M. A. Hopper

523 citations
16 papers · 413 · h-index 11

Impact in

Papers in

M. A. Hopper

16 papers receiving 391 citations

Peers

M. A. Hopper
Comparison fields: 5 of 46
  • Electrochemistry 48
  • Bioengineering 34
  • Surfaces, Coatings and Films 37
  • Electrical and Electronic Engineering 294
  • Metals and Alloys 13
Replace H. J. Tolle with:
H. J. Tolle Germany
Paul E. West United States
A.A. Wronkowska Poland
C. M. Gronet United States
J. Fraser Canada
Edmund P. Burte Germany
R. Arens-Fischer Germany
Steven Verhaverbeke United States
Rolf Weil United States
K. L. Hobbs United States
M. A. Hopper relative to H. J. Tolle Germany H. J. Tolle's profile →
Citations per field
00.5×3.7×
H. J. Tolle · 1×
Citations per year

Countries citing papers authored by M. A. Hopper

Since Specialization
Citations

This map shows the geographic impact of M. A. Hopper's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. A. Hopper with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. A. Hopper more than expected).

Fields of papers citing papers by M. A. Hopper

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. A. Hopper. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. A. Hopper. The network helps show where M. A. Hopper may publish in the future.

Co-authors

The 23 scholars most cited alongside M. A. Hopper, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. A. Hopper Line = papers co-authored together M. A. Hopper links everyone, so they are left out of the graph.

All Works

16 of 16 papers shown
#Work
1 1975109
2 197359
3 197553
4 197939
5 197226
6 197925
7 196920
8 197917
9 197615
10 197715
11 198013
12 19897
13 19715
14 19765
15 20123
16 20132

About M. A. Hopper

M. A. Hopper is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Computational Mechanics, Bioengineering and Electrochemistry, having authored 16 papers that have together received 413 indexed citations. Recurring topics across this work include Semiconductor materials and devices (6 papers), Anodic Oxide Films and Nanostructures (3 papers), Electrochemical Analysis and Applications (3 papers), Analytical Chemistry and Sensors (3 papers), Thin-Film Transistor Technologies (2 papers), Electrowetting and Microfluidic Technologies (2 papers), Surface Roughness and Optical Measurements (2 papers) and Electron and X-Ray Spectroscopy Techniques (1 paper). The work is most often cited by research in Electrochemistry (48 citations), Bioengineering (34 citations), Surfaces, Coatings and Films (37 citations), Electrical and Electronic Engineering (294 citations) and Metals and Alloys (13 citations). M. A. Hopper has collaborated with scholars based in Canada, United States and France. Frequent co-authors include R. Allyn Clarke, L. Young, J. L. Ord, V. Novotný, R.L. Tapping, Jonathan A. Wright, Kock-Yee Law, P.S. Vincett, Guy Johnson and Rafik O. Loutfy. Their work appears in journals such as Journal of The Electrochemical Society, IEEE Transactions on Electron Devices, Applied Physics Letters, Surface Science and ECS Transactions.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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