Scott Hinaga

498 total citations
30 papers, 418 citations indexed

About

Scott Hinaga is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Computational Mechanics. According to data from OpenAlex, Scott Hinaga has authored 30 papers receiving a total of 418 indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Electrical and Electronic Engineering, 14 papers in Mechanics of Materials and 6 papers in Computational Mechanics. Recurrent topics in Scott Hinaga's work include Electromagnetic Compatibility and Noise Suppression (16 papers), Microwave and Dielectric Measurement Techniques (14 papers) and Material Properties and Processing (13 papers). Scott Hinaga is often cited by papers focused on Electromagnetic Compatibility and Noise Suppression (16 papers), Microwave and Dielectric Measurement Techniques (14 papers) and Material Properties and Processing (13 papers). Scott Hinaga collaborates with scholars based in United States, China and Russia. Scott Hinaga's co-authors include James L. Drewniak, Marina Y. Koledintseva, Soumya De, Han Gao, Yuanzhuo Liu, A. V. Rakov, Victor Khilkevich, R. Joe Stanley, Antonio Ciccomancini Scogna and Zhou Fan and has published in prestigious journals such as IEEE Transactions on Electromagnetic Compatibility and 2011 IEEE MTT-S International Microwave Symposium.

In The Last Decade

Scott Hinaga

28 papers receiving 367 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Scott Hinaga United States 13 355 86 50 48 47 30 418
M.K. Iyer Singapore 12 470 1.3× 23 0.3× 64 1.3× 46 1.0× 30 0.6× 68 560
Dong Joon Kim South Korea 9 179 0.5× 97 1.1× 13 0.3× 91 1.9× 9 0.2× 34 324
J. Stanley United States 7 131 0.4× 32 0.4× 20 0.4× 11 0.2× 62 1.3× 16 231
Kei Murayama Japan 12 252 0.7× 15 0.2× 75 1.5× 21 0.4× 112 2.4× 47 387
P. Alpern Germany 12 269 0.8× 125 1.5× 17 0.3× 31 0.6× 22 0.5× 32 325
Mengran Liao China 7 279 0.8× 28 0.3× 15 0.3× 8 0.2× 37 0.8× 18 398
John L. Prince United States 7 282 0.8× 30 0.3× 42 0.8× 18 0.4× 6 0.1× 16 323
V. Sarihan United States 12 352 1.0× 167 1.9× 30 0.6× 29 0.6× 8 0.2× 37 455
C.J. Hang China 8 280 0.8× 49 0.6× 69 1.4× 56 1.2× 7 0.1× 9 381
Venkatesh Sundaram United States 13 366 1.0× 28 0.3× 49 1.0× 26 0.5× 11 0.2× 23 407

Countries citing papers authored by Scott Hinaga

Since Specialization
Citations

This map shows the geographic impact of Scott Hinaga's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Scott Hinaga with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Scott Hinaga more than expected).

Fields of papers citing papers by Scott Hinaga

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Scott Hinaga. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Scott Hinaga. The network helps show where Scott Hinaga may publish in the future.

Co-authorship network of co-authors of Scott Hinaga

This figure shows the co-authorship network connecting the top 25 collaborators of Scott Hinaga. A scholar is included among the top collaborators of Scott Hinaga based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Scott Hinaga. Scott Hinaga is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Khilkevich, Victor & Scott Hinaga. (2024). Modelling Weave effect in PCBs using 2D cross-sectional analysis. 330–335.
2.
Liu, Yuanzhuo, et al.. (2022). Dielectric Loss Tangent Extraction Using Two Single-ended Striplines of Different Width. 86–91. 1 indexed citations
3.
Liu, Yuanzhuo, et al.. (2020). S-Parameter De-Embedding Error Estimation Based on the Statistical Circuit Models of Fixtures. IEEE Transactions on Electromagnetic Compatibility. 62(4). 1459–1467. 18 indexed citations
4.
Khilkevich, Victor, Yuanzhuo Liu, Han Gao, et al.. (2020). Dielectric Loss Tangent Extraction Using Modal Measurements and 2-D Cross-Sectional Analysis for Multilayer PCBs. IEEE Transactions on Electromagnetic Compatibility. 62(4). 1278–1292. 23 indexed citations
5.
Khilkevich, Victor, Yuanzhuo Liu, Jiayi He, et al.. (2020). Resistance Modeling for Striplines with Different Surface Roughness on the Planes. 4 indexed citations
6.
7.
Khilkevich, Victor, Yuanzhuo Liu, Han Gao, et al.. (2020). A Cross-sectional Profile Based Model for Stripline Conductor Surface Roughness. 11 indexed citations
8.
Gao, Han, Qian Liu, Victor Khilkevich, et al.. (2016). Design methodology for behavioral surface roughness model. 927–931. 8 indexed citations
9.
Koledintseva, Marina Y., et al.. (2014). Effective roughness dielectric in a PCB: Measurement and full-wave simulation verification. 798–802. 5 indexed citations
10.
Koledintseva, Marina Y., et al.. (2014). Improved Experiment-Based Technique to Characterize Dielectric Properties of Printed Circuit Boards. IEEE Transactions on Electromagnetic Compatibility. 56(6). 1559–1566. 22 indexed citations
11.
Koledintseva, Marina Y., et al.. (2014). Elimination of Conductor Foil Roughness Effects in Characterization of Dielectric Properties of Printed Circuit Boards. 3 indexed citations
12.
Rakov, A. V., Marina Y. Koledintseva, James L. Drewniak, & Scott Hinaga. (2013). Major error and sensitivity analysis for characterization of laminate dielectrics on PCB striplines. 1. 852–857. 5 indexed citations
13.
Hinaga, Scott, et al.. (2012). Determination of Copper Foil Surface Roughness from Micro-Section Photographs. 3. 1556–1590. 1 indexed citations
14.
Koledintseva, Marina Y., et al.. (2012). PCB conductor surface roughness as a layer with effective material parameters. 138–143. 23 indexed citations
15.
De, Soumya, et al.. (2012). Semi-automatic copper foil surface roughness detection from PCB microsection images. 132–137. 20 indexed citations
16.
Koledintseva, Marina Y., et al.. (2011). Experiment-Based Separation of Conductor and Dielectric Loss in PCB Striplines TP5-5. 2. 1100. 1 indexed citations
17.
Koledintseva, Marina Y., et al.. (2011). Experiment-Based Separation of Conductor Loss from Dielectric Loss in PCB Striplines. 2. 1052. 2 indexed citations
18.
Koledintseva, Marina Y., et al.. (2011). Differential and extrapolation techniques for extracting dielectric loss of printed circuit board laminates. 2011 IEEE MTT-S International Microwave Symposium. 1–4. 10 indexed citations
19.
Koledintseva, Marina Y., et al.. (2009). Separating Dielectric and Conductor Loss for Rough Striplines in Printed Circuit Boards. 8 indexed citations
20.
Koledintseva, Marina Y., et al.. (2009). Improved technique for extracting parameters of low-loss dielectrics on printed circuit boards. 191–196. 30 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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