Vu Le
Impact in
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- Risk and Safety Analysis
Papers in
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- Simulation Techniques and Applications 8
- Operations Management Techniques 3
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- Electrical Fault Detection and Protection 9
- Integrated Circuits and Semiconductor Failure Analysis 5
- Electrostatic Discharge in Electronics 4
- Co-authors
- Xiu Yao (9 shared papers)Chad Miller (4 shared papers)Bang‐Hung Tsao (2 shared papers)Doug Creighton (12 shared papers)Saeid Nahavandi (9 shared papers)Michael Johnstone (14 shared papers)Christy Chuang‐Stein (1 shared paper)Saeid Nahavandi (1 shared paper)
- Journals
- Soft Computing (2 papers)IEEE Transactions on Power Electronics (2 papers)Expert Systems with Applications (2 papers)IEEE Journal of Emerging and Selected Topics in Power Electronics (1 paper)Economics Letters (1 paper)
- Partner nations
- AustraliaUnited StatesVietnam
In The Last Decade
Vu Le
35 papers receiving 354 citations
Peers
Comparison fields: 5 of 66
- Statistics, Probability and Uncertainty 96
- Medical Laboratory Technology 17
- Radiological and Ultrasound Technology 45
- Control and Systems Engineering 105
- Industrial and Manufacturing Engineering 37
Countries citing papers authored by Vu Le
This map shows the geographic impact of Vu Le's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Vu Le with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Vu Le more than expected).
Fields of papers citing papers by Vu Le
This network shows the impact of papers produced by Vu Le. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Vu Le. The network helps show where Vu Le may publish in the future.
Co-authors
The 25 scholars most cited alongside Vu Le, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 37 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 121 | |
| 2 | 2021 | 31 | |
| 3 | 2022 | 19 | |
| 4 | 2007 | 16 | |
| 5 | 2001 | 15 | |
| 6 | 2019 | 12 | |
| 7 | 2018 | 10 | |
| 8 | 2012 | 10 | |
| 9 | 2010 | 10 | |
| 10 | 2019 | 10 | |
| 11 | 2012 | 8 | |
| 12 | 2021 | 8 | |
| 13 | Kinect crowd interaction | 2012 | 8 |
| 14 | 2015 | 8 | |
| 15 | 2023 | 7 | |
| 16 | 2021 | 7 | |
| 17 | 2023 | 7 | |
| 18 | 2005 | 7 | |
| 19 | 2021 | 5 | |
| 20 | 2017 | 4 |
About Vu Le
Vu Le is a scholar working on Management Science and Operations Research, Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Statistics, Probability and Uncertainty and Computer Networks and Communications, having authored 37 papers that have together received 359 indexed citations. Recurring topics across this work include Electrical Fault Detection and Protection (9 papers), Simulation Techniques and Applications (8 papers), Scheduling and Optimization Algorithms (7 papers), Advanced Manufacturing and Logistics Optimization (7 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Risk and Safety Analysis (4 papers), Electrostatic Discharge in Electronics (4 papers) and Operations Management Techniques (3 papers). The work is most often cited by research in Statistics, Probability and Uncertainty (96 citations), Medical Laboratory Technology (17 citations), Radiological and Ultrasound Technology (45 citations), Control and Systems Engineering (105 citations) and Industrial and Manufacturing Engineering (37 citations). Vu Le has collaborated with scholars based in Australia, United States and Vietnam. Frequent co-authors include Xiu Yao, Chad Miller, Bang‐Hung Tsao, Doug Creighton, Saeid Nahavandi, Michael Johnstone, Christy Chuang‐Stein, Saeid Nahavandi, William Chen and James Zhang. Their work appears in journals such as Soft Computing, IEEE Transactions on Power Electronics, Expert Systems with Applications, IEEE Journal of Emerging and Selected Topics in Power Electronics and Economics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.