L. C. Markert

1.2k total citations · 1 hit paper
19 papers, 1.0k citations indexed

About

L. C. Markert is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Mechanics of Materials. According to data from OpenAlex, L. C. Markert has authored 19 papers receiving a total of 1.0k indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 8 papers in Computational Mechanics and 5 papers in Mechanics of Materials. Recurrent topics in L. C. Markert's work include Semiconductor materials and devices (9 papers), Ion-surface interactions and analysis (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). L. C. Markert is often cited by papers focused on Semiconductor materials and devices (9 papers), Ion-surface interactions and analysis (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). L. C. Markert collaborates with scholars based in United States and Sweden. L. C. Markert's co-authors include J.‐E. Sundgren, Scott A. Barnett, J. E. Greene, Ulf Helmersson, Snejana V. Todorova, J. E. Greene, J. Knall, Lars Hultman, M. Arif Hasan and W.-X. Ni and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

L. C. Markert

19 papers receiving 980 citations

Hit Papers

Growth of single-crystal TiN/VN strained-layer superlatti... 1987 2026 2000 2013 1987 200 400 600

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
L. C. Markert United States 10 702 680 372 161 133 19 1.0k
T.J. Kinder Australia 15 651 0.9× 499 0.7× 247 0.7× 119 0.7× 118 0.9× 20 741
S. L. Rohde United States 20 927 1.3× 727 1.1× 368 1.0× 208 1.3× 55 0.4× 35 1.1k
F. Adibi United States 10 934 1.3× 708 1.0× 432 1.2× 99 0.6× 44 0.3× 11 1.1k
M. Shinn United States 12 1.0k 1.4× 823 1.2× 248 0.7× 243 1.5× 97 0.7× 19 1.2k
Anita Madan United States 17 680 1.0× 739 1.1× 398 1.1× 161 1.0× 75 0.6× 53 1.1k
D.C. McIntyre United States 9 813 1.2× 846 1.2× 443 1.2× 138 0.9× 46 0.3× 13 1.1k
J. M. Molarius Finland 14 526 0.7× 392 0.6× 458 1.2× 116 0.7× 130 1.0× 46 816
S. Kadlec Czechia 24 1.2k 1.7× 891 1.3× 626 1.7× 147 0.9× 68 0.5× 43 1.4k
T. I. Selinder Sweden 15 433 0.6× 478 0.7× 265 0.7× 166 1.0× 81 0.6× 23 802
G. Håkansson Sweden 15 1.5k 2.1× 1.2k 1.8× 472 1.3× 365 2.3× 70 0.5× 22 1.6k

Countries citing papers authored by L. C. Markert

Since Specialization
Citations

This map shows the geographic impact of L. C. Markert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. C. Markert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. C. Markert more than expected).

Fields of papers citing papers by L. C. Markert

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L. C. Markert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. C. Markert. The network helps show where L. C. Markert may publish in the future.

Co-authorship network of co-authors of L. C. Markert

This figure shows the co-authorship network connecting the top 25 collaborators of L. C. Markert. A scholar is included among the top collaborators of L. C. Markert based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with L. C. Markert. L. C. Markert is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

