C. Ottermann

937 total citations
33 papers, 784 citations indexed

About

C. Ottermann is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Polymers and Plastics. According to data from OpenAlex, C. Ottermann has authored 33 papers receiving a total of 784 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 14 papers in Materials Chemistry and 11 papers in Polymers and Plastics. Recurrent topics in C. Ottermann's work include Transition Metal Oxide Nanomaterials (11 papers), Gas Sensing Nanomaterials and Sensors (8 papers) and Metal and Thin Film Mechanics (7 papers). C. Ottermann is often cited by papers focused on Transition Metal Oxide Nanomaterials (11 papers), Gas Sensing Nanomaterials and Sensors (8 papers) and Metal and Thin Film Mechanics (7 papers). C. Ottermann collaborates with scholars based in Germany, Switzerland and United Kingdom. C. Ottermann's co-authors include K. Bange, O. Anderson, Michael Laube, P. Lunkenheimer, A. Loidl, Florian Rauch, R. Feile, W. Wagner, W. Wagner and Peter Hess and has published in prestigious journals such as Physical review. B, Condensed matter, Thin Solid Films and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.

In The Last Decade

C. Ottermann

32 papers receiving 758 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
C. Ottermann Germany 14 451 438 240 131 106 33 784
C. Rousselot France 14 614 1.4× 451 1.0× 207 0.9× 157 1.2× 81 0.8× 31 980
A. Czapla Poland 14 389 0.9× 513 1.2× 184 0.8× 57 0.4× 77 0.7× 37 709
R. Drese Germany 17 770 1.7× 728 1.7× 185 0.8× 101 0.8× 181 1.7× 22 1.1k
M. Vinnichenko Germany 20 838 1.9× 567 1.3× 97 0.4× 96 0.7× 160 1.5× 55 1.1k
Junjun Jia Japan 23 756 1.7× 732 1.7× 276 1.1× 94 0.7× 171 1.6× 64 1.2k
Xiufeng Tang China 16 251 0.6× 413 0.9× 214 0.9× 83 0.6× 133 1.3× 46 768
Fachun Lai China 19 780 1.7× 634 1.4× 145 0.6× 106 0.8× 201 1.9× 52 1.0k
Xiaotao Zu China 17 702 1.6× 466 1.1× 104 0.4× 127 1.0× 173 1.6× 51 976
M.A. Tagliente Italy 17 554 1.2× 504 1.2× 147 0.6× 49 0.4× 140 1.3× 40 947
Marek Trzciński Poland 15 360 0.8× 289 0.7× 115 0.5× 70 0.5× 107 1.0× 56 784

Countries citing papers authored by C. Ottermann

Since Specialization
Citations

This map shows the geographic impact of C. Ottermann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Ottermann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Ottermann more than expected).

Fields of papers citing papers by C. Ottermann

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Ottermann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Ottermann. The network helps show where C. Ottermann may publish in the future.

Co-authorship network of co-authors of C. Ottermann

This figure shows the co-authorship network connecting the top 25 collaborators of C. Ottermann. A scholar is included among the top collaborators of C. Ottermann based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. Ottermann. C. Ottermann is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Bachhuber, Frederik, et al.. (2021). 30‐2: High Refractive Index Glass Wafers for Augmented Reality: Boundary Conditions for an Excellent Optical Performance. SID Symposium Digest of Technical Papers. 52(1). 383–385. 2 indexed citations
2.
3.
Fahland, Matthias, et al.. (2018). Roll-to-roll sputtering of indium tin oxide layers onto ultrathin flexible glass. Thin Solid Films. 669. 56–59. 13 indexed citations
4.
Anderson, O., et al.. (1997). Density and Youngs modulus of thin TiO 2 films. Fresenius Journal of Analytical Chemistry. 358(1-2). 290–293. 21 indexed citations
5.
Ottermann, C., et al.. (1996). Microscratch Analysis of The Adhesion Failure on Oxide Thin Films With Different Thickness. MRS Proceedings. 436. 4 indexed citations
6.
Laube, Michael, Florian Rauch, C. Ottermann, O. Anderson, & K. Bange. (1996). Density of thin TiO2 films. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 113(1-4). 288–292. 49 indexed citations
7.
Ottermann, C., et al.. (1996). Young's Modulus and Density of thin TiO2 Films Produced by Different Methods. MRS Proceedings. 436. 8 indexed citations
8.
Rothe, Jörg, et al.. (1995). Thickness determination of thin solid films by angle-resolved X-ray fluorescence spectrometry using monochromatized synchrotron radiation. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 97(1-4). 407–411. 5 indexed citations
9.
Ottermann, C., Michael Heming, & K. Bange. (1994). Stress and Density of Thin TiO2 Films Produced by Different Methods. MRS Proceedings. 356. 3 indexed citations
10.
Ottermann, C., et al.. (1993). Adhesion Properties of Metallic and Oxide Thin Films Produced by Several Methods. MRS Proceedings. 308. 1 indexed citations
11.
Ottermann, C., et al.. (1993). Stress of Tio2 Thin Films Produced by Different Deposition Techniques. MRS Proceedings. 308. 13 indexed citations
12.
Ottermann, C., J. Segner, & K. Bange. (1992). PVD materials for electrochromic all-solid-state devices. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1728. 211–211. 3 indexed citations
13.
Heming, Michael, et al.. (1992). Laser Densification of Sol-Gel Derived TiO2 - Thin Films.. MRS Proceedings. 271. 5 indexed citations
14.
Wagner, W., Florian Rauch, C. Ottermann, & K. Bange. (1992). Analysis of tungsten oxide films using MeV ion beams. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 68(1-4). 262–265. 14 indexed citations
15.
Ottermann, C., K. Bange, W. Wagner, Michael Laube, & Florian Rauch. (1992). Correlation of hydrogen content with properties of oxidic thin films. Surface and Interface Analysis. 19(1-12). 435–438. 33 indexed citations
16.
Lunkenheimer, P., A. Loidl, C. Ottermann, & K. Bange. (1991). Correlated barrier hopping in NiO films. Physical review. B, Condensed matter. 44(11). 5927–5930. 139 indexed citations
17.
Bange, K., et al.. (1991). Investigations of TiO2 films deposited by different techniques. Thin Solid Films. 197(1-2). 279–285. 156 indexed citations
18.
Ottermann, C., et al.. (1990). Deposition methods and process techniques for the fabrication of electrochromic all-solid-state devices. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1323. 188–188. 3 indexed citations
19.
Bange, K., et al.. (1990). Investigation of reflective electrochromic all-solid-state devices by Nuclear Reaction Analysis. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1272. 122–122. 3 indexed citations
20.
Ottermann, C., et al.. (1990). Correlation of injected charge to optical constants (n, k) of electrochromic films. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1272. 111–111. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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