Charles Slayman

732 total citations
26 papers, 488 citations indexed

About

Charles Slayman is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Radiation. According to data from OpenAlex, Charles Slayman has authored 26 papers receiving a total of 488 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 6 papers in Atomic and Molecular Physics, and Optics and 5 papers in Radiation. Recurrent topics in Charles Slayman's work include Radiation Effects in Electronics (11 papers), Semiconductor materials and devices (7 papers) and Photonic and Optical Devices (4 papers). Charles Slayman is often cited by papers focused on Radiation Effects in Electronics (11 papers), Semiconductor materials and devices (7 papers) and Photonic and Optical Devices (4 papers). Charles Slayman collaborates with scholars based in United States, Germany and Ireland. Charles Slayman's co-authors include L. Figueroa, H.L. Garvin, Richard Wong, R. K. Jain, Heather Quinn, T. K. Gustafson, John Wood, Shi-Jie Wen, E. W. Blackmore and M. Trinczek and has published in prestigious journals such as Journal of Applied Physics, IEEE Journal of Solid-State Circuits and IEEE Transactions on Microwave Theory and Techniques.

In The Last Decade

Charles Slayman

25 papers receiving 446 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Charles Slayman United States	12	452	151	88	80	45	26	488
Ethan H. Cannon United States	17	616 1.4×	262 1.7×	98 1.1×	88 1.1×	14 0.3×	41	738
S. D. LaLumondiere United States	16	658 1.5×	142 0.9×	118 1.3×	15 0.2×	53 1.2×	34	742
Leif Scheick United States	18	813 1.8×	94 0.6×	34 0.4×	42 0.5×	22 0.5×	80	889
F.R. Palomo Spain	12	400 0.9×	112 0.7×	25 0.3×	46 0.6×	15 0.3×	60	475
Martin A. Carts United States	19	1.0k 2.3×	258 1.7×	29 0.3×	65 0.8×	32 0.7×	56	1.1k
A. Candelori Italy	15	832 1.8×	114 0.8×	43 0.5×	33 0.4×	13 0.3×	90	899
Milton S. Ash United States	5	423 0.9×	58 0.4×	30 0.3×	21 0.3×	22 0.5×	12	509
R. Giordano Italy	11	275 0.6×	116 0.8×	65 0.7×	70 0.9×	59 1.3×	70	429
Gregory R. Allen United States	15	518 1.1×	202 1.3×	11 0.1×	69 0.9×	9 0.2×	61	559
P. C. Murley United States	15	923 2.0×	244 1.6×	167 1.9×	13 0.2×	16 0.4×	22	975

Countries citing papers authored by Charles Slayman

Since Specialization

Citations

This map shows the geographic impact of Charles Slayman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Charles Slayman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Charles Slayman more than expected).

Fields of papers citing papers by Charles Slayman

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Charles Slayman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Charles Slayman. The network helps show where Charles Slayman may publish in the future.

Co-authorship network of co-authors of Charles Slayman

This figure shows the co-authorship network connecting the top 25 collaborators of Charles Slayman. A scholar is included among the top collaborators of Charles Slayman based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Charles Slayman. Charles Slayman is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Quinn, Heather, et al.. (2018). The Effect of 1–10-MeV Neutrons on the JESD89 Test Standard. IEEE Transactions on Nuclear Science. 66(1). 140–147. 13 indexed citations

Blackmore, E. W., et al.. (2015). Terrestrial Muon Flux Measurement at Low Energies for Soft Error Studies. IEEE Transactions on Nuclear Science. 62(6). 2792–2796. 7 indexed citations

Assis, T., Kai Ni, J. S. Kauppila, et al.. (2015). Estimation of Single-Event-Induced Collected Charge for Multiple Transistors Using Analytical Expressions. IEEE Transactions on Nuclear Science. 62(6). 2853–2859. 4 indexed citations

Wilkinson, Jeff, et al.. (2014). Follow-Up Multicenter Alpha Counting Comparison. IEEE Transactions on Nuclear Science. 61(4). 1516–1521. 3 indexed citations

Slayman, Charles. (2011). Soft error trends and mitigation techniques in memory devices. 1–5. 38 indexed citations

Wilkinson, Jeff, et al.. (2011). Multicenter comparison of alpha particle measurements and methods typical of semiconductor processing. 5B.3.1–5B.3.10. 10 indexed citations

Slayman, Charles. (2010). Soft errors — Past history and recent discoveries. 25–30. 23 indexed citations

Slayman, Charles, et al.. (2008). Comparison of accelerated DRAM soft error rates measured at component and system level. 482–487. 47 indexed citations

Slayman, Charles, et al.. (2007). Impact of DRAM process technology on neutron-induced soft errors. 143–146. 8 indexed citations

10.

Slayman, Charles, et al.. (2006). Impact of Error Correction Code and Dynamic Memory Reconfiguration on High-Reliability/Low-Cost Server Memory. 190–193. 17 indexed citations

11.

Slayman, Charles & T. K. Gustafson. (2005). Metal-Barrier-Metal Junctions for Room Temperature Millimeter-Wave Mixing and Detection. 81. 338–340.

12.

Slayman, Charles. (2005). Cache and memory error detection, correction, and reduction techniques for terrestrial servers and workstations. IEEE Transactions on Device and Materials Reliability. 5(3). 397–404. 121 indexed citations

13.

Garvin, H.L., et al.. (1985). A 8 × 8b parallel multiplier in submicron technology. 84–85. 3 indexed citations

14.

Garvin, H.L., et al.. (1985). A fully-scaled NMOS technology for VLSI circuits. Microelectronics Journal. 16(3). 34–40. 2 indexed citations

15.

Slayman, Charles, et al.. (1982). <title>Masked Ion Beam Lithography For Submicrometer Device Fabrication</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 333. 168–176. 2 indexed citations

16.

Figueroa, L. & Charles Slayman. (1981). A novel heterostructure interdigital photodetector (HIP) with picosecond optical response. IEEE Electron Device Letters. 2(8). 208–210. 32 indexed citations

17.

Slayman, Charles & L. Figueroa. (1981). Frequency and pulse response of a novel high-speed interdigital surface photoconductor (IDPC). IEEE Electron Device Letters. 2(5). 112–114. 39 indexed citations

18.

Slayman, Charles, et al.. (1981). Masked ion-beam lithography: A feasibility demonstration for submicrometer device fabrication. Journal of Vacuum Science and Technology. 19(4). 1166–1171. 18 indexed citations

19.

Slayman, Charles, et al.. (1979). Internal photoemission in Ag-Al<inf>2</inf>O<inf>3</inf>-Al junctions. IEEE Journal of Quantum Electronics. 15(6). 475–481. 3 indexed citations

20.

Jain, R. K., et al.. (1977). Photo-induced currents in Ag-Al2O3-Al structures: Detection characteristics at 325 nm. Journal of Applied Physics. 48(4). 1543–1547. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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