Jie Bai
- Aerospace Engineering top 10%
- Electrical and Electronic Engineering
- Computer Vision and Pattern Recognition top 10%
- Control and Systems Engineering top 10%
- Artificial Intelligence
- Topics
- Advanced SAR Imaging Techniques (7 papers)Advanced Measurement and Detection Methods (6 papers)Autonomous Vehicle Technology and Safety (6 papers)
- Journals
- SHILAP Revista de lepidopterologíaJournal of Applied PhysicsIEEE Transactions on Industrial Electronics
- Partner nations
- ChinaUnited StatesHong Kong
In The Last Decade
Jie Bai
73 papers receiving 706 citations
Peers
Comparison fields: 5 of 132
- Aerospace Engineering 181
- Electrical and Electronic Engineering 173
- Computer Vision and Pattern Recognition 139
- Control and Systems Engineering 98
- Artificial Intelligence 90
Countries citing papers authored by Jie Bai
This map shows the geographic impact of Jie Bai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jie Bai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jie Bai more than expected).
Fields of papers citing papers by Jie Bai
This network shows the impact of papers produced by Jie Bai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jie Bai. The network helps show where Jie Bai may publish in the future.
Co-authorship network of co-authors of Jie Bai
This figure shows the co-authorship network connecting the top 25 collaborators of Jie Bai. A scholar is included among the top collaborators of Jie Bai based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jie Bai. Jie Bai is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 0 | |
| 5 | 6 | |
| 6 | 0 | |
| 7 | 9 | |
| 8 | 2 | |
| 9 | 1 | |
| 10 | 4 | |
| 11 | 1 | |
| 12 | 1 | |
| 13 | 0 | |
| 14 | 1 | |
| 15 | 2 | |
| 16 | 0 | |
| 17 | Association Between Polypharmacy, Anxiety, and Depression Among Chinese Older Adults: Evidence from the Chinese Longitudinal Healthy Longevity Survey | 19 |
| 18 | 6 | |
| 19 | 2 | |
| 20 | 0 |
About Jie Bai
Jie Bai is a scholar working on Instrumentation, Aerospace Engineering and Electrical and Electronic Engineering, having authored 96 papers that have together received 732 indexed citations. Recurring topics across this work include Advanced SAR Imaging Techniques (7 papers), Advanced Measurement and Detection Methods (6 papers) and Autonomous Vehicle Technology and Safety (6 papers). The work is most often cited by research in Instrumentation (35 citations), Aerospace Engineering (181 citations) and Computer Vision and Pattern Recognition (139 citations). Jie Bai has collaborated with scholars based in China, United States and Hong Kong. Frequent co-authors include Libo Huang, Hua Cui, Sen Li, Simon X. Yang, Daqi Zhu, Qiao Sun, Sihan Chen, Cheng Cheng, Xichan Zhu and Lianqing Zheng. Their work appears in journals such as SHILAP Revista de lepidopterología, Journal of Applied Physics and IEEE Transactions on Industrial Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.