M. Bammerlin

3.0k total citations · 1 hit paper
35 papers, 2.2k citations indexed

About

M. Bammerlin is a scholar working on Atomic and Molecular Physics, and Optics, Biomedical Engineering and Electrical and Electronic Engineering. According to data from OpenAlex, M. Bammerlin has authored 35 papers receiving a total of 2.2k indexed citations (citations by other indexed papers that have themselves been cited), including 34 papers in Atomic and Molecular Physics, and Optics, 11 papers in Biomedical Engineering and 8 papers in Electrical and Electronic Engineering. Recurrent topics in M. Bammerlin's work include Force Microscopy Techniques and Applications (34 papers), Mechanical and Optical Resonators (23 papers) and Surface and Thin Film Phenomena (11 papers). M. Bammerlin is often cited by papers focused on Force Microscopy Techniques and Applications (34 papers), Mechanical and Optical Resonators (23 papers) and Surface and Thin Film Phenomena (11 papers). M. Bammerlin collaborates with scholars based in Switzerland, Denmark and Germany. M. Bammerlin's co-authors include Ernst Meyer, Roland Bennewitz, Martin Guggisberg, Ch. Loppacher, T. Gyalog, R. Lüthi, A. Baratoff, H.‐J. Güntherodt, Enrico Gnecco and H.‐J. Güntherodt and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

M. Bammerlin

35 papers receiving 2.2k citations

Hit Papers

Velocity Dependence of Atomic Friction 2000 2026 2008 2017 2000 100 200 300 400

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Bammerlin Switzerland 23 2.0k 847 580 505 489 35 2.2k
Ch. Loppacher Switzerland 13 1.1k 0.6× 532 0.6× 392 0.7× 274 0.5× 387 0.8× 22 1.3k
H. Hölscher Germany 23 1.4k 0.7× 528 0.6× 509 0.9× 238 0.5× 310 0.6× 52 1.7k
J. E. Stern United States 7 1.5k 0.7× 572 0.7× 680 1.2× 137 0.3× 257 0.5× 9 1.7k
J. Schneir United States 19 1.7k 0.8× 906 1.1× 927 1.6× 89 0.2× 373 0.8× 37 2.2k
Ph. Niedermann Switzerland 17 747 0.4× 498 0.6× 320 0.6× 93 0.2× 306 0.6× 56 1.2k
Don Horne United States 4 1.8k 0.9× 867 1.0× 729 1.3× 86 0.2× 271 0.6× 6 2.0k
Ahmet Oral Türkiye 19 919 0.5× 448 0.5× 296 0.5× 74 0.1× 286 0.6× 70 1.3k
Yoichi Miyahara Canada 20 804 0.4× 573 0.7× 282 0.5× 93 0.2× 368 0.8× 64 1.2k
G. Neubauer United States 13 614 0.3× 410 0.5× 213 0.4× 263 0.5× 315 0.6× 30 950
R. J. Stephenson United States 14 647 0.3× 662 0.8× 300 0.5× 76 0.2× 297 0.6× 33 1.1k

Countries citing papers authored by M. Bammerlin

Since Specialization
Citations

This map shows the geographic impact of M. Bammerlin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Bammerlin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Bammerlin more than expected).

Fields of papers citing papers by M. Bammerlin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Bammerlin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Bammerlin. The network helps show where M. Bammerlin may publish in the future.

