Mong-Song Liang

900 total citations
51 papers, 715 citations indexed

About

Mong-Song Liang is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Materials Chemistry. According to data from OpenAlex, Mong-Song Liang has authored 51 papers receiving a total of 715 indexed citations (citations by other indexed papers that have themselves been cited), including 45 papers in Electrical and Electronic Engineering, 22 papers in Electronic, Optical and Magnetic Materials and 10 papers in Materials Chemistry. Recurrent topics in Mong-Song Liang's work include Semiconductor materials and devices (36 papers), Copper Interconnects and Reliability (22 papers) and Advancements in Semiconductor Devices and Circuit Design (16 papers). Mong-Song Liang is often cited by papers focused on Semiconductor materials and devices (36 papers), Copper Interconnects and Reliability (22 papers) and Advancements in Semiconductor Devices and Circuit Design (16 papers). Mong-Song Liang collaborates with scholars based in Taiwan, United States and China. Mong-Song Liang's co-authors include Syun‐Ming Jang, Mao‐Chieh Chen, Chenming Hu, Ping-Keung Ko, Jeong Yeol Choi, R.W. Brodersen, Chi Chang, Chenming Hu, S. Haddad and Su-Jien Lin and has published in prestigious journals such as Journal of The Electrochemical Society, IEEE Transactions on Electron Devices and Thin Solid Films.

In The Last Decade

Mong-Song Liang

48 papers receiving 685 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Mong-Song Liang Taiwan 16 641 220 162 152 78 51 715
Chen Wu Belgium 11 391 0.6× 290 1.3× 93 0.6× 73 0.5× 79 1.0× 37 460
Larry Zhao Belgium 14 479 0.7× 377 1.7× 116 0.7× 133 0.9× 79 1.0× 29 564
Yasushi Nakasaki Japan 12 465 0.7× 182 0.8× 161 1.0× 93 0.6× 64 0.8× 44 530
M. Fayolle France 13 356 0.6× 165 0.8× 214 1.3× 64 0.4× 68 0.9× 41 505
Jae-Sung Roh South Korea 16 693 1.1× 162 0.7× 430 2.7× 69 0.5× 98 1.3× 57 789
T. Spooner United States 13 412 0.6× 312 1.4× 83 0.5× 76 0.5× 109 1.4× 49 472
W. F. A. Besling Netherlands 11 473 0.7× 112 0.5× 287 1.8× 111 0.7× 47 0.6× 23 560
Syun‐Ming Jang Taiwan 15 374 0.6× 176 0.8× 127 0.8× 111 0.7× 108 1.4× 23 434
Roland Weingärtner Germany 15 516 0.8× 119 0.5× 223 1.4× 36 0.2× 102 1.3× 55 634
Kai‐Erik Elers Finland 10 411 0.6× 176 0.8× 214 1.3× 150 1.0× 30 0.4× 11 459

Countries citing papers authored by Mong-Song Liang

Since Specialization
Citations

This map shows the geographic impact of Mong-Song Liang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mong-Song Liang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mong-Song Liang more than expected).

Fields of papers citing papers by Mong-Song Liang

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mong-Song Liang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mong-Song Liang. The network helps show where Mong-Song Liang may publish in the future.

