T. W. Hamilton
- Electrical and Electronic Engineering top 10%
- Mechanics of Materials top 10%
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Radiology, Nuclear Medicine and Imaging
- Co-authors
- J. R. WoodworthB. P. AragonM. E. RileyPaul MillerG. A. HebnerMatthew G. BlainRobert JareckiC. G. Willison
- Topics
- Plasma Diagnostics and Applications (14 papers)Semiconductor materials and devices (6 papers)Metal and Thin Film Mechanics (6 papers)
- Cited by
- Mechanics of MaterialsElectrical and Electronic EngineeringElectronic, Optical and Magnetic Materials
- Journals
- Applied Physics LettersJournal of Applied PhysicsJournal of Vacuum Science & Technology A Vacuum Surfaces and Films
- Partner nations
- United States
In The Last Decade
T. W. Hamilton
16 papers receiving 397 citations
Peers
Comparison fields: 5 of 30
- Electrical and Electronic Engineering 379
- Mechanics of Materials 180
- Electronic, Optical and Magnetic Materials 77
- Materials Chemistry 72
- Radiology, Nuclear Medicine and Imaging 48
Countries citing papers authored by T. W. Hamilton
This map shows the geographic impact of T. W. Hamilton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. W. Hamilton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. W. Hamilton more than expected).
Fields of papers citing papers by T. W. Hamilton
This network shows the impact of papers produced by T. W. Hamilton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. W. Hamilton. The network helps show where T. W. Hamilton may publish in the future.
Co-authorship network of co-authors of T. W. Hamilton
This figure shows the co-authorship network connecting the top 25 collaborators of T. W. Hamilton. A scholar is included among the top collaborators of T. W. Hamilton based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T. W. Hamilton. T. W. Hamilton is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 4 | |
| 2 | 1 | |
| 3 | 26 | |
| 4 | 16 | |
| 5 | 14 | |
| 6 | 47 | |
| 7 | 5 | |
| 8 | 73 | |
| 9 | 49 | |
| 10 | 8 | |
| 11 | 22 | |
| 12 | 7 | |
| 13 | 20 | |
| 14 | 38 | |
| 15 | 54 | |
| 16 | 23 |
About T. W. Hamilton
T. W. Hamilton is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Bioengineering, having authored 16 papers that have together received 407 indexed citations. Recurring topics across this work include Plasma Diagnostics and Applications (14 papers), Semiconductor materials and devices (6 papers) and Metal and Thin Film Mechanics (6 papers). The work is most often cited by research in Mechanics of Materials (180 citations), Electrical and Electronic Engineering (379 citations) and Electronic, Optical and Magnetic Materials (77 citations). T. W. Hamilton has collaborated with scholars based in United States. Frequent co-authors include J. R. Woodworth, B. P. Aragon, M. E. Riley, Paul Miller, G. A. Hebner, Matthew G. Blain, Robert Jarecki, C. G. Willison, R. J. Shul and Demetre J. Economou. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.