M. S. Mock

1.7k total citations
33 papers, 1.2k citations indexed

About

M. S. Mock is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Mathematical Physics. According to data from OpenAlex, M. S. Mock has authored 33 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 9 papers in Computational Mechanics and 7 papers in Mathematical Physics. Recurrent topics in M. S. Mock's work include Advancements in Semiconductor Devices and Circuit Design (11 papers), Silicon and Solar Cell Technologies (8 papers) and Silicon Carbide Semiconductor Technologies (7 papers). M. S. Mock is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (11 papers), Silicon and Solar Cell Technologies (8 papers) and Silicon Carbide Semiconductor Technologies (7 papers). M. S. Mock collaborates with scholars based in United States, Israel and Netherlands. M. S. Mock's co-authors include T. Toyabe, Ken Yamaguchi, S. Asai, Peter D. Lax, A. G. W. Cameron and S. M. Hu and has published in prestigious journals such as Nature, Journal of Computational Physics and Mathematics of Computation.

In The Last Decade

M. S. Mock

32 papers receiving 1.0k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. S. Mock United States 18 534 350 225 190 152 33 1.2k
Ivar Stakgold United States 11 124 0.2× 119 0.3× 254 1.1× 287 1.5× 145 1.0× 27 869
Paola Pietra Italy 13 289 0.5× 587 1.7× 172 0.8× 227 1.2× 233 1.5× 39 933
Naoufel Ben Abdallah France 16 199 0.4× 99 0.3× 215 1.0× 89 0.5× 70 0.5× 54 610
F. Poupaud France 17 116 0.2× 360 1.0× 718 3.2× 201 1.1× 53 0.3× 36 1.1k
N. Ben Abdallah France 15 322 0.6× 158 0.5× 269 1.2× 113 0.6× 43 0.3× 28 796
Andrew B. White United States 13 98 0.2× 548 1.6× 112 0.5× 131 0.7× 335 2.2× 28 906
Yingda Cheng United States 19 256 0.5× 872 2.5× 303 1.3× 69 0.4× 429 2.8× 67 1.2k
John Lund United States 16 67 0.1× 148 0.4× 167 0.7× 200 1.1× 425 2.8× 31 861
Euan A. Spence United Kingdom 20 375 0.7× 319 0.9× 85 0.4× 278 1.5× 134 0.9× 53 953
Klaus Böhmer Germany 14 73 0.1× 215 0.6× 55 0.2× 195 1.0× 201 1.3× 36 635

Countries citing papers authored by M. S. Mock

Since Specialization
Citations

This map shows the geographic impact of M. S. Mock's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. S. Mock with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. S. Mock more than expected).

Fields of papers citing papers by M. S. Mock

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. S. Mock. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. S. Mock. The network helps show where M. S. Mock may publish in the future.

Co-authorship network of co-authors of M. S. Mock

This figure shows the co-authorship network connecting the top 25 collaborators of M. S. Mock. A scholar is included among the top collaborators of M. S. Mock based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. S. Mock. M. S. Mock is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Mock, M. S.. (1986). Basic theory of stationary numerical models. 159–194. 4 indexed citations
2.
Mock, M. S.. (1985). Analysis and Simulation of Semiconductor Devices (Siegfried Selberherr). SIAM Review. 27(3). 469–470. 5 indexed citations
3.
Mock, M. S.. (1984). ANALYSIS OF A DISCRETIZATION ALGORITHM FOR STATIONARY CONTINUITY EQUATIONS IN SEMICONDUCTOR DEVICE MODELS, II. COMPEL The International Journal for Computation and Mathematics in Electrical and Electronic Engineering. 3(3). 137–149. 22 indexed citations
4.
Mock, M. S.. (1980). Systems of conservation laws of mixed type. Journal of Differential Equations. 37(1). 70–88. 130 indexed citations
5.
Mock, M. S.. (1980). A topological degree for orbits connecting critical points of autonomous systems. Journal of Differential Equations. 38(2). 176–191. 21 indexed citations
6.
Mock, M. S.. (1979). The half-line boundary value problem for uxxx = ƒ(u). Journal of Differential Equations. 32(2). 258–273.
7.
Mock, M. S. & Peter D. Lax. (1978). The computation of discontinuous solutions of linear hyperbolic equations. Communications on Pure and Applied Mathematics. 31(4). 423–430. 56 indexed citations
8.
Mock, M. S.. (1978). Some higher order difference schemes enforcing an entropy inequality.. The Michigan Mathematical Journal. 25(3). 7 indexed citations
9.
Mock, M. S.. (1978). Discrete shocks and genuine nonlinearity.. The Michigan Mathematical Journal. 25(2). 22 indexed citations
10.
Toyabe, T., Ken Yamaguchi, S. Asai, & M. S. Mock. (1978). A numerical model of avalanche breakdown in MOSFET's. IEEE Transactions on Electron Devices. 25(7). 825–832. 125 indexed citations
11.
Toyabe, T., Ken Yamaguchi, S. Asai, & M. S. Mock. (1977). A two-dimensional avalanche breakdown model of submicron MOSFET's. 432–435. 5 indexed citations
12.
Mock, M. S.. (1976). On fourth‐order dissipation and single conservation laws. Communications on Pure and Applied Mathematics. 29(4). 383–388. 19 indexed citations
13.
Mock, M. S.. (1975). Asymptotic behavior of solutions of transport equations for semiconductor devices. Journal of Mathematical Analysis and Applications. 49(1). 215–225. 53 indexed citations
14.
Mock, M. S.. (1975). A global a posteriori error estimate for quasilinear elliptic problems. Numerische Mathematik. 24(1). 53–61. 4 indexed citations
15.
Mock, M. S.. (1974). An Initial Value Problem from Semiconductor Device Theory. SIAM Journal on Mathematical Analysis. 5(4). 597–612. 103 indexed citations
16.
Mock, M. S.. (1974). On a sufficiently fine mesh for quasilinear elliptic equations. Communications on Pure and Applied Mathematics. 27(3). 351–360. 3 indexed citations
17.
Mock, M. S.. (1974). Solution of a nonlinear two point boundary value problem. Numerische Mathematik. 23(1). 37–46. 3 indexed citations
18.
Mock, M. S.. (1973). On the computation of semiconductor device current characteristics by finite difference methods. Journal of Engineering Mathematics. 7(3). 193–205. 9 indexed citations
19.
Hu, S. M. & M. S. Mock. (1970). Vacancy Transients During Impurity Diffusion in Semiconductors. Physical review. B, Solid state. 1(6). 2582–2586. 3 indexed citations
20.
Cameron, A. G. W. & M. S. Mock. (1967). Stellar Accretion and X-ray Emission. Nature. 215(5100). 464–466. 38 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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