He Niu

417 total citations
12 papers, 337 citations indexed

About

He Niu is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, He Niu has authored 12 papers receiving a total of 337 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Electrical and Electronic Engineering, 1 paper in Condensed Matter Physics and 1 paper in Atomic and Molecular Physics, and Optics. Recurrent topics in He Niu's work include Silicon Carbide Semiconductor Technologies (11 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers) and Advanced DC-DC Converters (5 papers). He Niu is often cited by papers focused on Silicon Carbide Semiconductor Technologies (11 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers) and Advanced DC-DC Converters (5 papers). He Niu collaborates with scholars based in United States. He Niu's co-authors include R. D. Lorenz and has published in prestigious journals such as IEEE Transactions on Power Electronics and IEEE Transactions on Industry Applications.

In The Last Decade

He Niu

12 papers receiving 334 citations

Peers

He Niu

EEE

ME

RESE

EOMM

AMPO

Avinash S. Kashyap United States

Benjamin Wrzecionko Switzerland

Xingchen Zhao United States

Thomas Duerbaum Germany

Kaiçar Ammous Tunisia

Eric R. Motto Japan

Abdul Basit Mirza United States

Umamaheswara Vemulapati Switzerland

D. Barlini Switzerland

Georges Engelmann Germany

Avinash S. Kashyap United States

He Niu

530 ×1.6

EEE

78 ×0.9

ME

11 ×0.5

RESE

17 ×0.8

EOMM

37 ×1.9

AMPO

Citations per year, relative to He Niu He Niu (= 1×) peers Avinash S. Kashyap

Countries citing papers authored by He Niu

Since Specialization

Citations

This map shows the geographic impact of He Niu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by He Niu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites He Niu more than expected).

Fields of papers citing papers by He Niu

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by He Niu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by He Niu. The network helps show where He Niu may publish in the future.

Co-authorship network of co-authors of He Niu

This figure shows the co-authorship network connecting the top 25 collaborators of He Niu. A scholar is included among the top collaborators of He Niu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with He Niu. He Niu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

12 of 12 papers shown

1.

Niu, He & R. D. Lorenz. (2017). Real-Time Junction Temperature Sensing for Silicon Carbide MOSFET With Different Gate Drive Topologies and Different Operating Conditions. IEEE Transactions on Power Electronics. 33(4). 3424–3440. 49 indexed citations

2.

Niu, He. (2017). The effect of load properties on the reliability of machine drives — The temperature and stress analysis of power module bond wires. 2533–2539. 19 indexed citations

3.

Niu, He. (2017). A review of power cycle driven fatigue, aging, and failure modes for semiconductor power modules. 1–8. 27 indexed citations

4.

Niu, He & R. D. Lorenz. (2016). Evaluating Different Implementations of Online Junction Temperature Sensing for Switching Power Semiconductors. IEEE Transactions on Industry Applications. 53(1). 391–401. 51 indexed citations

5.

Niu, He & R. D. Lorenz. (2016). Sensing Gallium Nitride HEMT junction temperature using gate drive output transient properties. 12 indexed citations

6.

Niu, He & R. D. Lorenz. (2015). Evaluating different implementations of online junction temperature sensing for switching power semiconductors. 38. 5696–5703. 20 indexed citations

7.

Niu, He & R. D. Lorenz. (2015). The effect of gate drive topology on online silicon carbide MOSFET junction temperature sensing. 2. 7015–7022. 17 indexed citations

8.

Niu, He & R. D. Lorenz. (2015). Sensing Power MOSFET Junction Temperature Using Gate Drive Turn-On Current Transient Properties. IEEE Transactions on Industry Applications. 52(2). 1677–1687. 51 indexed citations

9.

Niu, He & R. D. Lorenz. (2015). Sensing IGBT junction temperature using gate drive output transient properties. 2492–2499. 29 indexed citations

10.

Niu, He & R. D. Lorenz. (2014). Sensing Power MOSFET Junction Temperature Using Circuit Output Current Ringing Decay. IEEE Transactions on Industry Applications. 51(2). 1763–1773. 25 indexed citations

11.

Niu, He & R. D. Lorenz. (2014). Sensing power MOSFET junction temperature using gate drive turn-on current transient properties. 23 indexed citations

12.

Niu, He & R. D. Lorenz. (2013). Sensing power MOSFET junction temperature using circuit output current ringing decay. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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