Thomas M. Wallis
Impact in
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- Surface and Thin Film Phenomena
- Quantum and electron transport phenomena
- Force Microscopy Techniques and Applications
- Advanced Chemical Physics Studies
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- Molecular Junctions and Nanostructures
- Microwave and Dielectric Measurement Techniques
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- Advanced Chemical Physics Studies 9
- Surface and Thin Film Phenomena 8
- Force Microscopy Techniques and Applications 6
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- Near-Field Optical Microscopy 18
- Co-authors
- W. HoNiklas NiliusPavel KabošAtif ImtiazJohn MorelandMats PerssonSamuel BerwegerJ. Smoliner
- Journals
- Applied Physics Letters (8 papers)Journal of Applied Physics (4 papers)The Journal of Chemical Physics (4 papers)Physical Review Letters (4 papers)Ultramicroscopy (2 papers)
- Partner nations
- United StatesAustriaPoland
In The Last Decade
Thomas M. Wallis
48 papers receiving 1.4k citations
Peers
Comparison fields: 5 of 53
- Atomic and Molecular Physics, and Optics 884
- Electrical and Electronic Engineering 796
- Biomedical Engineering 556
- Materials Chemistry 467
- Electronic, Optical and Magnetic Materials 130
Countries citing papers authored by Thomas M. Wallis
This map shows the geographic impact of Thomas M. Wallis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas M. Wallis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas M. Wallis more than expected).
Fields of papers citing papers by Thomas M. Wallis
This network shows the impact of papers produced by Thomas M. Wallis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas M. Wallis. The network helps show where Thomas M. Wallis may publish in the future.
Co-authors
The 25 scholars most cited alongside Thomas M. Wallis, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 5 | |
| 2 | 2020 | 13 | |
| 3 | 2018 | 6 | |
| 4 | 2017 | 27 | |
| 5 | 2014 | 3 | |
| 6 | 2014 | 5 | |
| 7 | 2012 | 38 | |
| 8 | 2012 | 7 | |
| 9 | 2011 | 4 | |
| 10 | 2011 | 1 | |
| 11 | 2010 | 116 | |
| 12 | 2008 | 12 | |
| 13 | 2006 | 8 | |
| 14 | 2004 | 9 | |
| 15 | 2004 | 12 | |
| 16 | 2003 | 38 | |
| 17 | 2003 | 66 | |
| 18 | 2003 | 60 | |
| 19 | 2003 | 4 | |
| 20 | 2002 | 100 |
About Thomas M. Wallis
Thomas M. Wallis is a scholar working on Atomic and Molecular Physics, and Optics, Biomedical Engineering, Electrical and Electronic Engineering, Condensed Matter Physics and Atmospheric Science, having authored 49 papers that have together received 1.4k indexed citations. Recurring topics across this work include Near-Field Optical Microscopy (18 papers), Advanced Chemical Physics Studies (9 papers), Surface and Thin Film Phenomena (8 papers), Microwave and Dielectric Measurement Techniques (8 papers), Molecular Junctions and Nanostructures (7 papers), Force Microscopy Techniques and Applications (6 papers), nanoparticles nucleation surface interactions (6 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (884 citations), Electrical and Electronic Engineering (796 citations), Biomedical Engineering (556 citations), Materials Chemistry (467 citations) and Electronic, Optical and Magnetic Materials (130 citations). Thomas M. Wallis has collaborated with scholars based in United States, Austria and Poland. Frequent co-authors include W. Ho, Niklas Nilius, Pavel Kaboš, Atif Imtiaz, John Moreland, Mats Persson, Samuel Berweger, J. Smoliner, Ferry Kienberger and Peter Hinterdorfer. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, The Journal of Chemical Physics, Physical Review Letters and Ultramicroscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.