J. Da̧browski

3.7k citations
122 papers · 3.0k · h-index 29

Impact in

Papers in

    • Semiconductor materials and devices 74
    • Ferroelectric and Negative Capacitance Devices 17
    • Advancements in Semiconductor Devices and Circuit Design 14
    • Silicon and Solar Cell Technologies 12
    • Graphene research and applications 25
    • Electronic and Structural Properties of Oxides 20

J. Da̧browski

117 papers receiving 2.9k citations

Peers

J. Da̧browski
Comparison fields: 5 of 57
  • Atomic and Molecular Physics, and Optics 1.2k
  • Materials Chemistry 1.7k
  • Electrical and Electronic Engineering 1.9k
  • Surfaces, Coatings and Films 194
  • Structural Biology 35
Replace J. R. Engstrom with:
J. R. Engstrom United States
T. S. Jones United Kingdom
Tetsuji Yasuda Japan
Marika Schleberger Germany
D. Stiévenard France
Yoshiyuki Yamashita Japan
Hiroyuki Kageshima Japan
Andrew J. Mayne France
V. Yu. Aristov Russia
J.‐Y. Veuillen France
J. Da̧browski relative to J. R. Engstrom United States J. R. Engstrom's profile →
Citations per field
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J. R. Engstrom · 1×
Citations per year

Countries citing papers authored by J. Da̧browski

Since Specialization
Citations

This map shows the geographic impact of J. Da̧browski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Da̧browski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Da̧browski more than expected).

Fields of papers citing papers by J. Da̧browski

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Da̧browski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Da̧browski. The network helps show where J. Da̧browski may publish in the future.

Co-authors

The 25 scholars most cited alongside J. Da̧browski, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Da̧browski Line = papers co-authored together J. Da̧browski links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 122 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1992215
2 1988204
3 2013188
4 1994163
5 1989136
6 2000122
7 2012120
8 200990
9 200288
10 198886
11 200574
12 201658
13 201455
14 200145
15 200444
16 200642
17 199441
18 200839
19 200639
20 200739

About J. Da̧browski

J. Da̧browski is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials and Biomedical Engineering, having authored 122 papers that have together received 3.0k indexed citations. Recurring topics across this work include Semiconductor materials and devices (74 papers), Graphene research and applications (25 papers), Semiconductor materials and interfaces (24 papers), Surface and Thin Film Phenomena (20 papers), Electronic and Structural Properties of Oxides (20 papers), Ferroelectric and Negative Capacitance Devices (17 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers) and Silicon and Solar Cell Technologies (12 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (1.2k citations), Materials Chemistry (1.7k citations), Electrical and Electronic Engineering (1.9k citations), Surfaces, Coatings and Films (194 citations) and Structural Biology (35 citations). J. Da̧browski has collaborated with scholars based in Germany, Sweden and Poland. Frequent co-authors include Matthias Scheffler, H.‐J. Müssig, Grzegorz Łupina, G. Lippert, Thomas Schroeder, G. A. Wolff, Christian Wenger, P. Zaumseil, Wolfgang Mehr and Max C. Lemme. Their work appears in journals such as Journal of Applied Physics, Applied Physics Letters, Microelectronic Engineering, Surface Science and ACS Applied Materials & Interfaces.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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