Takuya Miyayama

692 total citations
31 papers, 549 citations indexed

About

Takuya Miyayama is a scholar working on Computational Mechanics, Materials Chemistry and Electrical and Electronic Engineering. According to data from OpenAlex, Takuya Miyayama has authored 31 papers receiving a total of 549 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Computational Mechanics, 16 papers in Materials Chemistry and 15 papers in Electrical and Electronic Engineering. Recurrent topics in Takuya Miyayama's work include Ion-surface interactions and analysis (25 papers), Diamond and Carbon-based Materials Research (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (12 papers). Takuya Miyayama is often cited by papers focused on Ion-surface interactions and analysis (25 papers), Diamond and Carbon-based Materials Research (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (12 papers). Takuya Miyayama collaborates with scholars based in Japan, Switzerland and United States. Takuya Miyayama's co-authors include N. Sanada, John Hammond, M. Suzuki, Scott R. Bryan, Shin‐ichi Iida, Derk Rading, Alexander G. Shard, Rasmus Havelund, Dan Mao and M. P. Seah and has published in prestigious journals such as Analytical Chemistry, Applied Surface Science and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

In The Last Decade

Takuya Miyayama

28 papers receiving 505 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Takuya Miyayama Japan	12	301	285	244	78	70	31	549
Erick Fuoco United States	10	182 0.6×	125 0.4×	162 0.7×	82 1.1×	103 1.5×	10	363
M. Broglia Argentina	13	43 0.1×	61 0.2×	73 0.3×	23 0.3×	35 0.5×	23	380
Carmen I. Butoi United States	11	47 0.2×	226 0.8×	205 0.8×	112 1.4×	22 0.3×	12	423
Wenhao Shao United States	13	12 0.0×	468 1.6×	509 2.1×	7 0.1×	84 1.2×	28	746
Weng Siang Yeap Belgium	11	24 0.1×	152 0.5×	304 1.2×	10 0.1×	19 0.3×	13	438
Suzanne Ciftan Hens United States	8	32 0.1×	38 0.1×	355 1.5×	9 0.1×	13 0.2×	8	400
Ryan P. Murphy United States	11	11 0.0×	43 0.2×	201 0.8×	54 0.7×	11 0.2×	28	459
Jan Vlček Czechia	13	20 0.1×	224 0.8×	285 1.2×	9 0.1×	15 0.2×	42	465
Cecily Andes United States	12	110 0.4×	296 1.0×	122 0.5×	45 0.6×	8 0.1×	18	686

Countries citing papers authored by Takuya Miyayama

Since Specialization

Citations

This map shows the geographic impact of Takuya Miyayama's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Takuya Miyayama with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Takuya Miyayama more than expected).

Fields of papers citing papers by Takuya Miyayama

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Takuya Miyayama. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Takuya Miyayama. The network helps show where Takuya Miyayama may publish in the future.

Co-authorship network of co-authors of Takuya Miyayama

This figure shows the co-authorship network connecting the top 25 collaborators of Takuya Miyayama. A scholar is included among the top collaborators of Takuya Miyayama based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Takuya Miyayama. Takuya Miyayama is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Chang, Hsun‐Yun, et al.. (2022). X-ray Photoelectron Spectroscopy Equipped with Gas Cluster Ion Beams for Evaluation of the Sputtering Behavior of Various Nanomaterials. ACS Applied Nano Materials. 5(3). 4260–4268. 23 indexed citations

Iida, Shin‐ichi, Gregory L. Fisher, & Takuya Miyayama. (2022). Sample processing by Bi‐FIB for in situ TOF‐SIMS imaging of buried interfaces. Surface and Interface Analysis. 55(3). 209–214. 3 indexed citations

Iida, Shin‐ichi, et al.. (2021). Characterization of cathode-electrolyte interface in all-solid-state batteries using TOF-SIMS, XPS, and UPS/LEIPS. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 39(4). 23 indexed citations

Sambalova, Olga, Emanuel Billeter, Jennifer E. Mann, et al.. (2020). Hard and soft X‐ray photoelectron spectroscopy for selective probing of surface and bulk chemical compositions in a perovskite‐type Ni catalyst. Surface and Interface Analysis. 52(12). 811–817. 14 indexed citations

