Kun Ho Kim
- Materials Chemistry top 5%
- Electrical and Electronic Engineering top 5%
- Electronic, Optical and Magnetic Materials top 10%
- Biomedical Engineering
- Polymers and Plastics
- Co-authors
- Ki Cheol ParkMarc‐A. NicoletGang BaiJeong Yong LeeChi Kyu ChoiHyuck ChooJeong Oen LeeJong Duk Lee
- Topics
- Semiconductor materials and interfaces (7 papers)Semiconductor materials and devices (5 papers)Surface and Thin Film Phenomena (4 papers)
- Cited by
- Materials ChemistryElectronic, Optical and Magnetic MaterialsElectrical and Electronic Engineering
- Partner nations
- South KoreaUnited StatesNorth Korea
In The Last Decade
Kun Ho Kim
18 papers receiving 906 citations
Hit Papers
Peers
Comparison fields: 5 of 43
- Materials Chemistry 817
- Electrical and Electronic Engineering 701
- Electronic, Optical and Magnetic Materials 272
- Biomedical Engineering 103
- Polymers and Plastics 69
Countries citing papers authored by Kun Ho Kim
This map shows the geographic impact of Kun Ho Kim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kun Ho Kim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kun Ho Kim more than expected).
Fields of papers citing papers by Kun Ho Kim
This network shows the impact of papers produced by Kun Ho Kim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kun Ho Kim. The network helps show where Kun Ho Kim may publish in the future.
Co-authorship network of co-authors of Kun Ho Kim
This figure shows the co-authorship network connecting the top 25 collaborators of Kun Ho Kim. A scholar is included among the top collaborators of Kun Ho Kim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kun Ho Kim. Kun Ho Kim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | Cross Domain Imitation Learning | 1 |
| 2 | 2 | |
| 3 | 14 | |
| 4 | 9 | |
| 5 | 4 | |
| 6 | 1 | |
| 7 | 1 | |
| 8 | 3 | |
| 9 | 11 | |
| 10 | 1 | |
| 11 | 2 | |
| 12 | Structural, electrical and optical properties of aluminum doped zinc oxide films prepared by radio frequency magnetron sputteringbreakdown → | 509 |
| 13 | 295 | |
| 14 | 8 | |
| 15 | 4 | |
| 16 | 19 | |
| 17 | 29 | |
| 18 | 4 | |
| 19 | 17 |
About Kun Ho Kim
Kun Ho Kim is a scholar working on Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 19 papers that have together received 934 indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (7 papers), Semiconductor materials and devices (5 papers) and Surface and Thin Film Phenomena (4 papers). The work is most often cited by research in Materials Chemistry (817 citations), Electronic, Optical and Magnetic Materials (272 citations) and Electrical and Electronic Engineering (701 citations). Kun Ho Kim has collaborated with scholars based in South Korea, United States and North Korea. Frequent co-authors include Ki Cheol Park, Marc‐A. Nicolet, Gang Bai, Jeong Yong Lee, Chi Kyu Choi, Hyuck Choo, Jeong Oen Lee, Jong Duk Lee, David W. Sretavan and Sung Chul Kim. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.