W. Beyer

6.4k citations
227 papers · 5.1k indexed · h-index 39

W. Beyer

226 papers receiving 5.0k citations

Peers

W. Beyer
Comparison fields: 5 of 66
  • Materials Chemistry 3.9k
  • Electrical and Electronic Engineering 4.2k
  • Ceramics and Composites 332
  • Mechanics of Materials 464
  • Polymers and Plastics 261
Replace W. Fuhs with:
W. Fuhs Germany
G. E. Jellison United States
Paul D. Bristowe United Kingdom
G. Lucovsky United States
W. Skorupa Germany
Hideki Matsumura Japan
H. R. Shanks United States
J. Wong‐Leung Australia
G. Turban France
R. Swanepoel South Africa
W. Beyer relative to W. Fuhs Germany W. Fuhs's profile →
Citations per field
00.5×3.6×
W. Fuhs · 1×
Citations per year

Countries citing papers authored by W. Beyer

Since Specialization
Citations

This map shows the geographic impact of W. Beyer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Beyer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Beyer more than expected).

Fields of papers citing papers by W. Beyer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W. Beyer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Beyer. The network helps show where W. Beyer may publish in the future.

Co-authorship network

The 25 scholars most cited alongside W. Beyer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with W. Beyer Line = papers co-authored together W. Beyer links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20238
2 20233
3 20239
4 20227
5 202110
6 20202
7 201941
8 20186
9 201614
10 20127
11
Improvement of Short-Circuit Current in Multijunction a-Si Based Solar Cells Using TiO2 Anti-Reflection Layer
20072
12
Alternative gases and processes for amorphous and microcrystalline silicon etching
20032
13 2002257
14 19971
15 199718
16 199717
17 199131
18 19902
19 19872
20 197158

About W. Beyer

W. Beyer is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Ceramics and Composites, having authored 227 papers that have together received 5.1k indexed citations. Recurring topics across this work include Thin-Film Transistor Technologies (186 papers), Silicon and Solar Cell Technologies (131 papers), Silicon Nanostructures and Photoluminescence (115 papers), Semiconductor materials and devices (33 papers), Semiconductor materials and interfaces (18 papers), Ion-surface interactions and analysis (17 papers), Diamond and Carbon-based Materials Research (16 papers) and Transition Metal Oxide Nanomaterials (15 papers). The work is most often cited by research in Materials Chemistry (3.9k citations), Electrical and Electronic Engineering (4.2k citations) and Ceramics and Composites (332 citations). W. Beyer has collaborated with scholars based in Germany, Israel and Netherlands. Frequent co-authors include H. Wagner, H. Overhof, U. Zastrow, H. Wagner, H. Stiebig, W. M. M. Kessels, J. Hüpkes, H. Mell, L. Ley and J. Ristein. Their work appears in journals such as Journal of Non-Crystalline Solids, Journal of Applied Physics, Thin Solid Films, Applied Physics Letters and Solid State Communications.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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