Siol, Sebastian, Jennifer E. Mann, John Newman, et al.. (2020). Concepts for chemical state analysis at constant probing depth by lab‐based XPS/HAXPES combining soft and hard X‐ray sources. Surface and Interface Analysis. 52(12). 802–810. 40 indexed citations

Miyayama, Takuya & Shin‐ichi Iida. (2020). Bismuth adducted intact molecular ions [M + Bi]+ under low-energy bismuth cluster ion beams. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 38(3). 1 indexed citations

Iida, Shin‐ichi, et al.. (2019). Time‐of‐flight secondary ion tandem mass spectrometry depth profiling of organic light‐emitting diode devices for elucidating the degradation process. Rapid Communications in Mass Spectrometry. 34(7). e8640–e8640. 8 indexed citations

Iida, Shin‐ichi, et al.. (2019). Development of the Curved Surface Sample Holder for TOF-SIMS Imaging. Journal of Surface Analysis. 25(3). 181–191. 1 indexed citations

Miyayama, Takuya & Shin‐ichi Iida. (2018). Low-energy bismuth primary ion beams for molecular ion detection in TOF-SIMS. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 36(3). 3 indexed citations

10.

Bryan, Scott R., Gregory L. Fisher, Paul E. Larson, et al.. (2017). Use of High Energy Collision Induced Dissociation (HE-CID) in TOF-SIMS for Unambiguous Peak Identification and Imaging. Journal of Surface Analysis. 24(2). 167–169. 1 indexed citations

11.

Miyayama, Takuya. (2016). Practical Application of Argon Gas Cluster Ion Beam in X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry. Journal of the Japan Society for Precision Engineering. 82(4). 320–324.

12.

Miyayama, Takuya. (2016). Argon Gas Cluster Ion Beam for Practical Surface Analysis. Journal of the Vacuum Society of Japan. 59(5). 134–137.

13.

Waki, Michihiko, et al.. (2015). Palmitic acid, verified by lipid profiling using secondary ion mass spectrometry, demonstrates anti-multiple myeloma activity. Leukemia Research. 39(6). 638–645. 20 indexed citations

14.

Iida, Shin‐ichi, Takuya Miyayama, Gregory L. Fisher, et al.. (2014). A new approach for determining accurate chemical distributions using in‐situ GCIB cross‐section imaging. Surface and Interface Analysis. 46(S1). 83–86. 11 indexed citations

15.

Fujimoto, Hiroshi, Tomohiko Edura, Takuya Miyayama, N. Sanada, & Chihaya Adachi. (2014). Accurate measurement of dopant concentration in organic light-emitting diodes by combining high-performance liquid chromatography and TOF-SIMS. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 32(3). 8 indexed citations

16.

Fujimoto, Hiroshi, Takuya Miyayama, N. Sanada, & Chihaya Adachi. (2013). Plasma-tolerant structure for organic light-emitting diodes with aluminum cathodes fabricated by DC magnetron sputtering: Using a Li-doped electron transport layer. Organic Electronics. 14(11). 2994–2999. 18 indexed citations

17.

Miyayama, Takuya. (2013). Practical Applications of Argon Gas Cluster Ion Beam for X-ray Photoelectron Spectroscopy and Time-of-flight Secondary Ion Mass Spectrometry. Journal of the Vacuum Society of Japan. 56(9). 348–354. 3 indexed citations

18.

Iida, Shin‐ichi, Takuya Miyayama, N. Sanada, et al.. (2010). Optimizing C ₆₀ incidence angle for polymer depth profiling by ToF‐SIMS. Surface and Interface Analysis. 43(1-2). 214–216. 4 indexed citations

19.

Miyayama, Takuya, N. Sanada, Shin‐ichi Iida, John Hammond, & M. Suzuki. (2008). The effect of angle of incidence to low damage sputtering of organic polymers using a C60 ion beam. Applied Surface Science. 255(4). 951–953. 28 indexed citations

20.

Miyayama, Takuya, et al.. (2007). Influence of C60 Ion Beam Angle of Incidence Upon XPS Depth Profiling for Polymers. Hyomen Kagaku. 28(9). 504–508. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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