J. Bauer

792 total citations
39 papers, 519 citations indexed

About

J. Bauer is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, J. Bauer has authored 39 papers receiving a total of 519 indexed citations (citations by other indexed papers that have themselves been cited), including 32 papers in Electrical and Electronic Engineering, 14 papers in Biomedical Engineering and 10 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in J. Bauer's work include Photonic and Optical Devices (8 papers), Nanowire Synthesis and Applications (8 papers) and Advancements in Photolithography Techniques (7 papers). J. Bauer is often cited by papers focused on Photonic and Optical Devices (8 papers), Nanowire Synthesis and Applications (8 papers) and Advancements in Photolithography Techniques (7 papers). J. Bauer collaborates with scholars based in Germany, France and Ukraine. J. Bauer's co-authors include D. Bolze, O. Fursenko, P. Zaumseil, S. Marschmeyer, Bernd Tillack, Grzegorz Łupina, Grzegorz Kozłowski, Y. Yamamoto, Piotr Dudek and Mindaugas Lukosius and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

J. Bauer

39 papers receiving 499 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. Bauer Germany 12 331 196 171 100 72 39 519
Ichiro Mizushima Japan 17 799 2.4× 226 1.2× 213 1.2× 236 2.4× 35 0.5× 110 948
Christian Dais Switzerland 13 349 1.1× 206 1.1× 252 1.5× 345 3.5× 85 1.2× 24 610
A. Kalnitsky United States 13 529 1.6× 186 0.9× 92 0.5× 112 1.1× 26 0.4× 47 602
P. Hudek Germany 14 548 1.7× 86 0.4× 341 2.0× 333 3.3× 108 1.5× 89 779
Akemi Hirotsune Japan 8 257 0.8× 203 1.0× 344 2.0× 300 3.0× 58 0.8× 28 607
A. Czerwiński Poland 14 421 1.3× 127 0.6× 70 0.4× 180 1.8× 37 0.5× 72 540
T-M Lu United States 9 160 0.5× 140 0.7× 86 0.5× 172 1.7× 130 1.8× 16 434
Philippe Lyan France 11 710 2.1× 157 0.8× 153 0.9× 403 4.0× 104 1.4× 31 898
Shazia Yasin United Kingdom 11 361 1.1× 67 0.3× 255 1.5× 174 1.7× 87 1.2× 18 522
Jaroslav Sobota Czechia 11 134 0.4× 161 0.8× 108 0.6× 81 0.8× 30 0.4× 51 375

Countries citing papers authored by J. Bauer

Since Specialization
Citations

This map shows the geographic impact of J. Bauer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Bauer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Bauer more than expected).

Fields of papers citing papers by J. Bauer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Bauer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Bauer. The network helps show where J. Bauer may publish in the future.

Co-authorship network of co-authors of J. Bauer

This figure shows the co-authorship network connecting the top 25 collaborators of J. Bauer. A scholar is included among the top collaborators of J. Bauer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Bauer. J. Bauer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sun, Yali, Zhixiang Lu, Michael D. Miller, et al.. (2024). A dual‐reference study design for understanding and improving AAV genome size analysis. Electrophoresis. 45(17-18). 1515–1524. 3 indexed citations
2.
Richter, Klaus, J. Bauer, Andrea Hawe, et al.. (2023). Purity and DNA content of AAV capsids assessed by analytical ultracentrifugation and orthogonal biophysical techniques. European Journal of Pharmaceutics and Biopharmaceutics. 189. 68–83. 31 indexed citations
3.
Fursenko, O., Mindaugas Lukosius, Grzegorz Łupina, et al.. (2017). Development of graphene process control by industrial optical spectroscopy setup. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10330. 1033017–1033017. 3 indexed citations
4.
Fursenko, O., J. Bauer, & S. Marschmeyer. (2016). 3D through silicon via profile metrology based on spectroscopic reflectometry for SOI applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2 indexed citations
5.
Fursenko, O., J. Bauer, & S. Marschmeyer. (2014). In-line through silicon vias etching depths inspection by spectroscopic reflectometry. Microelectronic Engineering. 122. 25–28. 11 indexed citations
6.
Zaumseil, P., Grzegorz Kozłowski, Michael Schubert, et al.. (2012). The role of SiGe buffer in growth and relaxation of Ge on free-standing Si(001) nano-pillars. Nanotechnology. 23(35). 355706–355706. 10 indexed citations
7.
Kozłowski, Grzegorz, P. Zaumseil, Michael Schubert, et al.. (2012). Growth and relaxation processes in Ge nanocrystals on free-standing Si(001) nanopillars. Nanotechnology. 23(11). 115704–115704. 13 indexed citations
8.
Fursenko, O., et al.. (2012). Characterization of Si nanowaveguide line edge roughness and its effect on light transmission. Materials Science and Engineering B. 177(10). 750–755. 6 indexed citations
9.
Birkholz, M., K.‐E. Ehwald, J. Bauer, et al.. (2012). Fabrication of MEMS actuators from the BEOL of a 0.25 μm BiCMOS technology platform. Microelectronic Engineering. 97. 276–279. 3 indexed citations
10.
Bauer, J., U. Haak, Mehmet Kaynak, et al.. (2011). Alignment technology for backside integration. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7985. 798508–798508. 7 indexed citations
11.
Dudek, Piotr, Grzegorz Łupina, Grzegorz Kozłowski, et al.. (2011). Atomic-scale engineering of future high-k dynamic random access memory dielectrics: The example of partial Hf substitution by Ti in BaHfO3. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 29(1). 6 indexed citations
12.
Kozłowski, Grzegorz, Y. Yamamoto, J. Bauer, et al.. (2011). Selective Ge heteroepitaxy on free-standing Si (001) nanopatterns: A combined Raman, transmission electron microscopy, and finite element method study. Journal of Applied Physics. 110(5). 8 indexed citations
13.
Kozłowski, Grzegorz, P. Zaumseil, Michael Schubert, et al.. (2011). Compliant substrate versus plastic relaxation effects in Ge nanoheteroepitaxy on free-standing Si(001) nanopillars. Applied Physics Letters. 99(14). 15 indexed citations
14.
Fursenko, O., J. Bauer, P. Zaumseil, Y. Yamamoto, & Bernd Tillack. (2008). Doping concentration control of SiGe layers by spectroscopic ellipsometry. Thin Solid Films. 517(1). 259–261. 5 indexed citations
15.
Bauer, J., U. Haak, Katrin Schulz, et al.. (2008). Double exposure technology for KrF lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6792. 679203–679203. 3 indexed citations
16.
Bauer, J., et al.. (2008). 100 nm half-pitch double exposure KrF lithography using binary masks. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6924. 69241Z–69241Z. 3 indexed citations
17.
Fursenko, O., J. Bauer, D. Bolze, et al.. (2003). Development of spectroscopic ellipsometry as in-line control for Co SALICIDE process. Thin Solid Films. 450(2). 248–254. 3 indexed citations
18.
Knoll, D., H. Rücker, B. Heinemann, et al.. (2002). HBT before CMOS, a new modular SiGe BiCMOS integration scheme. 22.2.1–22.2.4. 3 indexed citations
19.
Bauer, J., et al.. (1996). Surface tension, adhesion and wetting of materials for photolithographic process. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(4). 2485–2492. 36 indexed citations
20.
Bauer, J., et al.. (1991). Submicrometer photolithography by surface imaging - experiment and simulation. Microelectronic Engineering. 13(1-4). 89–92. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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