M. Lohmeier

841 citations

18 papers · 694 indexed · h-index 12

Impact in

Atomic and Molecular Physics, and Optics top 5%
- Surface and Thin Film Phenomena
- Advanced Chemical Physics Studies
- Semiconductor materials and interfaces
- Magnetic properties of thin films
Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques

Papers in

Atomic and Molecular Physics, and Optics 11
- Surface and Thin Film Phenomena 5
- Semiconductor materials and interfaces 4
- Force Microscopy Techniques and Applications 3
Surfaces, Coatings and Films 2
- Electron and X-Ray Spectroscopy Techniques 2

Co-authors: Elias Vlieg H. A. van der Vegt J.M.C. Thornton H. M. van Pinxteren E. Vlieg P. M. Zagwijn Albert Polman T. S. Turner
Journals: Surface Science (7 papers)Applied Physics Letters (2 papers)Journal of Applied Crystallography (1 paper)Microelectronic Engineering (1 paper)Physical review. B, Condensed matter (1 paper)
Partner nations: Netherlands United Kingdom Japan

In The Last Decade

M. Lohmeier

18 papers receiving 674 citations

Peers

Countries citing papers authored by M. Lohmeier

Since Specialization

Citations

This map shows the geographic impact of M. Lohmeier's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Lohmeier with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Lohmeier more than expected).

Fields of papers citing papers by M. Lohmeier

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Lohmeier. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Lohmeier. The network helps show where M. Lohmeier may publish in the future.

Co-authorship network

The 25 scholars most cited alongside M. Lohmeier, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Lohmeier Line = papers co-authored together M. Lohmeier links everyone, so they are left out of the graph.

All Works

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18 of 18 papers shown

#	Work
1	Evidence for tilted chains on the diamond (111)-(2 × 1) surface Surface Science ·Willem Jan Huisman, M. Lohmeier, H. A. van der Vegt, Joost F. Peters, S. A. de Vries, E. Vlieg, V. H. Etgens, T.E. Derry, J. F. van der Veen	1998	19
2	W-CMP for sub-micron inverse metallisation Microelectronic Engineering ·H. van Kranenburg, S Makk, P.H. Woerlee, M. Lohmeier	1997	16
3	An out-of-plane detector for surface x-ray diffraction Review of Scientific Instruments ·Alexis Honigbaum, C. Norris, Elias Vlieg, M. Lohmeier, T. S. Turner	1996	11
4	Incorporation and optical activation of erbium in silicon using molecular beam epitaxy Journal of Applied Physics ·R. Serna, Alison Knopf, M. Lohmeier, Elias Vlieg, Albert Polman, Paul F. A. Alkemade	1996	32
5	Atomic structure and thermal stability of two-dimensional Er silicide on Si(111) Physical review. B, Condensed matter ·M. Lohmeier, Willem Jan Huisman, Y. Y. Lee, P. M. Zagwijn, Elias Vlieg, Chris Nicklin, T. S. Turner	1996	37
6	Interface structure of Si(111)-(√3 × √3)R30°-ErSi2 − x Surface Science ·M. Lohmeier, Willem Jan Huisman, Elias Vlieg, Akira Nishiyama, Chris Nicklin, T. S. Turner	1996	31
7	High Performance 0.3 μm CMOS Technology using I-Line Lithography A.H. Montree, Giovanni Capozzi, D. Planquette, 関根真理子, Ping Ping Tsai, M. Lohmeier, s w lee, Rodrigo César de Oliveira Alves, Wan Luk, Seung Hyun Yi, M. N. Webster, Neur Bahaa Hikmet	1996	1
8	Segregation and trapping of erbium during silicon molecular beam epitaxy Applied Physics Letters ·R. Serna, M. Lohmeier, P. M. Zagwijn, Elias Vlieg, Albert Polman	1995	36
9	Surface X-ray crystallography of growing crystals and interfaces Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·Elias Vlieg, M. Lohmeier, H. A. van der Vegt	1995	2
10	Oxygen modified growth of Gd on Mo(110) Surface Science ·Yu Wu, Chris Nicklin, M. A. James, P. Steadman, C. Norris, M. Lohmeier	1995	4
11	Atomic Structure of Ultrathin Erbium Silicides on Si(111) MRS Proceedings ·M. Lohmeier, Willem Jan Huisman, Y. Y. Lee, P. M. Zagwijn, Akira Nishiyama, Chris Nicklin, T. S. Turner, Elias Vlieg	1994	2
12	Structure analysis of the HF-treated Si(111):H surface with medium-energy ion scattering Surface Science ·Akira Nishiyama, Y. Y. Lee, M. Lohmeier, Alfons M. Molenbroek, J.W.M. Frenken	1994	6
13	Interface roughness during thermal and ion-induced regrowth of amorphous layers on Si(001) Applied Physics Letters ·M. Lohmeier, S. de Vries, J. S. Custer, Elias Vlieg, M.S. Finney, F. Priolo, A. Battaglia	1994	16
14	Angle calculations for a six-circle surface X-ray diffractometer Journal of Applied Crystallography ·M. Lohmeier, E. Vlieg	1993	79
15	Surfactant-induced layer-by-layer growth of Ag on Ag(111) Physical Review Letters ·H. A. van der Vegt, H. M. van Pinxteren, M. Lohmeier, Elias Vlieg, J.M.C. Thornton	1992	348
16	Coadsorption of Cu and O2 on a Ru(0001) surface Surface Science ·Елена Семеновна Косых, Hucheng Wang, M. Lohmeier, M. Schick, M. Milun, K. Wandelt	1992	16
17	Structure determination of the Ge(111)−2×1-Sb surface using X-ray diffraction Surface Science ·R. G. van Silfhout, M. Lohmeier, Shigeaki Zaima, J. F. van der Veen, Paul B. Howes, C. Norris, J.M.C. Thornton, Augusta Williams	1992	10
18	Asymmetrical dimers on the Ge(001)-2 × 1-Sb surface observed using X-ray diffraction Surface Science ·M. Lohmeier, H. A. van der Vegt, R. G. van Silfhout, Elias Vlieg, J.M.C. Thornton, J. Emyr Macdonald, P. M. L. O. Scholte	1992	28

About M. Lohmeier

M. Lohmeier is a scholar working on Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Condensed Matter Physics, Materials Chemistry and Radiation, having authored 18 papers that have together received 694 indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (5 papers), Silicon Nanostructures and Photoluminescence (5 papers), Semiconductor materials and interfaces (4 papers), Force Microscopy Techniques and Applications (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Silicon and Solar Cell Technologies (2 papers), Electron and X-Ray Spectroscopy Techniques (2 papers) and Advanced Materials Characterization Techniques (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (463 citations), Surfaces, Coatings and Films (97 citations), Condensed Matter Physics (117 citations), Atmospheric Science (137 citations) and Structural Biology (10 citations). M. Lohmeier has collaborated with scholars based in Netherlands, United Kingdom and Japan. Frequent co-authors include Elias Vlieg, H. A. van der Vegt, J.M.C. Thornton, H. M. van Pinxteren, E. Vlieg, P. M. Zagwijn, Albert Polman, T. S. Turner, Willem Jan Huisman and R. Serna. Their work appears in journals such as Surface Science, Applied Physics Letters, Journal of Applied Crystallography, Microelectronic Engineering and Physical review. B, Condensed matter.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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