Manuel G. Melero
- Electrical and Electronic Engineering top 10%
- Control and Systems Engineering top 5%
- Mechanical Engineering top 10%
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Co-authors
- Gonzalo A. OrcajoM.F. CabanasCarlos H. RojasJosé M. CanoJoaquín G. NorniellaF. PedrayesF. NuñoJuan M. Menéndez-Aguado
- Topics
- Non-Destructive Testing Techniques (10 papers)Magnetic Properties and Applications (10 papers)Machine Fault Diagnosis Techniques (9 papers)
In The Last Decade
Manuel G. Melero
45 papers receiving 619 citations
Peers
Comparison fields: 5 of 55
- Electrical and Electronic Engineering 388
- Control and Systems Engineering 355
- Mechanical Engineering 232
- Electronic, Optical and Magnetic Materials 129
- Materials Chemistry 76
Countries citing papers authored by Manuel G. Melero
This map shows the geographic impact of Manuel G. Melero's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Manuel G. Melero with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Manuel G. Melero more than expected).
Fields of papers citing papers by Manuel G. Melero
This network shows the impact of papers produced by Manuel G. Melero. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Manuel G. Melero. The network helps show where Manuel G. Melero may publish in the future.
Co-authorship network of co-authors of Manuel G. Melero
This figure shows the co-authorship network connecting the top 25 collaborators of Manuel G. Melero. A scholar is included among the top collaborators of Manuel G. Melero based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Manuel G. Melero. Manuel G. Melero is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | 5 | |
| 3 | 2 | |
| 4 | 8 | |
| 5 | 7 | |
| 6 | 13 | |
| 7 | 4 | |
| 8 | 17 | |
| 9 | 1 | |
| 10 | 5 | |
| 11 | 16 | |
| 12 | 29 | |
| 13 | 2 | |
| 14 | 50 | |
| 15 | 1 | |
| 16 | 27 | |
| 17 | 24 | |
| 18 | 1 | |
| 19 | 5 | |
| 20 | 11 |
About Manuel G. Melero
Manuel G. Melero is a scholar working on Electronic, Optical and Magnetic Materials, Control and Systems Engineering and Automotive Engineering, having authored 47 papers that have together received 650 indexed citations. Recurring topics across this work include Non-Destructive Testing Techniques (10 papers), Magnetic Properties and Applications (10 papers) and Machine Fault Diagnosis Techniques (9 papers). The work is most often cited by research in Control and Systems Engineering (355 citations), Electronic, Optical and Magnetic Materials (129 citations) and Electrical and Electronic Engineering (388 citations). Manuel G. Melero has collaborated with scholars based in Spain and France. Frequent co-authors include Gonzalo A. Orcajo, M.F. Cabanas, Carlos H. Rojas, José M. Cano, Joaquín G. Norniella, F. Pedrayes, F. Nuño, Juan M. Menéndez-Aguado, Juan José del Coz Díaz and Teresa Calvet. Their work appears in journals such as IEEE Transactions on Industrial Electronics, IEEE Transactions on Power Electronics and Energy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.