N.R. Lugg
- Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications 16
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 18
- Radiation top 10%
-
- Electronic and Structural Properties of Oxides 9
- Advancements in Solid Oxide Fuel Cells 2
-
- Advanced Materials Characterization Techniques 5
-
- Force Microscopy Techniques and Applications 3
- Surface and Thin Film Phenomena 3
-
- Integrated Circuits and Semiconductor Failure Analysis 2
N.R. Lugg
25 papers receiving 685 citations
Peers
Comparison fields: 5 of 47
- Structural Biology 327
- Surfaces, Coatings and Films 325
- Radiation 75
- Materials Chemistry 322
- Electronic, Optical and Magnetic Materials 97
Countries citing papers authored by N.R. Lugg
This map shows the geographic impact of N.R. Lugg's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N.R. Lugg with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N.R. Lugg more than expected).
Fields of papers citing papers by N.R. Lugg
This network shows the impact of papers produced by N.R. Lugg. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N.R. Lugg. The network helps show where N.R. Lugg may publish in the future.
Co-authorship network
The 25 scholars most cited alongside N.R. Lugg, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2018 | 42 | |
| 2 | 2018 | 8 | |
| 3 | 2017 | 51 | |
| 4 | 2017 | 8 | |
| 5 | 2016 | 16 | |
| 6 | 2016 | 20 | |
| 7 | 2016 | 3 | |
| 8 | 2016 | 1 | |
| 9 | 2015 | 23 | |
| 10 | 2015 | 0 | |
| 11 | 2014 | 61 | |
| 12 | 2014 | 1 | |
| 13 | 2014 | 14 | |
| 14 | 2013 | 113 | |
| 15 | 2013 | 30 | |
| 16 | 2011 | 32 | |
| 17 | 2011 | 5 | |
| 18 | 2011 | 24 | |
| 19 | 2011 | 3 | |
| 20 | 2009 | 11 |
About N.R. Lugg
N.R. Lugg is a scholar working on Structural Biology, Surfaces, Coatings and Films, Materials Chemistry, Atomic and Molecular Physics, and Optics and Radiation, having authored 26 papers that have together received 693 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (18 papers), Advanced Electron Microscopy Techniques and Applications (16 papers), Electronic and Structural Properties of Oxides (9 papers), Advanced Materials Characterization Techniques (5 papers), Force Microscopy Techniques and Applications (3 papers), Surface and Thin Film Phenomena (3 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and Advancements in Solid Oxide Fuel Cells (2 papers). The work is most often cited by research in Structural Biology (327 citations), Surfaces, Coatings and Films (325 citations), Radiation (75 citations), Materials Chemistry (322 citations) and Electronic, Optical and Magnetic Materials (97 citations). N.R. Lugg has collaborated with scholars based in Japan, Australia and Austria. Frequent co-authors include Leslie J. Allen, Naoya Shibata, Yuichi Ikuhara, Scott D. Findlay, Gerald Kothleitner, Akihito Kumamoto, Ryo Ishikawa, Bin Feng, A.J. D’Alfonso and Katherine E. MacArthur. Their work appears in journals such as Ultramicroscopy, Microscopy and Microanalysis, Physical Review B, ACS Nano and Physical Review Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.