19 of 19 papers shown
1.
Markert, L. C., et al.. (1994). Crystal growth and electronic properties of ultrahigh vacuum ion-beam sputter deposited Sb-doped Si(001)2×1. Applied Physics Letters. 64(11). 1398–1400. 9 indexed citations
2.
Kim, Y.-W., et al.. (1993). Growth of homoepitaxial Ge(001)2 × 1 by ultrahigh vacuum ion beam sputter deposition. Thin Solid Films. 223(2). 212–217. 15 indexed citations
3.
Ni, W.-X., G. V. Hansson, J.‐E. Sundgren, et al.. (1992). δ-function-shaped Sb-doping profiles in Si(001) obtained using a low-energy accelerated-ion source during molecular-beam epitaxy. Physical review. B, Condensed matter. 46(12). 7551–7558. 29 indexed citations
4.
Markert, L. C., J. E. Greene, W.-X. Ni, G. V. Hansson, & J.‐E. Sundgren. (1991). Concentration transient analysis of antimony surface segregation during Si(001) molecular beam epitaxy. Thin Solid Films. 206(1-2). 59–63. 9 indexed citations
5.
Ni, W.-X., G. V. Hansson, J.‐E. Sundgren, L. C. Markert, & J. E. Greene. (1991). Experimental and Model Studies of Dopant Segregation During Growth of Silicon Films by Molecular Beam Epitaxy. MRS Proceedings. 220. 1 indexed citations
6.
Jansson, Ulf, Mats Boman, L. C. Markert, J.‐O. Carlsson, & J. E. Greene. (1991). Phase selective deposition of boron achieved by crystallization control. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 9(2). 266–270. 6 indexed citations
7.
Hasan, M. Arif, J.‐E. Sundgren, G. V. Hansson, L. C. Markert, & J. E. Greene. (1990). Incorporation probabilities and depth distributions of aluminum co-evaporated during Si(100) molecular beam epitaxy. Thin Solid Films. 184(1-2). 61–67. 9 indexed citations
8.
Knall, J., J.‐E. Sundgren, L. C. Markert, & J. E. Greene. (1989). Incorporation of In by recoil implantation during MBE growth of Si(100). Surface Science Letters. 214(1-2). A253–A253. 7 indexed citations
9.
Jansson, Ulf, J.‐O. Carlsson, L. C. Markert, & J. E. Greene. (1989). Phase-selective chemical vapor deposition of boron carbide by nucleation control on patterned substrates. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 7(6). 3172–3175. 7 indexed citations
10.
Hultman, Lars, J.‐E. Sundgren, L. C. Markert, & J. E. Greene. (1989). Ar and excess N incorporation in epitaxial TiN films grown by reactive bias sputtering in mixed Ar/N2 and pure N2 discharges. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 7(3). 1187–1193. 64 indexed citations
11.
Ni, W.-X., J. Knall, M. Arif Hasan, et al.. (1989). Kinetics of dopant incorporation using a low-energy antimony ion beam during growth of Si(100) films by molecular-beam epitaxy. Physical review. B, Condensed matter. 40(15). 10449–10459. 55 indexed citations
12.
Hasan, M. Arif, J. Knall, Scott A. Barnett, et al.. (1989). Incorporation of accelerated low-energy (50–500 eV) In+ ions in Si(100) films during growth by molecular-beam epitaxy. Journal of Applied Physics. 65(1). 172–179. 58 indexed citations
13.
Knall, J., J.‐E. Sundgren, L. C. Markert, & J. E. Greene. (1989). Incorporation of in by recoil implantation during MBE growth of Si(100). Surface Science. 214(1-2). 149–164. 7 indexed citations
14.
Sundgren, J.‐E., J. Knall, W.-X. Ni, et al.. (1989). Dopant incorporation kinetics and abrupt profiles during silicon molecular beam epitaxy. Thin Solid Films. 183(1-2). 281–297. 11 indexed citations
15.
Knall, J., et al.. (1989). Influence of the Si evaporation source on the incorporation of In during Si molecular-beam epitaxy growth: A comparative study of magnetically and electrostatically-focused electron-gun evaporators. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 7(2). 204–209. 3 indexed citations
16.
Hirashita, N., L. C. Markert, Y.-W. Kim, et al.. (1989). Electrical properties of Si films doped with 200-eV In+ ions during growth by molecular-beam epitaxy. Journal of Applied Physics. 65(3). 1189–1197. 37 indexed citations
17.
Hultman, Lars, B.-O. Johansson, J.‐E. Sundgren, L. C. Markert, & J. E. Greene. (1988). Ar incorporation in epitaxial TiN films deposited by reactive magnetron sputtering in mixed Ar/N2 discharges. Applied Physics Letters. 53(13). 1175–1177. 27 indexed citations
18.
Fons, Paul, N. Hirashita, L. C. Markert, et al.. (1988). Electrical properties of Si(100) films doped with low-energy (≤150 eV) Sb ions during growth by molecular beam epitaxy. Applied Physics Letters. 53(18). 1732–1734. 26 indexed citations
19.
Helmersson, Ulf, Snejana V. Todorova, Scott A. Barnett, et al.. (1987). Growth of single-crystal TiN/VN strained-layer superlattices with extremely high mechanical hardness. Journal of Applied Physics. 62(2). 481–484. 630 indexed citations breakdown →

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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