Sven Kalker
About
In The Last Decade
Sven Kalker
16 papers receiving 283 citations
Peers
Comparison fields: 5 of 25
- Electrical and Electronic Engineering 269
- Mechanical Engineering 41
- Renewable Energy, Sustainability and the Environment 31
- Control and Systems Engineering 24
- Automotive Engineering 14
Countries citing papers authored by Sven Kalker
This map shows the geographic impact of Sven Kalker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Sven Kalker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Sven Kalker more than expected).
Fields of papers citing papers by Sven Kalker
This network shows the impact of papers produced by Sven Kalker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Sven Kalker. The network helps show where Sven Kalker may publish in the future.
Co-authorship network of co-authors of Sven Kalker
This figure shows the co-authorship network connecting the top 25 collaborators of Sven Kalker. A scholar is included among the top collaborators of Sven Kalker based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Sven Kalker. Sven Kalker is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Title | Journal | Authors | Indexed citations |
|---|---|---|---|---|
| 1 | A Sparsity-Promoting Time Domain Evaluation Method for Thermal Transient Measurement of Power Semiconductors | IEEE Transactions on Power Electronics | Yi Zhang, Anton Evgrafov et al. | 2 |
| 2 | Diagnosing Thermal-Interface Aging of Power Devices Using Self-Sensing | IEEE Transactions on Power Electronics | Christoph H. van der Broeck, Sven Kalker et al. | 0 |
| 3 | Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs | IEEE Transactions on Power Electronics | Yi Zhang, Yichi Zhang et al. | 5 |
| 4 | Degradation Diagnosis During Active Power Cycling via Frequency-Domain Thermal Impedance Spectroscopy | Fraunhofer-Publica (Fraunhofer-Gesellschaft) | Sven Kalker, Rik W. De Doncker et al. | 0 |
| 5 | Utilizing Electroluminescence of Silicon IGBTs for Junction Temperature Sensing | Sven Kalker, Rik W. De Doncker et al. | 1 | |
| 6 | Sensitivity Analysis Method of Temperature-Dependent Parameters During Turn-on Process of SiC Power MOSFETs | Sven Kalker, Huang‐Jen Chiu et al. | 0 | |
| 7 | Diagnosing Degradation in Power Modules Using Phase Delay Changes of Electrical Response | Christoph H. van der Broeck, Sven Kalker et al. | 4 | |
| 8 | Self-Calibrating Loss Models for Real-Time Monitoring of Power Modules Based on Artificial Neural Networks | 2022 IEEE Energy Conversion Congress and Exposition (ECCE) | Sven Kalker, Christoph H. van der Broeck et al. | 8 |
| 9 | Intelligent Gate Drivers for Future Power Converters | IEEE Transactions on Power Electronics | Sven Kalker, Christoph H. van der Broeck et al. | 60 |
| 10 | Online Junction-Temperature Extraction Method for SiC MOSFETs Utilizing Turn-on Delay | Sven Kalker, Christoph H. van der Broeck et al. | 4 | |
| 11 | Research on Active Thermal Control: Actual Status and Future Trends | IEEE Journal of Emerging and Selected Topics in Power Electronics | Christoph H. van der Broeck, Markus Andresen et al. | 51 |
| 12 | Junction-Temperature Sensing of Paralleled SiC MOSFETs Utilizing Temperature Sensitive Optical Parameters | Sven Kalker, Rik W. De Doncker et al. | 6 | |
| 13 | Reviewing Thermal-Monitoring Techniques for Smart Power Modules | IEEE Journal of Emerging and Selected Topics in Power Electronics | Sven Kalker, Christoph H. van der Broeck et al. | 54 |
| 14 | Intelligent Monitoring and Maintenance Technology for Next-Generation Power Electronic Systems | IEEE Journal of Emerging and Selected Topics in Power Electronics | Christoph H. van der Broeck, Sven Kalker et al. | 16 |
| 15 | Next Generation Monitoring of SiC mosfets Via Spectral Electroluminescence Sensing | IEEE Transactions on Industry Applications | Sven Kalker, Christoph H. van der Broeck et al. | 20 |
| 16 | Online Junction-Temperature Sensing of SiC MOSFETs with Minimal Calibration Effort | Sven Kalker, Christoph H. van der Broeck et al. | 14 | |
| 17 | Utilizing Electroluminescence of SiC MOSFETs for Unified Junction-Temperature and Current Sensing | Sven Kalker, Christoph H. van der Broeck et al. | 19 | |
| 18 | In-situ Thermal Impedance Spectroscopy of Power Electronic Modules for Localized Degradation Identification | Christoph H. van der Broeck, Sven Kalker et al. | 23 | |
| 19 | Fast-Charging Technologies, Topologies and Standards | Sven Kalker, Antonello Monti et al. | 4 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.