R. Jaeger
- Surfaces, Coatings and Films top 0.5%
- Electron and X-Ray Spectroscopy Techniques 21
- Radiation top 1%
- X-ray Spectroscopy and Fluorescence Analysis 12
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- Advanced Chemical Physics Studies 24
- Surface and Thin Film Phenomena 6
- Atomic and Molecular Physics 6
- Spectroscopy and Quantum Chemical Studies 2
- Catalysis top 5%
- Materials Chemistry top 5%
- Catalytic Processes in Materials Science 17
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- Ion-surface interactions and analysis 4
R. Jaeger
42 papers receiving 2.6k citations
Hit Papers
Peers
Comparison fields: 5 of 69
- Surfaces, Coatings and Films 788
- Radiation 489
- Atomic and Molecular Physics, and Optics 1.5k
- Catalysis 242
- Materials Chemistry 1.4k
Countries citing papers authored by R. Jaeger
This map shows the geographic impact of R. Jaeger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Jaeger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Jaeger more than expected).
Fields of papers citing papers by R. Jaeger
This network shows the impact of papers produced by R. Jaeger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Jaeger. The network helps show where R. Jaeger may publish in the future.
Co-authorship network
The 25 scholars most cited alongside R. Jaeger, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 0 | |
| 2 | 2015 | 21 | |
| 3 | 1993 | 46 | |
| 4 | 1993 | 50 | |
| 5 | 1993 | 24 | |
| 6 | Formation of a well-ordered aluminium oxide overlayer by oxidation of NiAl(110)breakdown → | 1991 | 486 |
| 7 | 1991 | 216 | |
| 8 | 1990 | 16 | |
| 9 | 1983 | 43 | |
| 10 | 1983 | 24 | |
| 11 | 1983 | 48 | |
| 12 | 1983 | 58 | |
| 13 | 1982 | 38 | |
| 14 | 1982 | 332 | |
| 15 | 1982 | 2 | |
| 16 | 1982 | 38 | |
| 17 | 1982 | 45 | |
| 18 | 1981 | 46 | |
| 19 | 1981 | 70 | |
| 20 | 1980 | 58 |
About R. Jaeger
R. Jaeger is a scholar working on Surfaces, Coatings and Films, Radiation, Atomic and Molecular Physics, and Optics, Materials Chemistry and Catalysis, having authored 43 papers that have together received 2.7k indexed citations. Recurring topics across this work include Advanced Chemical Physics Studies (24 papers), Electron and X-Ray Spectroscopy Techniques (21 papers), Catalytic Processes in Materials Science (17 papers), X-ray Spectroscopy and Fluorescence Analysis (12 papers), Surface and Thin Film Phenomena (6 papers), Atomic and Molecular Physics (6 papers), Ion-surface interactions and analysis (4 papers) and Spectroscopy and Quantum Chemical Studies (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (788 citations), Radiation (489 citations), Atomic and Molecular Physics, and Optics (1.5k citations), Catalysis (242 citations) and Materials Chemistry (1.4k citations). R. Jaeger has collaborated with scholars based in United States, Germany and United Kingdom. Frequent co-authors include J. Stöhr, S. Brennan, H. Kuhlenbeck, T. Kendelewicz, H.‐J. Freund, Matthias Wuttig, H. Ibach, R. Franchy, W. Hoffmann and D. Norman. Their work appears in journals such as Surface Science, Physical review. B, Condensed matter, Physical Review Letters, Journal of Electron Spectroscopy and Related Phenomena and Physics of Plasmas.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.