R. de Kort

471 total citations
17 papers, 342 citations indexed

About

R. de Kort is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Condensed Matter Physics. According to data from OpenAlex, R. de Kort has authored 17 papers receiving a total of 342 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 7 papers in Atomic and Molecular Physics, and Optics and 3 papers in Condensed Matter Physics. Recurrent topics in R. de Kort's work include Advancements in Semiconductor Devices and Circuit Design (8 papers), Semiconductor materials and devices (8 papers) and Radio Frequency Integrated Circuit Design (6 papers). R. de Kort is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (8 papers), Semiconductor materials and devices (8 papers) and Radio Frequency Integrated Circuit Design (6 papers). R. de Kort collaborates with scholars based in Netherlands, Finland and Belgium. R. de Kort's co-authors include R.J. Havens, H. van Kempen, L.F. Tiemeijer, A.J. Scholten, A. I. Lichtenstein, Jurriaan Schmitz, M. I. Katsnelson, F.N. Cubaynes, Willemien Kets and André J. A. van Roij and has published in prestigious journals such as Nature, Physical review. B, Condensed matter and Physical Review B.

In The Last Decade

R. de Kort

17 papers receiving 326 citations

Peers

R. de Kort

EEE

AMPO

CMP

Hans Rohdin United States

Kazuhiko Shimomura Japan

D. Xu United States

Jeremy J. M. Law United States

P. Royo Switzerland

K. Nishitani Japan

D. Jackrel United States

A.A. Allerman United States

T. Grevatt United Kingdom

Y.-S. Wu Taiwan

Hans Rohdin United States

R. de Kort

345 ×1.5

EEE

202 ×1.5

AMPO

105 ×1.9

CMP

35 ×0.7

21 ×0.9

Citations per year, relative to R. de Kort R. de Kort (= 1×) peers Hans Rohdin

Countries citing papers authored by R. de Kort

Since Specialization

Citations

This map shows the geographic impact of R. de Kort's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. de Kort with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. de Kort more than expected).

Fields of papers citing papers by R. de Kort

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. de Kort. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. de Kort. The network helps show where R. de Kort may publish in the future.

Co-authorship network of co-authors of R. de Kort

This figure shows the co-authorship network connecting the top 25 collaborators of R. de Kort. A scholar is included among the top collaborators of R. de Kort based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. de Kort. R. de Kort is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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17 of 17 papers shown

Havens, R.J., R. de Kort, A.J. Scholten, et al.. (2005). Record RF performance of standard 90 nm CMOS technology. University of Twente Research Information. 441–444. 32 indexed citations

Tiemeijer, L.F., R.J. Havens, R. de Kort, & A.J. Scholten. (2005). Improved Y-factor method for wide-band on-wafer noise-parameter measurements. IEEE Transactions on Microwave Theory and Techniques. 53(9). 2917–2925. 35 indexed citations

Donkers, J.J.T.M., P. Agarwal, R.J.E. Hueting, et al.. (2005). Metal emitter SiGe:C HBTs. 243–246. 8 indexed citations

Kort, R. de, et al.. (2005). Surface electronic structure of Cr(001): Experiment and theory. Physical Review B. 72(8). 32 indexed citations

Tiemeijer, L.F., et al.. (2004). Predictive spiral inductor compact model for frequency and time domain. 36.4.1–36.4.4. 30 indexed citations

Kort, R. de, et al.. (2004). Gate-capacitance extraction from RF C-V measurements [MOS device applications]. University of Twente Research Information. 113–116. 2 indexed citations

Paasschens, J.C.J. & R. de Kort. (2004). Modelling the excess noise due to avalanche multiplication in (hetero-junction) bipolar transistors. 108–111. 13 indexed citations

Schmitz, Jurriaan, F.N. Cubaynes, R. de Kort, et al.. (2004). The RF-CV method for characterization of leaky gate dielectrics. Microelectronic Engineering. 72(1-4). 149–153. 2 indexed citations

Scholten, A.J., L.F. Tiemeijer, R. van Langevelde, et al.. (2004). Compact modelling of noise for RF CMOS circuit design. IEE Proceedings - Circuits Devices and Systems. 151(2). 167–167. 20 indexed citations

10.

Bischoff, Maarten, Chun Fang, R. A. de Groot, et al.. (2003). Scanning Tunneling Spectroscopy Study of Surface States of 3d Metals: Chemical Identification, Magnetic Contrast and Orbital Kondo Resonance States. Acta Physica Polonica A. 104(3-4). 231–243. 1 indexed citations

11.

Schmitz, Jurriaan, F.N. Cubaynes, R.J. Havens, et al.. (2003). RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics. IEEE Electron Device Letters. 24(1). 37–39. 53 indexed citations

12.

Schmitz, Jurriaan, F.N. Cubaynes, R.J. Havens, et al.. (2003). Test structure design considerations for RF-CV measurements on leaky dielectrics. University of Twente Research Information. 181–185. 6 indexed citations

13.

Scholten, A.J., L.F. Tiemeijer, R. van Langevelde, et al.. (2003). Compact modeling of noise for RF CMOS circuit simulation. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5113. 93–93. 1 indexed citations

14.

Kort, R. de, et al.. (2002). Real-space imaging of an orbital Kondo resonance on the Cr(001) surface. Nature. 415(6871). 507–509. 56 indexed citations

15.

Kort, R. de, et al.. (2001). Zn- and Cd-induced features at the GaAs(110) and InP(110) surfaces studied by low-temperature scanning tunneling microscopy. Physical review. B, Condensed matter. 63(12). 35 indexed citations

16.

Kort, R. de, et al.. (2001). Atomically flat ultra-clean Cr(001) surfaces produced by cleavage of a single crystal: scanning tunneling microscopy and spectroscopy study. Surface Science. 490(1-2). L573–L578. 10 indexed citations

17.

Kort, R. de, Willemien Kets, & H. van Kempen. (2001). A low-temperature scanning tunneling microscopy study on the Sn- and Zn-doped InP(1 1 0) surfaces. Surface Science. 482-485. 495–500. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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