Urs Gysin

873 total citations
29 papers, 672 citations indexed

About

Urs Gysin is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Biomedical Engineering. According to data from OpenAlex, Urs Gysin has authored 29 papers receiving a total of 672 indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Atomic and Molecular Physics, and Optics, 15 papers in Electrical and Electronic Engineering and 11 papers in Biomedical Engineering. Recurrent topics in Urs Gysin's work include Force Microscopy Techniques and Applications (23 papers), Mechanical and Optical Resonators (13 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). Urs Gysin is often cited by papers focused on Force Microscopy Techniques and Applications (23 papers), Mechanical and Optical Resonators (13 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). Urs Gysin collaborates with scholars based in Switzerland, Germany and South Korea. Urs Gysin's co-authors include Ernst Meyer, S. Rast, Marcin Kisiel, Thilo Glatzel, Ch. Gerber, L. Marot, P. Vettiger, Enrico Gnecco, Baran Eren and Tom Wirtz and has published in prestigious journals such as Physical Review Letters, Nature Communications and Nature Materials.

In The Last Decade

Urs Gysin

29 papers receiving 650 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Urs Gysin Switzerland 15 500 295 185 159 90 29 672
Brian Borovsky United States 14 495 1.0× 245 0.8× 126 0.7× 158 1.0× 122 1.4× 19 641
R. A. Lux United States 18 271 0.5× 515 1.7× 317 1.7× 161 1.0× 58 0.6× 40 720
Igor Kudryashov United States 14 311 0.6× 374 1.3× 259 1.4× 90 0.6× 82 0.9× 56 662
Torsten Boeck Germany 14 226 0.5× 362 1.2× 217 1.2× 191 1.2× 25 0.3× 75 583
V. I. Ivanov-Omskiĭ Russia 13 335 0.7× 392 1.3× 310 1.7× 51 0.3× 59 0.7× 118 658
D. Srivastava United States 11 168 0.3× 181 0.6× 484 2.6× 92 0.6× 64 0.7× 18 619
P. Fṙanzosi Italy 13 488 1.0× 478 1.6× 221 1.2× 73 0.5× 40 0.4× 92 701
Taisuke Miura Japan 17 436 0.9× 492 1.7× 236 1.3× 48 0.3× 106 1.2× 96 825
Jean‐Noël Aqua France 16 392 0.8× 307 1.0× 272 1.5× 230 1.4× 16 0.2× 42 646
А. В. Войцеховский Russia 15 560 1.1× 728 2.5× 349 1.9× 122 0.8× 42 0.5× 172 948

Countries citing papers authored by Urs Gysin

Since Specialization
Citations

This map shows the geographic impact of Urs Gysin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Urs Gysin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Urs Gysin more than expected).

Fields of papers citing papers by Urs Gysin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Urs Gysin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Urs Gysin. The network helps show where Urs Gysin may publish in the future.

