M. F. Pas

461 total citations
33 papers, 334 citations indexed

About

M. F. Pas is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Industrial and Manufacturing Engineering. According to data from OpenAlex, M. F. Pas has authored 33 papers receiving a total of 334 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Electrical and Electronic Engineering, 8 papers in Atomic and Molecular Physics, and Optics and 8 papers in Industrial and Manufacturing Engineering. Recurrent topics in M. F. Pas's work include Semiconductor materials and devices (13 papers), Semiconductor materials and interfaces (7 papers) and Silicon and Solar Cell Technologies (7 papers). M. F. Pas is often cited by papers focused on Semiconductor materials and devices (13 papers), Semiconductor materials and interfaces (7 papers) and Silicon and Solar Cell Technologies (7 papers). M. F. Pas collaborates with scholars based in United States, France and Taiwan. M. F. Pas's co-authors include J. A. Kittl, Bruno J. Zwolinski, Pushkar P. Apte, R. Wise, Michael L. Gostkowski, Yiorgos Makris, Tsu‐Jae King, C. Rinn Cleavelin, Shaofeng Yu and Wei Xiong and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

M. F. Pas

31 papers receiving 311 citations

Peers

M. F. Pas

EEE

AMPO

MC

BE

ME

Dang Mo China

Katsuya Nomura Japan

Benjamin P Haley United States

Andrey Markov Russia

M. Morimoto Japan

S. Kumashiro Japan

Otmar Ertl Austria

Adam Paszkiewicz Poland

T. Horiuchi Japan

M. K. Chun United States

Dang Mo China

M. F. Pas

201 ×0.9

EEE

93 ×0.7

AMPO

199 ×2.8

MC

36 ×0.6

BE

5 ×0.2

ME

Citations per year, relative to M. F. Pas M. F. Pas (= 1×) peers Dang Mo

Countries citing papers authored by M. F. Pas

Since Specialization

Citations

This map shows the geographic impact of M. F. Pas's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. F. Pas with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. F. Pas more than expected).

Fields of papers citing papers by M. F. Pas

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. F. Pas. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. F. Pas. The network helps show where M. F. Pas may publish in the future.

Co-authorship network of co-authors of M. F. Pas

This figure shows the co-authorship network connecting the top 25 collaborators of M. F. Pas. A scholar is included among the top collaborators of M. F. Pas based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. F. Pas. M. F. Pas is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

1.

Stratigopoulos, Haralampos‐G., et al.. (2017). Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 36(12). 2120–2133. 7 indexed citations

2.

Pas, M. F., et al.. (2016). A machine learning approach to fab-of-origin attestation. 1–6. 5 indexed citations

3.

Pas, M. F., et al.. (2016). Harnessing process variations for optimizing wafer-level probe-test flow. 9. 1–8. 4 indexed citations

4.

Stratigopoulos, Haralampos‐G., et al.. (2015). Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. International Conference on Computer Aided Design. 9–14. 7 indexed citations

5.

Huang, Ke, et al.. (2015). Yield prognosis for fab-to-fab product migration. 8. 1–6. 5 indexed citations

6.

Ramin, M., et al.. (2007). CMOS Dual-Work-Function Engineering by Using Implanted Ni-FUSI. IEEE Electron Device Letters. 28(9). 831–833. 2 indexed citations

7.

Xiong, Wenjing, C. Rinn Cleavelin, R. Wise, et al.. (2005). Full/partial depletion effects in FinFETs. 195–197. 3 indexed citations

8.

Banerjee, Aditi, et al.. (1999). Morphology and Integration of Rough Polycrystalline Silicon Films for DRAM Storage Cell Applications. Journal of The Electrochemical Society. 146(6). 2289–2293. 3 indexed citations

9.

Banerjee, A., et al.. (1999). Selective Hemispherical Grained Polysilicon Transformation for 256 MB, 1 GB Dynamic Random Access Memory and Beyond. Journal of The Electrochemical Society. 146(10). 3827–3832. 3 indexed citations

10.

Kittl, J. A., Q. Z. Hong, Hsiwen Yang, et al.. (1998). Optimization of Ti and Co Self-Aligned Silicide RTP for 0.10 μm CMOS. MRS Proceedings. 514.

11.

Kittl, J. A., Q. Z. Hong, Hsiwen Yang, et al.. (1998). Optimization of Ti and Co Self-Aligned Silicide RTP for 0.10 μm Cmos. MRS Proceedings. 525. 1 indexed citations

12.

Pas, M. F., et al.. (1997). Understanding the Impact of Batch vs. Single Wafer in Thermal Processing Using Cost of Ownership Analysis. MRS Proceedings. 470. 2 indexed citations

13.

Pas, M. F., et al.. (1997). Rapid Thermal Processing: When Will it Replace Batch Processing?. MRS Proceedings. 470. 2 indexed citations

14.

Miner, Gary, et al.. (1996). Evaluation of Applied Materials' Rapid Thermal Processor using Sematech Methodologies for 0.25 m Technology Thermal Applications-Part II. MRS Proceedings. 429. 2 indexed citations

15.

Kittl, J. A., et al.. (1995). Kinetics and nucleation model of the C49 to C54 phase transformation in TiSi2 thin films on deep-sub-micron n+ type polycrystalline silicon lines. Applied Physics Letters. 67(16). 2308–2310. 83 indexed citations

16.

Kittl, J. A., et al.. (1995). Kinetics of the C49 TO C54 Phase Transformation in TiSi₂ thin Films on Deep-Sub-Micron Lines. MRS Proceedings. 402. 4 indexed citations

17.

Pas, M. F., et al.. (1993). Heated SC1 Solution for Selective Etching and Resist Particulate Removal. Journal of The Electrochemical Society. 140(12). 3604–3606. 7 indexed citations

18.

Pas, M. F., et al.. (1993). Depth profiles of As and Sb angle-implanted trenches measured by secondary ion mass spectrometry. Journal of Applied Physics. 73(1). 84–87. 3 indexed citations

19.

Pas, M. F. & Bruno J. Zwolinski. (1991). Computation of the transport coefficients of binary mixtures of argon-krypton, krypton-xenon, and argon-xenon by molecular dynamics. Molecular Physics. 73(3). 483–494. 15 indexed citations

20.

Pas, M. F. & Bruno J. Zwolinski. (1991). Computation of the transport coefficients of dense fluid neon, argon, krypton and xenon by molecular dynamics. Molecular Physics. 73(3). 471–481. 31 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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