John C. H. Spence

16.1k citations

178 papers · 6.2k indexed · 2 hit papers · h-index 39

Radiation top 0.05%
Structural Biology top 0.02%
Materials Chemistry top 2%
Atomic and Molecular Physics, and Optics top 1%
Electrical and Electronic Engineering top 5%

Co-authors: Uwe Weierstall Henry N. Chapman Stefano Marchesini Malcolm R. Howells J. Taftø Jian‐Min Zuo R. Bruce Doak Stefan P. Hau‐Riege
Topics: Advanced Electron Microscopy Techniques and Applications (72 papers)Advanced X-ray Imaging Techniques (64 papers)Electron and X-Ray Spectroscopy Techniques (36 papers)
Cited by: Structural Biology Radiation Surfaces, Coatings and Films
Journals: Nature Journal of the American Chemical Society Physical Review Letters
Partner nations: United States Germany China

In The Last Decade

John C. H. Spence

173 papers receiving 6.0k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

X-ray image reconstruction from a diffraction pattern alone

2003 626 citations Stefano Marchesini, Haifeng He et al. profile →
High-resolution ab initio three-dimensional x-ray diffraction microscopy

2006 422 citations Henry N. Chapman, Anton Barty et al. Journal of the Optical Society of America A profile →

Peers

Countries citing papers authored by John C. H. Spence

Since Specialization

Citations

This map shows the geographic impact of John C. H. Spence's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John C. H. Spence with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John C. H. Spence more than expected).

Fields of papers citing papers by John C. H. Spence

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John C. H. Spence. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John C. H. Spence. The network helps show where John C. H. Spence may publish in the future.