Co-authorship network of co-authors of Mong-Song Liang

This figure shows the co-authorship network connecting the top 25 collaborators of Mong-Song Liang. A scholar is included among the top collaborators of Mong-Song Liang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Mong-Song Liang. Mong-Song Liang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Chang, Vincent S., Yunfei Hou, Ji Jiang, et al.. (2006). Modeling and Engineering of Hafnium Silicate (HfSiO) Gate Dielectrics Deposited by Nano-Laminated Atomic-Layer Deposition (NL-ALD). ECS Transactions. 1(10). 113–123. 4 indexed citations
2.
Huang, Tong, Chia-Yu Yao, Chao-Jen Huang, et al.. (2006). Evaluation and Numerical Simulation of Optimal Structural Designs for Reliable Packaging of Ultra Low K Process Technology. 92–94. 6 indexed citations
3.
4.
Chen, Mao‐Chieh, et al.. (2004). Effects of O2- and N2-Plasma Treatments on Copper Surface. Japanese Journal of Applied Physics. 43(11A). 7415–7418. 17 indexed citations
5.
Chang, Shou-Yi, et al.. (2004). Curing Process Window and Thermal Stability of Porous MSQ-Based Low-Dielectric-Constant Materials. Journal of The Electrochemical Society. 151(6). F146–F146. 14 indexed citations
6.
Chen, Mao‐Chieh, et al.. (2004). TDDB Reliability Improvement of Cu Damascene with a Bilayer-Structured α-SiC:H Dielectric Barrier. Journal of The Electrochemical Society. 151(2). G89–G89. 13 indexed citations
7.
Chen, Mao‐Chieh, et al.. (2004). Improvement in Leakage Current and Breakdown Field of Cu-Comb Capacitor Using a Silicon Oxycarbide Dielectric Barrier. Journal of The Electrochemical Society. 151(9). G606–G606. 17 indexed citations
8.
Kuo, Yu‐Lin, Chiapyng Lee, Jing‐Cheng Lin, et al.. (2003). Characteristics of DC Reactively Sputtered (Ti,Zr)N Thin Films as Diffusion Barriers for Cu Metallization. Electrochemical and Solid-State Letters. 6(9). C123–C123. 8 indexed citations
9.
Yang, Chih-Wei, Shih‐Fang Chen, Chunyu Lin, et al.. (2003). Effective improvement of high-k Hf-silicate/silicon interface with thermal nitridation. Electronics Letters. 39(5). 421–422. 5 indexed citations
10.
Hsu, Wei-Cheng, Mong-Song Liang, & Mao‐Chieh Chen. (2002). Implantation Induced Defects in the Retrograde Well with a Buried Layer. Journal of The Electrochemical Society. 149(3). G184–G184. 1 indexed citations
11.
Liang, Mong-Song, et al.. (2001). Characterization of hot-hole injection induced SILC and related disturbs in flash memories. IEEE Transactions on Electron Devices. 48(2). 300–306. 5 indexed citations
12.
Liang, Mong-Song, et al.. (2001). A trap generation closed-form statistical model for intrinsic oxide breakdown. IEEE Transactions on Electron Devices. 48(6). 1275–1277. 2 indexed citations
13.
Chen, Mao‐Chieh, et al.. (2001). Physical and Electrical Characteristics of Methylsilane- and Trimethylsilane-Doped Low Dielectric Constant Chemical Vapor Deposited Oxides. Journal of The Electrochemical Society. 148(6). F127–F127. 16 indexed citations
14.
Chen, Ming‐Jer, et al.. (2000). Monte Carlo Sphere Model for Effective Oxide Thinning Induced Extrinsic Breakdown. Japanese Journal of Applied Physics. 39(4S). 2026–2026. 3 indexed citations
15.
Chen, Chi‐Chun, et al.. (2000). Improved immunity to plasma damage in ultrathin nitrided oxides [CMOS technology]. IEEE Electron Device Letters. 21(1). 15–17. 7 indexed citations
16.
Chen, Ming‐Jer, et al.. (1999). Monte-Carlo Sphere Model for "Effective Oxide Thinning" Induced Extrinsic Breakdown. 1 indexed citations
17.
Liang, Mong-Song, et al.. (1986). A hot-hole erasable memory cell. IEEE Electron Device Letters. 7(8). 465–467. 6 indexed citations
18.
Liang, Mong-Song, et al.. (1984). MOSFET degradation due to stressing of thin oxide. IEEE Transactions on Electron Devices. 31(9). 1238–1244. 117 indexed citations
19.
Liang, Mong-Song, et al.. (1981). Electrical Characteristics of Polymer Thick Film Resistors, Part I: Experiemental Results. IEEE Transactions on Components Hybrids and Manufacturing Technology. 4(3). 283–288. 16 indexed citations
20.
Fu, Shen‐Li, et al.. (1981). Studies on the Percentage Variation of Resistance of Polymer Thick Film (PTF) Resistors. Active and Passive Electronic Components. 9(1). 25–29. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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