Derk Rading

741 total citations
28 papers, 571 citations indexed

About

Derk Rading is a scholar working on Computational Mechanics, Materials Chemistry and Analytical Chemistry. According to data from OpenAlex, Derk Rading has authored 28 papers receiving a total of 571 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Computational Mechanics, 10 papers in Materials Chemistry and 9 papers in Analytical Chemistry. Recurrent topics in Derk Rading's work include Ion-surface interactions and analysis (25 papers), Analytical chemistry methods development (9 papers) and Diamond and Carbon-based Materials Research (6 papers). Derk Rading is often cited by papers focused on Ion-surface interactions and analysis (25 papers), Analytical chemistry methods development (9 papers) and Diamond and Carbon-based Materials Research (6 papers). Derk Rading collaborates with scholars based in Germany, United States and United Kingdom. Derk Rading's co-authors include E. Niehuis, Rudolf Moellers, A. Benninghoven, Alexander G. Shard, Reinhard Kersting, Felix Kollmer, Yang Li, Dan Mao, Takuya Miyayama and R. Möllers and has published in prestigious journals such as Journal of the American Chemical Society, Advanced Materials and Analytical Chemistry.

In The Last Decade

Derk Rading

26 papers receiving 557 citations

Peers

Derk Rading
U. Kaiser Germany
Chris Evans United States
James A. Kinsinger United States
L. Moro Italy
Gordon Rinke Germany
U. Kaiser Germany
Derk Rading
Citations per year, relative to Derk Rading Derk Rading (= 1×) peers U. Kaiser

Countries citing papers authored by Derk Rading

Since Specialization
Citations

This map shows the geographic impact of Derk Rading's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Derk Rading with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Derk Rading more than expected).

Fields of papers citing papers by Derk Rading

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Derk Rading. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Derk Rading. The network helps show where Derk Rading may publish in the future.

Co-authorship network of co-authors of Derk Rading

This figure shows the co-authorship network connecting the top 25 collaborators of Derk Rading. A scholar is included among the top collaborators of Derk Rading based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Derk Rading. Derk Rading is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sheng, Huaming, et al.. (2023). Leveraging ToF-SIMS imaging to investigate tenofovir disoproxil fumarate degradation at excipient interfaces in oral compressed tablets. Journal of Pharmaceutical and Biomedical Analysis. 239. 115863–115863. 2 indexed citations
2.
Muramoto, Shin, Derk Rading, Brian Bush, Greg Gillen, & David G. Castner. (2014). Low-temperature plasma for compositional depth profiling of crosslinking organic multilayers: comparison with C60and giant argon gas cluster sources. Rapid Communications in Mass Spectrometry. 28(18). 1971–1978. 8 indexed citations
3.
Rading, Derk, et al.. (2014). Time-of-Flight Secondary Ion Mass Spectroscopy with Bismuth Primary Ions of Clean and Air-Exposed Surfaces of Tellurium. European Journal of Mass Spectrometry. 20(6). 429–436. 2 indexed citations
4.
Niehuis, E., et al.. (2014). Dual beam depth profiling of organic materials: assessment of capabilities and limitations. Surface and Interface Analysis. 46(S1). 70–73. 6 indexed citations
5.
Niehuis, E., et al.. (2012). Analysis of organic multilayers and 3D structures using Ar cluster ions. Surface and Interface Analysis. 45(1). 158–162. 51 indexed citations
6.
Kollmer, Felix, et al.. (2012). Novel Cluster Ion Beams For Secondary Ion Generation, Sputtering And FIB/SIMS Application. Microscopy and Microanalysis. 18(S2). 904–905.
7.
Rading, Derk, et al.. (2012). Dual beam depth profiling of polymer materials: comparison of C 60 and Ar cluster ion beams for sputtering. Surface and Interface Analysis. 45(1). 171–174. 67 indexed citations
8.
Rading, Derk, Rudolf Moellers, Felix Kollmer, Wolfgang Paul, & E. Niehuis. (2010). Dual beam depth profiling of organic materials: Variations of analysis and sputter beam conditions. Surface and Interface Analysis. 43(1-2). 198–200. 16 indexed citations
9.
Sjövall, Peter, Derk Rading, Santanu Ray, Yang Li, & Alexander G. Shard. (2009). Sample Cooling or Rotation Improves C60 Organic Depth Profiles of Multilayered Reference Samples: Results from a VAMAS Interlaboratory Study. The Journal of Physical Chemistry B. 114(2). 769–774. 53 indexed citations
10.
Grehl, Thomas, et al.. (2008). Depth profiling of organic materials using improved ion beam conditions. Applied Surface Science. 255(4). 966–969. 42 indexed citations
11.
Grehl, Thomas, R. Möllers, E. Niehuis, & Derk Rading. (2008). Application of TOF-SIMS for high precision ion implant dosimetry: Possibilities and limitations. Applied Surface Science. 255(4). 1404–1407. 2 indexed citations
12.
Martin, Robert, Derk Rading, Reinhard Kersting, et al.. (2006). Depth profiling of ion‐implanted AlInN using time‐of‐flight secondary ion mass spectrometry and cathodoluminescence. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 3(6). 1927–1930. 8 indexed citations
13.
Médard, Nicolas, A. Benninghoven, Derk Rading, et al.. (2002). Antioxidant segregation and crystallisation at polyester surfaces studied by ToF-SIMS. Applied Surface Science. 203-204. 571–574. 19 indexed citations
14.
Rading, Derk, Reinhard Kersting, & A. Benninghoven. (2000). Secondary ion emission from molecular overlayers: Thiols on gold. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 18(2). 312–319. 24 indexed citations
15.
Rading, Derk, et al.. (1998). Investigation of electron induced damaging of molecular overlayers by imaging static secondary ion mass spectroscopy. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 16(6). 3449–3454. 8 indexed citations
16.
Rading, Derk, et al.. (1993). Secondary ion emission from perfluorinated polyethers using megaelectronvolt and kiloelectronvolt ion bombardment. Analytical Chemistry. 65(15). 1947–1953. 13 indexed citations
17.
Rading, Derk, et al.. (1993). Comparative investigations of the secondary ion emission of metal complexes under MeV and keV ion bombardment. Organic Mass Spectrometry. 28(8). 841–852. 3 indexed citations
18.
Rading, Derk, et al.. (1992). High Mass Resolution Plasma Desorption and Secondary Ion Mass Spectrometry of Neutral Nickel Thiolate Complexes. Crystal Structure of [Ni6(SC3H7)12]. Zeitschrift für Naturforschung B. 47(7). 929–936. 17 indexed citations
19.
Rading, Derk, et al.. (1990). Secondary ion mass spectra of gold super clusters up to 140000 dalton. Zeitschrift für Physik D Atoms Molecules and Clusters. 17(1). 73–76. 14 indexed citations
20.
Rading, Derk, et al.. (1990). Formation of very large gold superclusters (clusters of clusters) as secondary ions up to (Au13)55 by SIMS. Journal of the American Chemical Society. 112(22). 8166–8167. 28 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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