Co-authorship network of co-authors of M. Bammerlin

This figure shows the co-authorship network connecting the top 25 collaborators of M. Bammerlin. A scholar is included among the top collaborators of M. Bammerlin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Bammerlin. M. Bammerlin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Bammerlin, M., et al.. (2010). Nanomechanical Cantilever Sensors as a Novel Tool for Real-Time Monitoring and Characterization of Surface Layer Formation. Journal of Nanoscience and Nanotechnology. 10(4). 2578–2582. 1 indexed citations
2.
Shahgaldian, Patrick, et al.. (2007). Time Resolved Analysis of Molecular Interactions Using Nanomechanical Cantilever Sensors. Journal of Physics Conference Series. 61. 612–617. 3 indexed citations
3.
Lin, Rong, M. Bammerlin, Ole Hansen, R. R. Schlittler, & Peter Bøggild. (2004). Micro-four-point-probe characterization of nanowires fabricated using the nanostencil technique. Nanotechnology. 15(9). 1363–1367. 22 indexed citations
4.
Loppacher, Ch., Martin Guggisberg, Olivier Pfeiffer, et al.. (2003). Direct Determination of the Energy Required to Operate a Single Molecule Switch. Physical Review Letters. 90(6). 66107–66107. 149 indexed citations
5.
Guggisberg, Martin, Olivier Pfeiffer, S. Schär, et al.. (2001). Contrast inversion in nc-AFM on Si(111)7×7 due to short-range electrostatic interactions. Applied Physics A. 72(S1). S19–S22. 8 indexed citations
6.
Barwich, V., M. Bammerlin, A. Baratoff, et al.. (2000). Carbon nanotubes as tips in non-contact SFM. Applied Surface Science. 157(4). 269–273. 28 indexed citations
7.
Loppacher, Ch., M. Bammerlin, Martin Guggisberg, et al.. (2000). Dynamic force microscopy of copper surfaces: Atomic resolution and distance dependence of tip-sample interaction and tunneling current. Physical review. B, Condensed matter. 62(24). 16944–16949. 81 indexed citations
8.
Loppacher, Christian, Roland Bennewitz, Olivier Pfeiffer, et al.. (2000). Experimental aspects of dissipation force microscopy. Physical review. B, Condensed matter. 62(20). 13674–13679. 95 indexed citations
9.
Pfeiffer, Olivier, Christian Loppacher, M. Bammerlin, et al.. (2000). Using higher flexural modes in non-contact force microscopy. Applied Surface Science. 157(4). 337–342. 30 indexed citations
10.
Guggisberg, Martin, M. Bammerlin, A. Baratoff, et al.. (2000). Dynamic force microscopy across steps on the Si(111)-(7×7) surface. Surface Science. 461(1-3). 255–265. 32 indexed citations
11.
Loppacher, Ch., M. Bammerlin, Martin Guggisberg, et al.. (1999). Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques. Applied Surface Science. 140(3-4). 287–292. 47 indexed citations
12.
Eng, Lukas M., M. Bammerlin, Ch. Loppacher, et al.. (1999). Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy. Applied Surface Science. 140(3-4). 253–258. 18 indexed citations
13.
Bennewitz, Roland, M. Bammerlin, Martin Guggisberg, et al.. (1999). Aspects of dynamic force microscopy on NaCl/Cu(111): resolution, tip-sample interactions and cantilever oscillation characteristics. Surface and Interface Analysis. 27(5-6). 462–466. 44 indexed citations
14.
Battiston, F., M. Bammerlin, Ch. Loppacher, et al.. (1998). Combined scanning tunneling and force microscope with fuzzy controlled feedback. Applied Physics A. 66(7). S49–S53. 2 indexed citations
15.
Battiston, F., M. Bammerlin, Christian Loppacher, et al.. (1998). Fuzzy controlled feedback applied to a combined scanning tunneling and force microscope. Applied Physics Letters. 72(1). 25–27. 18 indexed citations
16.
Lüthi, R., M. Bammerlin, & Ernst Meyer. (1997). Atomare Auflösung auf einem Isolator mittels Rasterkraftmikroskopie. Physikalische Blätter. 53(5). 435–435. 3 indexed citations
17.
Lüthi, R., Ernst Meyer, M. Bammerlin, et al.. (1997). ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC RESOLUTION. Surface Review and Letters. 4(5). 1025–1029. 40 indexed citations
18.
Lüthi, R., Ernst Meyer, M. Bammerlin, et al.. (1996). Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7. Zeitschrift für Physik B Condensed Matter. 100(2). 165–167. 73 indexed citations
19.
Meyer, Ernst, R. Lüthi, L. Howald, et al.. (1996). Site-specific friction force spectroscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(2). 1285–1288. 82 indexed citations
20.
Meyer, Ernst, L. Howald, M. Bammerlin, et al.. (1995). Friction force microscopy in ultrahigh vacuum: an atomic-scale study on KBr(001). Tribology Letters. 1(2-3). 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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