H. Overhof

3.7k citations
135 papers · 2.8k indexed · h-index 27
Topics
Semiconductor materials and interfaces (39 papers)Silicon and Solar Cell Technologies (28 papers)Semiconductor materials and devices (25 papers)

In The Last Decade

H. Overhof

129 papers receiving 2.7k citations

Peers

H. Overhof
Comparison fields: 5 of 57
  • Electrical and Electronic Engineering 1.8k
  • Materials Chemistry 1.7k
  • Atomic and Molecular Physics, and Optics 1.0k
  • Condensed Matter Physics 312
  • Electronic, Optical and Magnetic Materials 296
Replace B.C. Cavenett with:
B.C. Cavenett United Kingdom
R. Braunstein United States
W. E. Carlos United States
J.‐Y. Raty Belgium
Oleg Pankratov Germany
F. Detraux Belgium
P. M. Bridenbaugh United States
G. Harbeke United States
R. T. Harley United Kingdom
Nathalie Vast France
H. Overhof relative to B.C. Cavenett United Kingdom B.C. Cavenett's profile →
Citations per field
00.5×3.6×
B.C. Cavenett · 1×
Citations per year

Countries citing papers authored by H. Overhof

Since Specialization
Citations

This map shows the geographic impact of H. Overhof's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Overhof with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Overhof more than expected).

Fields of papers citing papers by H. Overhof

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Overhof. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Overhof. The network helps show where H. Overhof may publish in the future.

Co-authorship network of co-authors of H. Overhof

This figure shows the co-authorship network connecting the top 25 collaborators of H. Overhof. A scholar is included among the top collaborators of H. Overhof based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. Overhof. H. Overhof is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 3
2 18
3 15
4 37
5 20
6 7
7 2
8 41
9 1
10 7
11 3
12 1
13 4
14 2
15 55
16 42
17 6
18 1
19 30
20 77

About H. Overhof

H. Overhof is a scholar working on Ceramics and Composites, Atomic and Molecular Physics, and Optics and Condensed Matter Physics, having authored 135 papers that have together received 2.8k indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (39 papers), Silicon and Solar Cell Technologies (28 papers) and Semiconductor materials and devices (25 papers). The work is most often cited by research in Ceramics and Composites (249 citations), Materials Chemistry (1.7k citations) and Atomic and Molecular Physics, and Optics (1.0k citations). H. Overhof has collaborated with scholars based in Germany, United States and Denmark. Frequent co-authors include W. Beyer, P. Thomas, U. Gerstmann, J.‐M. Spaeth, Thomas Frauenheim, E. Rauls, J. Treusch, M. Cardona, S. Ves and U. Rößler. Their work appears in journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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