Siegwalt Ludke
- Computer Vision and Pattern Recognition top 5%
- Computer Graphics and Computer-Aided Design top 2%
- Radiology, Nuclear Medicine and Imaging top 10%
- Computational Mechanics top 10%
- Biomedical Engineering
- Co-authors
- H. E. ClineWilliam E. LorensenBruce C. TeeterCarl R. CrawfordCharles L. DumoulinDaniel R. ThedensDwight G. NishimuraCraig H. Meyer
- Topics
- Medical Image Segmentation Techniques (2 papers)Advanced MRI Techniques and Applications (2 papers)Embedded Systems Design Techniques (1 paper)
- Cited by
- Computer Graphics and Computer-Aided DesignComputer Vision and Pattern RecognitionComputational Mechanics
- Partner nations
- United StatesChile
In The Last Decade
Siegwalt Ludke
5 papers receiving 418 citations
Peers
Comparison fields: 5 of 84
- Computer Vision and Pattern Recognition 221
- Computer Graphics and Computer-Aided Design 169
- Radiology, Nuclear Medicine and Imaging 143
- Computational Mechanics 142
- Biomedical Engineering 70
Countries citing papers authored by Siegwalt Ludke
This map shows the geographic impact of Siegwalt Ludke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Siegwalt Ludke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Siegwalt Ludke more than expected).
Fields of papers citing papers by Siegwalt Ludke
This network shows the impact of papers produced by Siegwalt Ludke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Siegwalt Ludke. The network helps show where Siegwalt Ludke may publish in the future.
Co-authorship network of co-authors of Siegwalt Ludke
This figure shows the co-authorship network connecting the top 25 collaborators of Siegwalt Ludke. A scholar is included among the top collaborators of Siegwalt Ludke based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Siegwalt Ludke. Siegwalt Ludke is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 11 | |
| 2 | 23 | |
| 3 | 263 | |
| 4 | 0 | |
| 5 | 152 | |
| 6 | 9 |
About Siegwalt Ludke
Siegwalt Ludke is a scholar working on Computer Graphics and Computer-Aided Design, Hardware and Architecture and Computer Vision and Pattern Recognition, having authored 6 papers that have together received 458 indexed citations. Recurring topics across this work include Medical Image Segmentation Techniques (2 papers), Advanced MRI Techniques and Applications (2 papers) and Embedded Systems Design Techniques (1 paper). The work is most often cited by research in Computer Graphics and Computer-Aided Design (169 citations), Computer Vision and Pattern Recognition (221 citations) and Computational Mechanics (142 citations). Siegwalt Ludke has collaborated with scholars based in United States and Chile. Frequent co-authors include H. E. Cline, William E. Lorensen, Bruce C. Teeter, Carl R. Crawford, Charles L. Dumoulin, Daniel R. Thedens, Dwight G. Nishimura, Craig H. Meyer, Bob S. Hu and Pablo Irarrázaval. Their work appears in journals such as Magnetic Resonance in Medicine, Medical Physics and Magnetic Resonance Imaging.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.