Hauk Han

645 total citations
11 papers, 577 citations indexed

About

Hauk Han is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Hauk Han has authored 11 papers receiving a total of 577 indexed citations (citations by other indexed papers that have themselves been cited), including 9 papers in Electrical and Electronic Engineering, 8 papers in Materials Chemistry and 5 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Hauk Han's work include ZnO doping and properties (8 papers), Copper Interconnects and Reliability (5 papers) and Gas Sensing Nanomaterials and Sensors (4 papers). Hauk Han is often cited by papers focused on ZnO doping and properties (8 papers), Copper Interconnects and Reliability (5 papers) and Gas Sensing Nanomaterials and Sensors (4 papers). Hauk Han collaborates with scholars based in United States, South Africa and China. Hauk Han's co-authors include T. L. Alford, J. W. Mayer, N. David Theodore, Daniel Adams, John S. Lewis, Shanthi Iyer, Sonia Grego, Kyoungjun Lee, Tingting Niu and Hao Gao and has published in prestigious journals such as Journal of Applied Physics, Journal of Physics D Applied Physics and Thin Solid Films.

In The Last Decade

Hauk Han

11 papers receiving 567 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Hauk Han United States 9 457 423 123 107 90 11 577
Tien-Chai Lin Taiwan 14 406 0.9× 377 0.9× 145 1.2× 78 0.7× 84 0.9× 40 557
Ralf Detemple Germany 10 426 0.9× 583 1.4× 87 0.7× 150 1.4× 127 1.4× 15 645
S. Ishibashi Japan 5 341 0.7× 315 0.7× 84 0.7× 44 0.4× 70 0.8× 7 424
Shumei Song China 14 430 0.9× 403 1.0× 101 0.8× 82 0.8× 77 0.9× 24 587
Satoru Takaki Japan 11 674 1.5× 669 1.6× 175 1.4× 121 1.1× 97 1.1× 18 812
J. Trube Germany 10 372 0.8× 328 0.8× 58 0.5× 81 0.8× 60 0.7× 22 482
Hideo Sonohara Japan 8 577 1.3× 645 1.5× 135 1.1× 88 0.8× 116 1.3× 9 723
Wen-Fa Wu Taiwan 10 452 1.0× 429 1.0× 139 1.1× 98 0.9× 34 0.4× 12 574
M. Ruske Germany 12 401 0.9× 380 0.9× 65 0.5× 72 0.7× 63 0.7× 21 539
L.C.S. Murthy India 5 292 0.6× 255 0.6× 69 0.6× 58 0.5× 46 0.5× 11 377

Countries citing papers authored by Hauk Han

Since Specialization
Citations

This map shows the geographic impact of Hauk Han's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hauk Han with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hauk Han more than expected).

Fields of papers citing papers by Hauk Han

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Hauk Han. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hauk Han. The network helps show where Hauk Han may publish in the future.

Co-authorship network of co-authors of Hauk Han

This figure shows the co-authorship network connecting the top 25 collaborators of Hauk Han. A scholar is included among the top collaborators of Hauk Han based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hauk Han. Hauk Han is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

11 of 11 papers shown
2.
Han, Hauk, N. David Theodore, & T. L. Alford. (2008). Improved conductivity and mechanism of carrier transport in zinc oxide with embedded silver layer. Journal of Applied Physics. 103(1). 217 indexed citations
3.
Han, Hauk & T. L. Alford. (2008). Texture and surface morphology evolution of Ag(Cu) layers on indium tin oxide thin films. Journal of Physics D Applied Physics. 41(15). 155306–155306. 4 indexed citations
4.
Han, Hauk, et al.. (2007). Influence of defects and processing parameters on the properties of indium tin oxide films on polyethylene napthalate substrate. Journal of Applied Physics. 102(6). 18 indexed citations
5.
Han, Hauk, et al.. (2007). Improved surface morphology and texture of Ag films on indium tin oxide via Cu additions. Journal of Applied Physics. 102(3). 27 indexed citations
6.
Han, Hauk, et al.. (2007). Copper enhanced (111) texture in silver thin films on amorphous SiO2. Journal of Applied Physics. 102(8). 8 indexed citations
7.
Han, Hauk, et al.. (2006). Tungsten–titanium diffusion barriers for silver metallization. Thin Solid Films. 515(4). 1998–2002. 42 indexed citations
8.
Han, Hauk, J. W. Mayer, & T. L. Alford. (2006). Band gap shift in the indium-tin-oxide films on polyethylene napthalate after thermal annealing in air. Journal of Applied Physics. 100(8). 127 indexed citations
9.
Han, Hauk, J. W. Mayer, & T. L. Alford. (2006). Effect of various annealing environments on electrical and optical properties of indium tin oxide on polyethylene napthalate. Journal of Applied Physics. 99(12). 37 indexed citations
10.
Han, Hauk, Daniel Adams, J. W. Mayer, & T. L. Alford. (2005). Characterization of the physical and electrical properties of Indium tin oxide on polyethylene napthalate. Journal of Applied Physics. 98(8). 82 indexed citations
11.
Han, Hauk, et al.. (1988). The investigation on the microstructure of magnetron sputtering ion plated Al/Cu film: The effect of substrate negative bias voltage. Scripta Metallurgica. 22(6). 757–760. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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