V. Orlinov

404 total citations
27 papers, 344 citations indexed

About

V. Orlinov is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Materials Chemistry. According to data from OpenAlex, V. Orlinov has authored 27 papers receiving a total of 344 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 13 papers in Mechanics of Materials and 12 papers in Materials Chemistry. Recurrent topics in V. Orlinov's work include Metal and Thin Film Mechanics (13 papers), Plasma Diagnostics and Applications (9 papers) and Ion-surface interactions and analysis (8 papers). V. Orlinov is often cited by papers focused on Metal and Thin Film Mechanics (13 papers), Plasma Diagnostics and Applications (9 papers) and Ion-surface interactions and analysis (8 papers). V. Orlinov collaborates with scholars based in Bulgaria, Germany and Poland. V. Orlinov's co-authors include I. Petrov, Ivan G. Ivanov, A. Misiuk, J.‐E. Sundgren, В. Ф. Попова, G. Mladenov, V. Tsaneva, Bernd Spangenberg, Chr. Weißmantel and B. Emmoth and has published in prestigious journals such as Thin Solid Films, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Diamond and Related Materials.

In The Last Decade

V. Orlinov

26 papers receiving 332 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
V. Orlinov Bulgaria	10	206	204	189	65	48	27	344
P. D. Davidse United States	8	205 1.0×	116 0.6×	107 0.6×	79 1.2×	59 1.2×	8	339
J. Strümpfel Germany	10	299 1.5×	208 1.0×	257 1.4×	50 0.8×	27 0.6×	13	390
J. Ullmann Germany	10	142 0.7×	195 1.0×	304 1.6×	114 1.8×	28 0.6×	31	403
Shigetaro Ogura Japan	11	206 1.0×	106 0.5×	207 1.1×	115 1.8×	41 0.9×	21	410
M.E. O'Hern United States	9	113 0.5×	262 1.3×	293 1.6×	41 0.6×	33 0.7×	13	391
U. Heisig Germany	13	337 1.6×	334 1.6×	270 1.4×	79 1.2×	61 1.3×	26	508
R. Scholl United States	9	203 1.0×	218 1.1×	170 0.9×	22 0.3×	64 1.3×	20	323
J. Reschke Germany	5	244 1.2×	325 1.6×	306 1.6×	45 0.7×	43 0.9×	9	438
Richard S. Rosler United States	6	223 1.1×	51 0.3×	129 0.7×	50 0.8×	39 0.8×	10	311
Yukio Ichinose Japan	10	120 0.6×	107 0.5×	241 1.3×	31 0.5×	37 0.8×	46	343

Countries citing papers authored by V. Orlinov

Since Specialization

Citations

This map shows the geographic impact of V. Orlinov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Orlinov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Orlinov more than expected).

Fields of papers citing papers by V. Orlinov

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Orlinov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Orlinov. The network helps show where V. Orlinov may publish in the future.

Co-authorship network of co-authors of V. Orlinov

This figure shows the co-authorship network connecting the top 25 collaborators of V. Orlinov. A scholar is included among the top collaborators of V. Orlinov based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with V. Orlinov. V. Orlinov is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Orlinov, V., et al.. (1995). Evaluation and parametric modelling of abrasive wear resistance of ion-plated thin DLC films. Diamond and Related Materials. 4(8). 1041–1045. 9 indexed citations

Petrov, I., Ivan G. Ivanov, V. Orlinov, & J.‐E. Sundgren. (1993). Comparison of magnetron sputter deposition conditions in neon, argon, krypton, and xenon discharges. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 11(5). 2733–2741. 55 indexed citations

Ivanov, Ivan G., et al.. (1992). Electron energy distribution function in a dc magnetron sputtering discharge. Vacuum. 43(8). 837–842. 20 indexed citations

Spangenberg, Bernd, et al.. (1991). Parametric modelling of crystalline quartz RIE in CF4/O2 plasma. Vacuum. 42(7). 495–497. 2 indexed citations

Petrov, I., et al.. (1990). Deposition of carbon films by bias magnetron sputtering in neon and argon. Thin Solid Films. 185(2). 247–256. 10 indexed citations

Petrov, I., et al.. (1989). Effect of ion bombardment during growth on the electrical resistivity of magnetron-sputtered carbon films. Thin Solid Films. 168(2). 239–248. 8 indexed citations

Petrov, I., et al.. (1988). Electrostatic Probe Measurements in the Glow Discharge Plasma of a D. C. Magnetron Sputtering System. Contributions to Plasma Physics. 28(2). 157–167. 59 indexed citations

Petrov, I., et al.. (1988). Influence of the Basic Process Parameters on the Ion/Atom Arrival Rate Ratio during Magnetron Sputter Deposition of Thin Carbon Films. Contributions to Plasma Physics. 28(3). 265–273. 8 indexed citations

Spangenberg, Bernd, et al.. (1986). Reactive ion etching of thin chromium films using a two-layer resist system of polyimide and evaporated silver halide. Thin Solid Films. 138(2). 297–304. 2 indexed citations

10.

Petrov, I., V. Orlinov, & A. Misiuk. (1984). Highly oriented ZnO films obtained by d.c. reactive sputtering of a zinc target. Thin Solid Films. 120(1). 55–67. 50 indexed citations

11.

Orlinov, V., G. Mladenov, I. Petrov, M. Braun, & B. Emmoth. (1982). Angular distribution and sputtering yield of Al and Al2O3 during 40 key argon ion bombardment. Vacuum. 32(12). 747–752. 5 indexed citations

12.

Orlinov, V., et al.. (1980). Mechanical stresses in D.C. reactively sputtered Fe2O3 thin films. Thin Solid Films. 68(2). 333–343. 8 indexed citations

13.

Orlinov, V., et al.. (1980). Structure of aluminium oxide films deposited by d.c. reactive sputtering. Thin Solid Films. 70(1). 111–116. 11 indexed citations

14.

Orlinov, V., et al.. (1980). D.C. reactively sputtered iron oxide films for selectively semitransparent photomasks I: Deposition conditions and optical properties of the films. Thin Solid Films. 67(1). 125–134. 5 indexed citations

15.

Spangenberg, Bernd, G. Mladenov, & V. Orlinov. (1980). Berechnung des schichtwiderstandes für die borimplantation in silizium. Thin Solid Films. 71(1). 1–6. 2 indexed citations

16.

Orlinov, V., et al.. (1980). D.C. reactively sputtered iron oxide films for selectively semitransparent photomasks II: Relation between the structure of the films and their mechanical and chemical properties. Thin Solid Films. 67(1). 135–144. 2 indexed citations

17.

Orlinov, V., et al.. (1978). Direct current reactive sputtering of aluminium. Thin Solid Films. 52(3). 365–371. 15 indexed citations

18.

Orlinov, V., et al.. (1976). D.C. cathode sputtering: influence of the oxygen content in the gas flow on the discharge current. Thin Solid Films. 33(2). 173–183. 23 indexed citations

19.

Orlinov, V. & G. Mladenov. (1969). Dependence of cathode sputtering rate on the pressure in a glow discharge†. International Journal of Electronics. 27(3). 241–247. 2 indexed citations

20.

Orlinov, V. & G. Mladenov. (1969). Dependence of cathode sputtering rate on the current in a glow discharge†. International Journal of Electronics. 27(1). 65–73. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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