Co-authorship network of co-authors of John C. H. Spence

This figure shows the co-authorship network connecting the top 25 collaborators of John C. H. Spence. A scholar is included among the top collaborators of John C. H. Spence based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with John C. H. Spence. John C. H. Spence is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Inversion of dynamical Bragg intensities to complex structure factors by iterated projections. For Ultramic. 2020. ("Pico" Festschrift, May 2021) 2021 ·Ultramicroscopy ·John C. H. Spence,Jeffrey J. Donatelli	3
2	Reprint of: Inversion of dynamical Bragg intensities to complex structure factors by iterated projections. For Ultramic. 2020. (“Pico” Festschrift, May 2021) 2021 ·Ultramicroscopy ·John C. H. Spence,Jeffrey J. Donatelli	0
3	Quantitative agreement between dynamical rocking curves in ultrafast electron diffraction for x-ray lasers 2021 ·Ultramicroscopy ·(unknown),W. Graves,Mark R. Holl,John C. H. Spence,Emilio A. Nanni,Renkai Li,Xiaozhe Shen,Stephen Weathersby	2
4	The ASU Compact XFEL Project 2020 ·Bulletin of the American Physical Society ·William R. Graves,Petra Fromme,Mark R. Holl,(unknown),M. Messerschmidt,Emilio A. Nanni,Arvinder Sandhu,Sami Tantawi,(unknown),John C. H. Spence	1
5	Inversion of Many-Beam Bragg Intensities for Phasing by Iterated Projections: Removal of Multiple Scattering Artifacts from Diffraction Data 2020 ·Physical Review Letters ·Jeffrey J. Donatelli,John C. H. Spence	20
6	Short-wavelength free-electron laser sources and science: a review 2017 ·Reports on Progress in Physics ·Elaine A. Seddon,J.A. Clarke,David Dunning,C. Masciovecchio,Christopher J. Milne,F. Parmigiani,David Rugg,John C. H. Spence,Neil Thompson,Kiyoshi Ueda,S. M. Vinko,J. S. Wark,W. Würth	159
7	Direct phasing in femtosecond nanocrystallography. II. Phase retrieval 2014 ·Acta Crystallographica Section A Foundations and Advances ·Joe Chen,John C. H. Spence,Rick P. Millane	10
8	Three-dimensional single-particle imaging using angular correlations from X-ray laser data 2013 ·Acta Crystallographica Section A Foundations of Crystallography ·Haiguang Liu,Billy K. Poon,D. K. Saldin,John C. H. Spence,Peter H. Zwart	30
9	X-ray lasers for structural and dynamic biology 2012 ·Reports on Progress in Physics ·John C. H. Spence,Uwe Weierstall,Henry N. Chapman	153
10	Structure-factor analysis of femtosecond microdiffraction patterns from protein nanocrystals 2011 ·Acta Crystallographica Section A Foundations of Crystallography ·Richard A. Kirian,Thomas A. White,James M. Holton,Henry N. Chapman,Petra Fromme,Anton Barty,Lukas Lomb,Andrew Aquila,Filipe R. N. C. Maia,Andrew V. Martin,Raimund Fromme,Xiaoyu Wang,Mark S. Hunter,K. E. Schmidt,John C. H. Spence	92
11	Liquid Capillary Micro/Nanojets in Free‐Jet Expansion 2010 ·Small ·Alfonso M. Gañán‐Calvo,Daniel P. DePonte,Miguel A. Herrada,John C. H. Spence,Uwe Weierstall,R. Bruce Doak	27
12	Combined structure-factor phase measurement and theoretical calculations for mapping of chemical bonds in GaN 2010 ·Acta Crystallographica Section A Foundations of Crystallography ·Bin Jiang,Jian‐Min Zuo,David Holec,C. J. Humphreys,Mark A. Spackman,John C. H. Spence	4
13	Three-Dimensional Coherent X-Ray Diffraction Imaging of a Ceramic Nanofoam: Determination of Structural Deformation Mechanisms 2008 ·Physical Review Letters ·Anton Barty,Stefano Marchesini,Henry N. Chapman,Chuan Cui,Malcolm R. Howells,David A. Shapiro,A. M. Minor,John C. H. Spence,Uwe Weierstall,Ján Ilavský,Aleksandr Noy,Stefan P. Hau‐Riege,Alexander B. Artyukhin,Theodore F. Baumann,Trevor M. Willey,J. S. Stölken,T. van Buuren,J.H. Kinney	80
14	An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy 2008 ·Journal of Electron Spectroscopy and Related Phenomena ·Malcolm R. Howells,Tobias Beetz,Henry N. Chapman,Chuan Cui,James M. Holton,Chris Jacobsen,Janos Kirz,Enju Lima,Stefano Marchesini,Houxun Miao,D. Sayre,David A. Shapiro,John C. H. Spence,D. Starodub	362
15	High-resolution ab initio three-dimensional x-ray diffraction microscopybreakdown → 2006 ·Journal of the Optical Society of America A ·Henry N. Chapman,Anton Barty,Stefano Marchesini,Aleksandr Noy,Stefan P. Hau‐Riege,Congwu Cui,Malcolm R. Howells,Rachel Rosen,Haifeng He,John C. H. Spence,Uwe Weierstall,Tobias Beetz,Chris Jacobsen,David A. Shapiro	422
16	Reconstruction of complex single-particle images using charge-flipping algorithm 2005 ·Acta Crystallographica Section A Foundations of Crystallography ·Jinsong Wu,John C. H. Spence	15
17	Coherence and sampling requirements for diffractive imaging 2004 ·Ultramicroscopy ·John C. H. Spence,Uwe Weierstall,M. Howells	93
18	方位に依存した電子エネルギー損失分光法によるMgB 2 の異方的な励起子 2002 ·Physical Review B ·(unknown),(unknown),John C. H. Spence,(unknown),(unknown),(unknown)	16
19	Experimental evidence for dislocation core structures in silicon 2001 ·Scripta Materialia ·John C. H. Spence,Christoph T. Koch	3
20	Structural characterization of Ba₂YCu₃O₇ by high resolution transmission electron microscopy 1988 ·Journal of Electron Microscopy Technique ·A. Ourmazd,John C. H. Spence,Jian‐Min Zuo,(unknown)	10

About John C. H. Spence

John C. H. Spence is a scholar working on Structural Biology, Radiation and Surfaces, Coatings and Films, having authored 178 papers that have together received 6.2k indexed citations. Recurring topics across this work include Advanced Electron Microscopy Techniques and Applications (72 papers), Advanced X-ray Imaging Techniques (64 papers) and Electron and X-Ray Spectroscopy Techniques (36 papers). The work is most often cited by research in Structural Biology (2.3k citations), Radiation (2.9k citations) and Surfaces, Coatings and Films (886 citations). John C. H. Spence has collaborated with scholars based in United States, Germany and China. Frequent co-authors include Uwe Weierstall, Henry N. Chapman, Stefano Marchesini, Malcolm R. Howells, J. Taftø, Jian‐Min Zuo, R. Bruce Doak, Stefan P. Hau‐Riege, Haifeng He and Aleksandr Noy. Their work appears in journals such as Nature, Journal of the American Chemical Society and Physical Review Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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