T. L. Alford
- Electrical and Electronic Engineering top 1%
- Materials Chemistry top 2%
- Biomedical Engineering top 2%
- Electronic, Optical and Magnetic Materials top 2%
- Polymers and Plastics top 2%
- Co-authors
- N. David TheodoreJ. W. MayerHauk HanH.C. KimSayantan DasDaniel AdamsDavid R. AlleeM. Mitkova
- Topics
- Semiconductor materials and devices (89 papers)Copper Interconnects and Reliability (68 papers)Thin-Film Transistor Technologies (43 papers)
- Cited by
- Electrical and Electronic EngineeringElectronic, Optical and Magnetic MaterialsMaterials Chemistry
- Partner nations
- United StatesChinaNigeria
In The Last Decade
T. L. Alford
279 papers receiving 5.3k citations
Peers
Comparison fields: 5 of 162
- Electrical and Electronic Engineering 3.4k
- Materials Chemistry 2.5k
- Biomedical Engineering 1.2k
- Electronic, Optical and Magnetic Materials 1.0k
- Polymers and Plastics 708
Countries citing papers authored by T. L. Alford
This map shows the geographic impact of T. L. Alford's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. L. Alford with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. L. Alford more than expected).
Fields of papers citing papers by T. L. Alford
This network shows the impact of papers produced by T. L. Alford. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. L. Alford. The network helps show where T. L. Alford may publish in the future.
Co-authorship network of co-authors of T. L. Alford
This figure shows the co-authorship network connecting the top 25 collaborators of T. L. Alford. A scholar is included among the top collaborators of T. L. Alford based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T. L. Alford. T. L. Alford is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 5 | |
| 3 | 221 | |
| 4 | 2 | |
| 5 | 7 | |
| 6 | 40 | |
| 7 | Characterizing and addressing student learning issues and misconceptions (SLIMs) in materials science with muddiest point reflections and fast formative feedback | 4 |
| 8 | 4 | |
| 9 | 52 | |
| 10 | 47 | |
| 11 | 57 | |
| 12 | 54 | |
| 13 | 16 | |
| 14 | 12 | |
| 15 | 2 | |
| 16 | 19 | |
| 17 | 1 | |
| 18 | 0 | |
| 19 | 3 | |
| 20 | 3 |
About T. L. Alford
T. L. Alford is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Polymers and Plastics, having authored 290 papers that have together received 5.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (89 papers), Copper Interconnects and Reliability (68 papers) and Thin-Film Transistor Technologies (43 papers). The work is most often cited by research in Electrical and Electronic Engineering (3.4k citations), Electronic, Optical and Magnetic Materials (1.0k citations) and Materials Chemistry (2.5k citations). T. L. Alford has collaborated with scholars based in United States, China and Nigeria. Frequent co-authors include N. David Theodore, J. W. Mayer, Hauk Han, H.C. Kim, Sayantan Das, Daniel Adams, David R. Allee, M. Mitkova, Aditya S. Yerramilli and Stephen W. Russell. Their work appears in journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.