Jiyoon Yoo
- Control and Systems Engineering top 2%
- Electrical and Electronic Engineering top 10%
- Mechanical Engineering top 10%
- Electronic, Optical and Magnetic Materials
- Mechanics of Materials
- Co-authors
- Sang Bin LeeRangarajan M. TallamG.C. StoneG.B. KlimanT.G. HabetlerRonald G. HarleyJae Hoon JangJoan Pons-Llinares
- Topics
- Machine Fault Diagnosis Techniques (8 papers)Multilevel Inverters and Converters (4 papers)Non-Destructive Testing Techniques (4 papers)
- Journals
- IEEE Transactions on Power ElectronicsIEEE Transactions on Industry ApplicationsIEEE Transactions on Energy Conversion
- Partner nations
- South KoreaSpainAustria
In The Last Decade
Jiyoon Yoo
18 papers receiving 577 citations
Peers
Comparison fields: 5 of 42
- Control and Systems Engineering 407
- Electrical and Electronic Engineering 372
- Mechanical Engineering 200
- Electronic, Optical and Magnetic Materials 71
- Mechanics of Materials 69
Countries citing papers authored by Jiyoon Yoo
This map shows the geographic impact of Jiyoon Yoo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jiyoon Yoo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jiyoon Yoo more than expected).
Fields of papers citing papers by Jiyoon Yoo
This network shows the impact of papers produced by Jiyoon Yoo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jiyoon Yoo. The network helps show where Jiyoon Yoo may publish in the future.
Co-authorship network of co-authors of Jiyoon Yoo
This figure shows the co-authorship network connecting the top 25 collaborators of Jiyoon Yoo. A scholar is included among the top collaborators of Jiyoon Yoo based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jiyoon Yoo. Jiyoon Yoo is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | 13 | |
| 3 | 8 | |
| 4 | 72 | |
| 5 | 0 | |
| 6 | 91 | |
| 7 | 2 | |
| 8 | 7 | |
| 9 | 11 | |
| 10 | 29 | |
| 11 | 0 | |
| 12 | 240 | |
| 13 | 1 | |
| 14 | 10 | |
| 15 | 6 | |
| 16 | 22 | |
| 17 | 56 | |
| 18 | 3 | |
| 19 | 2 | |
| 20 | 19 |
About Jiyoon Yoo
Jiyoon Yoo is a scholar working on Control and Systems Engineering, Safety, Risk, Reliability and Quality and Electrical and Electronic Engineering, having authored 20 papers that have together received 597 indexed citations. Recurring topics across this work include Machine Fault Diagnosis Techniques (8 papers), Multilevel Inverters and Converters (4 papers) and Non-Destructive Testing Techniques (4 papers). The work is most often cited by research in Control and Systems Engineering (407 citations), Electrical and Electronic Engineering (372 citations) and Mechanical Engineering (200 citations). Jiyoon Yoo has collaborated with scholars based in South Korea, Spain and Austria. Frequent co-authors include Sang Bin Lee, Rangarajan M. Tallam, G.C. Stone, G.B. Kliman, T.G. Habetler, Ronald G. Harley, Jae Hoon Jang, Joan Pons-Llinares, Jongbin Park and M. Riera‐Guasp. Their work appears in journals such as IEEE Transactions on Power Electronics, IEEE Transactions on Industry Applications and IEEE Transactions on Energy Conversion.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.