M. A. Lutz

789 total citations
14 papers, 671 citations indexed

About

M. A. Lutz is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Computational Mechanics. According to data from OpenAlex, M. A. Lutz has authored 14 papers receiving a total of 671 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Atomic and Molecular Physics, and Optics, 6 papers in Electrical and Electronic Engineering and 3 papers in Computational Mechanics. Recurrent topics in M. A. Lutz's work include Surface and Thin Film Phenomena (7 papers), Force Microscopy Techniques and Applications (5 papers) and Semiconductor Quantum Structures and Devices (4 papers). M. A. Lutz is often cited by papers focused on Surface and Thin Film Phenomena (7 papers), Force Microscopy Techniques and Applications (5 papers) and Semiconductor Quantum Structures and Devices (4 papers). M. A. Lutz collaborates with scholars based in United States. M. A. Lutz's co-authors include R. M. Feenstra, J. O. Chu, P. M. Mooney, F. K. LeGoues, A. J. Slavin, G. A. Held, J. Tersoff, B.S. Meyerson, C. Stanis and K. Ismail and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

M. A. Lutz

14 papers receiving 639 citations

Peers

M. A. Lutz

AMPO

EEE

CMP

V. Bressler-Hill United States

Silva K. Theiss United States

Tomoshige Sato Japan

I. Kegel Germany

S. A. Teys Russia

G. R. Bell United Kingdom

Gregory J. Whaley United States

G. LeLay France

Paul S. Ho United States

L. Seehofer Germany

V. Bressler-Hill United States

M. A. Lutz

569 ×1.0

AMPO

343 ×1.0

EEE

158 ×1.2

99 ×0.8

85 ×1.2

CMP

Citations per year, relative to M. A. Lutz M. A. Lutz (= 1×) peers V. Bressler-Hill

Countries citing papers authored by M. A. Lutz

Since Specialization

Citations

This map shows the geographic impact of M. A. Lutz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. A. Lutz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. A. Lutz more than expected).

Fields of papers citing papers by M. A. Lutz

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. A. Lutz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. A. Lutz. The network helps show where M. A. Lutz may publish in the future.

Co-authorship network of co-authors of M. A. Lutz

This figure shows the co-authorship network connecting the top 25 collaborators of M. A. Lutz. A scholar is included among the top collaborators of M. A. Lutz based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. A. Lutz. M. A. Lutz is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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14 of 14 papers shown

Jordan‐Sweet, Jean, P. M. Mooney, M. A. Lutz, et al.. (1996). Unique x-ray diffraction pattern at grazing incidence from misfit dislocations in SiGe thin films. Journal of Applied Physics. 80(1). 89–96. 14 indexed citations

Lutz, M. A., R. M. Feenstra, & J. O. Chu. (1995). Scanning tunneling microscopy of in situ cleaved and hydrogen passivated Si(110) cross-sectional surfaces. Surface Science. 328(3). 215–226. 25 indexed citations

Lutz, M. A., R. M. Feenstra, F. K. LeGoues, P. M. Mooney, & J. O. Chu. (1995). Influence of misfit dislocations on the surface morphology of Si1−xGex films. Applied Physics Letters. 66(6). 724–726. 143 indexed citations

Feenstra, R. M., M. A. Lutz, Frank Stern, et al.. (1995). Roughness analysis of Si/SiGe heterostructures. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(4). 1608–1612. 49 indexed citations

Lutz, M. A., R. M. Feenstra, & J. O. Chu. (1995). Atomic force microscopy studies of SiGe films and Si/SiGe heterostructures. IBM Journal of Research and Development. 39(6). 629–637. 2 indexed citations

Lutz, M. A., R. M. Feenstra, F. K. LeGoues, P. M. Mooney, & J. O. Chu. (1995). Addendum: ‘‘Influence of misfit dislocations on the surface morphology of Si1−xGex films’’ [Appl. Phys. Lett. 66, 724 (1995)]. Applied Physics Letters. 67(5). 724–724. 4 indexed citations

Feenstra, R. M. & M. A. Lutz. (1995). Scattering from strain variations in high-mobility Si/SiGe heterostructures. Journal of Applied Physics. 78(10). 6091–6097. 54 indexed citations

Lutz, M. A., R. M. Feenstra, P. M. Mooney, J. Tersoff, & J. O. Chu. (1994). Facet formation in strained Si1−x Gex films. Surface Science. 316(3). L1075–L1080. 79 indexed citations

Feenstra, R. M., M. A. Lutz, & M. Copel. (1994). Roughness Analysis of Si1-χGeχ Films. MRS Proceedings. 355. 1 indexed citations

10.

Feenstra, R. M., A. J. Slavin, G. A. Held, & M. A. Lutz. (1992). Edge melting of the Ge(111) surface studied by scanning tunneling microscopy. Ultramicroscopy. 42-44. 33–40. 23 indexed citations

11.

Feenstra, R. M. & M. A. Lutz. (1991). Kinetics of the Si(111)2 × 1→ 5 × 5 and 7 × 7 transformation studied by scanning tunneling microscopy. Surface Science. 243(1-3). 151–165. 63 indexed citations

12.

Feenstra, R. M. & M. A. Lutz. (1991). Scanning tunneling microscopy and spectroscopy of the Si(111)5×5 surface. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(2). 716–720. 37 indexed citations

13.

Feenstra, R. M., A. J. Slavin, G. A. Held, & M. A. Lutz. (1991). Surface diffusion and phase transition on the Ge(111) surface studied by scanning tunneling microscopy. Physical Review Letters. 66(25). 3257–3260. 117 indexed citations

14.

Feenstra, R. M. & M. A. Lutz. (1990). Formation of the 5×5 reconstruction on cleaved Si(111) surfaces studied by scanning tunneling microscopy. Physical review. B, Condensed matter. 42(8). 5391–5394. 60 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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