T.Y. Huang

1.5k total citations
84 papers, 1.2k citations indexed

About

T.Y. Huang is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, T.Y. Huang has authored 84 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 79 papers in Electrical and Electronic Engineering, 15 papers in Biomedical Engineering and 15 papers in Materials Chemistry. Recurrent topics in T.Y. Huang's work include Semiconductor materials and devices (60 papers), Advancements in Semiconductor Devices and Circuit Design (42 papers) and Thin-Film Transistor Technologies (31 papers). T.Y. Huang is often cited by papers focused on Semiconductor materials and devices (60 papers), Advancements in Semiconductor Devices and Circuit Design (42 papers) and Thin-Film Transistor Technologies (31 papers). T.Y. Huang collaborates with scholars based in Taiwan, United States and Canada. T.Y. Huang's co-authors include I‐Wen Wu, A. Chiang, A.G. Lewis, W. B. Jackson, Horng‐Chih Lin, Richard H. Bruce, W. B. Jackson, Mitsumasa Koyanagi, M. Lütfi Öveçoğlu and Tien‐Sheng Chao and has published in prestigious journals such as Advanced Materials, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

T.Y. Huang

72 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
T.Y. Huang Taiwan 18 1.1k 430 226 134 51 84 1.2k
L. Haji France 14 487 0.4× 483 1.1× 219 1.0× 106 0.8× 56 1.1× 41 644
A. Kalnitsky United States 13 529 0.5× 186 0.4× 92 0.4× 112 0.8× 50 1.0× 47 602
Howard R. Huff United States 19 1.1k 1.0× 347 0.8× 109 0.5× 201 1.5× 80 1.6× 92 1.2k
Hiroya Ikeda Japan 17 584 0.5× 315 0.7× 97 0.4× 223 1.7× 42 0.8× 49 715
T. Gebel Germany 17 681 0.6× 632 1.5× 218 1.0× 150 1.1× 56 1.1× 49 824
Kazushige Takechi Japan 18 1.1k 1.0× 584 1.4× 129 0.6× 43 0.3× 41 0.8× 58 1.1k
M. A. Blauw Netherlands 14 597 0.5× 181 0.4× 171 0.8× 98 0.7× 113 2.2× 32 678
H. Aharoni Israel 18 824 0.8× 527 1.2× 201 0.9× 283 2.1× 33 0.6× 84 930
А.А. Еvtukh Ukraine 15 456 0.4× 529 1.2× 253 1.1× 146 1.1× 50 1.0× 110 766
Huang‐Chung Cheng Taiwan 18 998 0.9× 578 1.3× 267 1.2× 64 0.5× 129 2.5× 120 1.1k

Countries citing papers authored by T.Y. Huang

Since Specialization
Citations

This map shows the geographic impact of T.Y. Huang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.Y. Huang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.Y. Huang more than expected).

Fields of papers citing papers by T.Y. Huang

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T.Y. Huang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.Y. Huang. The network helps show where T.Y. Huang may publish in the future.

Co-authorship network of co-authors of T.Y. Huang

This figure shows the co-authorship network connecting the top 25 collaborators of T.Y. Huang. A scholar is included among the top collaborators of T.Y. Huang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T.Y. Huang. T.Y. Huang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Chang, You-Chia, Yao‐Wei Huang, T.Y. Huang, et al.. (2025). Intelligent Proximity Correction Enabled Large-Area Metasurfaces by KrF Photolithography. IEEE Access. 13. 195517–195525.
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Huang, T.Y., et al.. (2023). 32 × 64 SPAD Imager Using 2-bit In-Pixel Stack-Based Memory for Low-Light Imaging. IEEE Sensors Journal. 23(17). 19272–19281. 7 indexed citations
5.
Huang, T.Y., et al.. (2023). A Dual-Mode Readout Circuit for SPAD Imaging Applications. IEEE Transactions on Circuits & Systems II Express Briefs. 71(4). 1879–1883.
6.
Lin, Ying‐Dar, et al.. (2010). Embedded TaintTracker: Lightweight Tracking of Taint Data against Buffer Overflow Attacks. 1–5. 1 indexed citations
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Huang, T.Y., D. Landheer, Xiaohua Wu, et al.. (2003). Ultrathin Zirconium Silicate Films Deposited on Si(100) Using Zr(O[sup i]-Pr)[sub 2](thd)[sub 2], Si(O[sup t]-Bu)[sub 2](thd)[sub 2], and Nitric Oxide. Journal of The Electrochemical Society. 150(7). C465–C465. 5 indexed citations
9.
Hack, Mike, A. Chiang, T.Y. Huang, et al.. (2003). High-voltage thin film transistors for large area microelectronics. 49. 252–255. 3 indexed citations
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Landheer, D., et al.. (2002). Characterization of thin ZrO2 films deposited using (ZrOi–Pr)2(thd)2 and O2 on Si(100). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 20(3). 1145–1148. 7 indexed citations
12.
Wu, I‐Wen, A.G. Lewis, T.Y. Huang, W. B. Jackson, & A. Chiang. (2002). Mechanism and device-to-device variation of leakage current in polysilicon thin film transistors. 867–870. 13 indexed citations
13.
Chang, Shoou‐Jinn, et al.. (2000). Reduced Reverse Narrow Channel Effect in Thin SOI nMOSFET's. 2 indexed citations
14.
Chang, Chun–Yen, et al.. (2000). Study of boron effects on the reaction of Co and Si1−xGex at various temperatures. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 18(4). 1448–1454. 6 indexed citations
15.
Horng, Ray‐Hua, et al.. (1999). Co-sputtered Ru-Ti alloy electrodes for DRAM applications. Thin Solid Films. 343-344. 598–601. 3 indexed citations
16.
Chiang, A., et al.. (1990). Crystallization of Silicon Ion Implanted LPCVD Amorphous Silicon Films for High Performance Poly-TFT. MRS Proceedings. 182. 10 indexed citations
17.
Huang, T.Y., C. C. Tsai, I‐Wen Wu, et al.. (1990). Cmos Polysilicon Thin Film Transistors with Simultaneously Deposited Layers for Source-Drain and Gate. MRS Proceedings. 182. 1 indexed citations
18.
Wu, I‐Wen, Richard H. Bruce, Mitsumasa Koyanagi, & T.Y. Huang. (1990). Damage To Gate Oxides In Reactive Ion Etching. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1185. 284–284. 20 indexed citations
19.
Huang, T.Y., A.G. Lewis, I‐Wen Wu, A. Chiang, & Richard H. Bruce. (1989). New intra-gate-offset high-voltage thin-film transistor with misalignment immunity. Electronics Letters. 25(8). 544–545. 4 indexed citations
20.
Wu, I‐Wen, Richard H. Bruce, J. C. Mikkelsen, et al.. (1986). Reactive Ion Etching Damage to Shallow Junctions. MRS Proceedings. 68. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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2026