Co-authorship network of co-authors of Urs Gysin

This figure shows the co-authorship network connecting the top 25 collaborators of Urs Gysin. A scholar is included among the top collaborators of Urs Gysin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Urs Gysin. Urs Gysin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kisiel, Marcin, Xiaobo Lu, Urs Gysin, et al.. (2023). Energy dissipation on magic angle twisted bilayer graphene. Communications Physics. 6(1). 344–344. 3 indexed citations
2.
Kisiel, Marcin, et al.. (2019). Mechanical dissipation via image potential states on a topological insulator surface. Nature Materials. 18(11). 1201–1206. 25 indexed citations
3.
Kisiel, Marcin, Oleg O. Brovko, Rémy Pawlak, et al.. (2018). Mechanical dissipation from charge and spin transitions in oxygen-deficient SrTiO3 surfaces. Nature Communications. 9(1). 2946–2946. 22 indexed citations
4.
Rossmann, H., Urs Gysin, Thilo Glatzel, et al.. (2016). Junction Barrier Schottky (JBS) Rectifier Interface Engineering Facilitated by Two-Dimensional (2D) Dopant Imaging. Materials science forum. 858. 497–500. 2 indexed citations
5.
Gysin, Urs, Ernst Meyer, Thilo Glatzel, et al.. (2016). Dopant imaging of power semiconductor device cross sections. Microelectronic Engineering. 160. 18–21. 11 indexed citations
6.
Bartolf, Holger, Urs Gysin, Thilo Glatzel, et al.. (2015). Improving the Design of the Shield for the Electric Field in SiC-Based Schottky-Rectifiers and Ion-Implantation Cascades by SPM Dopant-Imaging. Microelectronic Engineering. 148. 1–4. 5 indexed citations
7.
Kisiel, Marcin, Giuseppe E. Santoro, Rémy Pawlak, et al.. (2015). Noncontact Atomic Force Microscope Dissipation Reveals a Central Peak ofSrTiO3Structural Phase Transition. Physical Review Letters. 115(4). 46101–46101. 17 indexed citations
8.
Gysin, Urs, Thilo Glatzel, Adolf Schöner, et al.. (2015). Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices. Beilstein Journal of Nanotechnology. 6. 2485–2497. 7 indexed citations
9.
Bartolf, Holger, Urs Gysin, H. Rossmann, et al.. (2015). Development of power semiconductors by quantitative nanoscale dopant imaging. DORA PSI (Paul Scherrer Institute). 281–284. 1 indexed citations
10.
Eren, Baran, et al.. (2014). Friction force microscopy studies on SiO2 supported pristine and hydrogenated graphene. Applied Physics Letters. 104(4). 31 indexed citations
11.
Eren, Baran, Thilo Glatzel, Marcin Kisiel, et al.. (2013). Hydrogen plasma microlithography of graphene supported on a Si/SiO2 substrate. Applied Physics Letters. 102(7). 7 indexed citations
12.
Wirtz, Tom, Y.H. Fleming, Urs Gysin, et al.. (2012). Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. Review of Scientific Instruments. 83(6). 63702–63702. 21 indexed citations
13.
Wirtz, Tom, Y.H. Fleming, Urs Gysin, et al.. (2012). Combined SIMS‐SPM instrument for high sensitivity and high‐resolution elemental 3D analysis. Surface and Interface Analysis. 45(1). 513–516. 26 indexed citations
14.
Kisiel, Marcin, Enrico Gnecco, Urs Gysin, et al.. (2011). Suppression of electronic friction on Nb films in the superconducting state. Nature Materials. 10(2). 119–122. 122 indexed citations
15.
Fleming, Y.H., Tom Wirtz, Urs Gysin, et al.. (2011). Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy. Applied Surface Science. 258(4). 1322–1327. 19 indexed citations
16.
Gysin, Urs, et al.. (2011). Magnetic properties of nanomagnetic and biomagnetic systems analyzed using cantilever magnetometry. Nanotechnology. 22(28). 285715–285715. 16 indexed citations
17.
Rast, S., Urs Gysin, & Ernst Meyer. (2009). Phase noise induced due to amplitude fluctuations in dynamic force microscopy. Physical Review B. 79(5). 6 indexed citations
18.
Rast, S., et al.. (2006). Force microscopy experiments with ultrasensitive cantilevers. Nanotechnology. 17(7). S189–S194. 15 indexed citations
19.
Gysin, Urs, et al.. (2004). Temperature dependence of the force sensitivity of silicon cantilevers. Physical Review B. 69(4). 138 indexed citations
20.
Pfeiffer, Olivier, Christian Loppacher, M. Bammerlin, et al.. (2000). Using higher flexural modes in non-contact force microscopy. Applied Surface Science. 157(4). 337–342. 30 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Brian Borovsky Breakdown of academic impact, for papers by R. A. Lux Breakdown of academic impact, for papers by Igor Kudryashov Breakdown of academic impact, for papers by Torsten Boeck Breakdown of academic impact, for papers by V. I. Ivanov-Omskiĭ Breakdown of academic impact, for papers by D. Srivastava Breakdown of academic impact, for papers by P. Fṙanzosi Breakdown of academic impact, for papers by Taisuke Miura Breakdown of academic impact, for papers by Jean‐Noël Aqua Breakdown of academic impact, for papers by А. В. Войцеховский
Rankless by CCL
2026