Faïda Mhenni
- Control and Systems Engineering top 10%
- Safety, Risk, Reliability and Quality top 5%
- Industrial and Manufacturing Engineering top 5%
- Software top 5%
- Statistics, Probability and Uncertainty top 5%
- Co-authors
- Jean‐Yves CholeyNga NguyenRégis PlateauxMoncef HammadiOlivia PenasAbdelfattah MlikaPeter HehenbergerStanislao Patalano
- Topics
- Systems Engineering Methodologies and Applications (16 papers)Manufacturing Process and Optimization (10 papers)Software Reliability and Analysis Research (9 papers)
In The Last Decade
Faïda Mhenni
32 papers receiving 316 citations
Peers
Comparison fields: 5 of 52
- Control and Systems Engineering 137
- Safety, Risk, Reliability and Quality 128
- Industrial and Manufacturing Engineering 102
- Software 93
- Statistics, Probability and Uncertainty 60
Countries citing papers authored by Faïda Mhenni
This map shows the geographic impact of Faïda Mhenni's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Faïda Mhenni with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Faïda Mhenni more than expected).
Fields of papers citing papers by Faïda Mhenni
This network shows the impact of papers produced by Faïda Mhenni. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Faïda Mhenni. The network helps show where Faïda Mhenni may publish in the future.
Co-authorship network of co-authors of Faïda Mhenni
This figure shows the co-authorship network connecting the top 25 collaborators of Faïda Mhenni. A scholar is included among the top collaborators of Faïda Mhenni based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Faïda Mhenni. Faïda Mhenni is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 1 | |
| 3 | 1 | |
| 4 | 2 | |
| 5 | 3 | |
| 6 | 15 | |
| 7 | 2 | |
| 8 | 1 | |
| 9 | 2 | |
| 10 | 12 | |
| 11 | 1 | |
| 12 | 7 | |
| 13 | 27 | |
| 14 | 1 | |
| 15 | 6 | |
| 16 | 3 | |
| 17 | 10 | |
| 18 | 72 | |
| 19 | 9 | |
| 20 | 13 |
About Faïda Mhenni
Faïda Mhenni is a scholar working on Software, Safety, Risk, Reliability and Quality and Industrial and Manufacturing Engineering, having authored 33 papers that have together received 334 indexed citations. Recurring topics across this work include Systems Engineering Methodologies and Applications (16 papers), Manufacturing Process and Optimization (10 papers) and Software Reliability and Analysis Research (9 papers). The work is most often cited by research in Software (93 citations), Safety, Risk, Reliability and Quality (128 citations) and Industrial and Manufacturing Engineering (102 citations). Faïda Mhenni has collaborated with scholars based in France, Tunisia and Austria. Frequent co-authors include Jean‐Yves Choley, Nga Nguyen, Régis Plateaux, Moncef Hammadi, Olivia Penas, Abdelfattah Mlika, Peter Hehenberger, Stanislao Patalano, Alain Rivière and Ferdinando Vitolo. Their work appears in journals such as IEEE Access, Applied Sciences and Advanced Engineering Informatics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.