fu Lei Taiwan

R.V. D'Aiello United States

W. R. Runyan

577 ×1.1

EEE

282 ×1.3

MC

216 ×1.1

AMPO

87 ×0.7

BE

23 ×0.6

CM

Citations per year, relative to W. R. Runyan W. R. Runyan (= 1×) peers R.V. D'Aiello

Countries citing papers authored by W. R. Runyan

Since Specialization

Citations

This map shows the geographic impact of W. R. Runyan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. R. Runyan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. R. Runyan more than expected).

Fields of papers citing papers by W. R. Runyan

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W. R. Runyan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. R. Runyan. The network helps show where W. R. Runyan may publish in the future.

Co-authorship network of co-authors of W. R. Runyan

This figure shows the co-authorship network connecting the top 25 collaborators of W. R. Runyan. A scholar is included among the top collaborators of W. R. Runyan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W. R. Runyan. W. R. Runyan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

13 of 13 papers shown

1.

Runyan, W. R. & K.E. Bean. (1990). Semiconductor integrated circuit processing technology. Addison-Wesley eBooks. 137 indexed citations

2.

Bean, K.E. & W. R. Runyan. (1977). Dielectric Isolation: Comprehensive, Current and Future. Journal of The Electrochemical Society. 124(1). 5C–12C. 50 indexed citations

3.

Runyan, W. R.. (1975). Semiconductor Measurements and Instrumentation. CERN Document Server (European Organization for Nuclear Research). 166 indexed citations

4.

Runyan, W. R., et al.. (1973). Nickel-chromium resistor failure modes and their identification. Microelectronics Reliability. 12(2). 125–138. 5 indexed citations

5.

Runyan, W. R., et al.. (1967). An experimental study of drift-field silicon solar cells. IEEE Transactions on Electron Devices. 14(1). 3–9. 8 indexed citations

6.

Runyan, W. R., et al.. (1967). Behavior of Large-Scale Surface Perturbations during Silicon Epitaxial Growth. Journal of The Electrochemical Society. 114(11). 1154–1154. 6 indexed citations

7.

Bullis, W Murray & W. R. Runyan. (1967). Influence of mobility and lifetime variations on drift-field effects in silicon-junction devices. IEEE Transactions on Electron Devices. 14(2). 75–81. 16 indexed citations

8.

Bean, K.E., et al.. (1967). Some Properties of Vapor Deposited Silicon Nitride Films Using the SiH[sub 4]-NH[sub 3]-H[sub 2] System. Journal of The Electrochemical Society. 114(7). 733–733. 78 indexed citations

9.

Runyan, W. R., et al.. (1965). A Concentration Gradient Profiling Method. Journal of The Electrochemical Society. 112(10). 1051–1051. 3 indexed citations

10.

Runyan, W. R.. (1965). Silicon Semiconductor Technology. Medical Entomology and Zoology. 227 indexed citations

11.

Runyan, W. R., et al.. (1961). An ac Silicon Resistivity Meter. Review of Scientific Instruments. 32(7). 824–828. 4 indexed citations

12.

Runyan, W. R.. (1959). Growth of Large Diameter Silicon and Germanium Crystals by the Teal-Little Method. Review of Scientific Instruments. 30(7). 535–540. 2 indexed citations

13.

Runyan, W. R.. (1956). Growth of Large Diameter Silicon and Germanium Single Crystals. Journal of Applied Physics. 27(12). 1562–1562. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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