M. Nicolaidis
Impact in
- Hardware and Architecture top 0.2%
- VLSI and Analog Circuit Testing
-
- Radiation Effects in Electronics
- Low-power high-performance VLSI design
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Advanced Memory and Neural Computing
Papers in
-
- VLSI and Analog Circuit Testing 41
-
- Radiation Effects in Electronics 35
- Integrated Circuits and Semiconductor Failure Analysis 18
- Semiconductor materials and devices 17
- Low-power high-performance VLSI design 15
- Advancements in Semiconductor Devices and Circuit Design 8
- Advanced Memory and Neural Computing 7
- Co-authors
- T. CalinRaoul VelazcoLorena AnghelPhilipp Rudolf von RohrDan AlexandrescuT.R.N. RaoV.C. AlvesJoan Figueras
- Journals
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems (4 papers)IEEE Transactions on Device and Materials Reliability (4 papers)IEEE Transactions on Nuclear Science (3 papers)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (3 papers)Microelectronic Engineering (1 paper)
- Partner nations
- FranceUnited StatesSwitzerland
In The Last Decade
M. Nicolaidis
60 papers receiving 2.4k citations
Hit Papers
Peers
Comparison fields: 5 of 44
- Hardware and Architecture 1.6k
- Electrical and Electronic Engineering 2.3k
- Software 59
- Computer Networks and Communications 343
- Safety, Risk, Reliability and Quality 76
Countries citing papers authored by M. Nicolaidis
This map shows the geographic impact of M. Nicolaidis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Nicolaidis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Nicolaidis more than expected).
Fields of papers citing papers by M. Nicolaidis
This network shows the impact of papers produced by M. Nicolaidis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Nicolaidis. The network helps show where M. Nicolaidis may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Nicolaidis, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 2 | |
| 2 | 2017 | 6 | |
| 3 | 2017 | 2 | |
| 4 | 2013 | 3 | |
| 5 | 2011 | 12 | |
| 6 | 2011 | 6 | |
| 7 | 2010 | 8 | |
| 8 | 2010 | 175 | |
| 9 | 2003 | 20 | |
| 10 | 2003 | 36 | |
| 11 | 2003 | 90 | |
| 12 | 2002 | 3 | |
| 13 | 2002 | 5 | |
| 14 | 2002 | 1 | |
| 15 | 2000 | 60 | |
| 16 | 1999 | 15 | |
| 17 | 1998 | 9 | |
| 18 | Efficient chip signature checking for diagnosing boundary scan systems | 1992 | 1 |
| 19 | Built-In Self-Test for Multi-Port RAMs. | 1991 | 23 |
| 20 | Basic properties of strongly code disjoint checkers | 1990 | 1 |
About M. Nicolaidis
M. Nicolaidis is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Software, Computer Networks and Communications and Control and Systems Engineering, having authored 64 papers that have together received 2.5k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (41 papers), Radiation Effects in Electronics (35 papers), Integrated Circuits and Semiconductor Failure Analysis (18 papers), Semiconductor materials and devices (17 papers), Low-power high-performance VLSI design (15 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers), Interconnection Networks and Systems (7 papers) and Advanced Memory and Neural Computing (7 papers). The work is most often cited by research in Hardware and Architecture (1.6k citations), Electrical and Electronic Engineering (2.3k citations), Software (59 citations), Computer Networks and Communications (343 citations) and Safety, Risk, Reliability and Quality (76 citations). M. Nicolaidis has collaborated with scholars based in France, United States and Switzerland. Frequent co-authors include T. Calin, Raoul Velazco, Lorena Anghel, Philipp Rudolf von Rohr, Dan Alexandrescu, T.R.N. Rao, V.C. Alves, Joan Figueras, Salvador Manich and F. Faccio. Their work appears in journals such as IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Nuclear Science, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and Microelectronic Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.