M. Nakano
- Electrical and Electronic Engineering
- Materials Chemistry
- Computational Mechanics top 10%
- Biomedical Engineering
- Electronic, Optical and Magnetic Materials
- Co-authors
- S. KawamuraM. TakagiJ. SakuraiNobuo SasakiT. IwaiToshimasa MatsuokaHiroshi KotakiK. Adachi
- Topics
- Semiconductor materials and devices (13 papers)Thin-Film Transistor Technologies (12 papers)Advanced Surface Polishing Techniques (8 papers)
- Cited by
- Electrical and Electronic EngineeringComputational MechanicsElectronic, Optical and Magnetic Materials
- Partner nations
- Japan
In The Last Decade
M. Nakano
28 papers receiving 324 citations
Peers
Comparison fields: 5 of 26
- Electrical and Electronic Engineering 289
- Materials Chemistry 107
- Computational Mechanics 77
- Biomedical Engineering 70
- Electronic, Optical and Magnetic Materials 43
Countries citing papers authored by M. Nakano
This map shows the geographic impact of M. Nakano's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Nakano with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Nakano more than expected).
Fields of papers citing papers by M. Nakano
This network shows the impact of papers produced by M. Nakano. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Nakano. The network helps show where M. Nakano may publish in the future.
Co-authorship network of co-authors of M. Nakano
This figure shows the co-authorship network connecting the top 25 collaborators of M. Nakano. A scholar is included among the top collaborators of M. Nakano based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Nakano. M. Nakano is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 4 | |
| 2 | 13 | |
| 3 | 1 | |
| 4 | 1 | |
| 5 | 1 | |
| 6 | 3 | |
| 7 | 4 | |
| 8 | 20 | |
| 9 | 3-Dimensional Gate Array with Vertically Stacked Dual SOI/CMOS Structure Fabricated by Beam Recrystallization | 1 |
| 10 | 18 | |
| 11 | 2 | |
| 12 | 21 | |
| 13 | 1 | |
| 14 | 8 | |
| 15 | 42 | |
| 16 | 8 | |
| 17 | 17 | |
| 18 | 3 | |
| 19 | 97 | |
| 20 | 1 |
About M. Nakano
M. Nakano is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Biomedical Engineering, having authored 29 papers that have together received 346 indexed citations. Recurring topics across this work include Semiconductor materials and devices (13 papers), Thin-Film Transistor Technologies (12 papers) and Advanced Surface Polishing Techniques (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (289 citations), Computational Mechanics (77 citations) and Electronic, Optical and Magnetic Materials (43 citations). M. Nakano has collaborated with scholars based in Japan. Frequent co-authors include S. Kawamura, M. Takagi, J. Sakurai, Nobuo Sasaki, T. Iwai, Toshimasa Matsuoka, Hiroshi Kotaki, K. Adachi, Takashi Fukushima and N. Hashizume. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.