J.C.H. Phang

2.6k total citations · 1 hit paper
118 papers, 2.1k citations indexed

About

J.C.H. Phang is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering. According to data from OpenAlex, J.C.H. Phang has authored 118 papers receiving a total of 2.1k indexed citations (citations by other indexed papers that have themselves been cited), including 106 papers in Electrical and Electronic Engineering, 40 papers in Surfaces, Coatings and Films and 38 papers in Biomedical Engineering. Recurrent topics in J.C.H. Phang's work include Integrated Circuits and Semiconductor Failure Analysis (74 papers), Electron and X-Ray Spectroscopy Techniques (35 papers) and Near-Field Optical Microscopy (34 papers). J.C.H. Phang is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (74 papers), Electron and X-Ray Spectroscopy Techniques (35 papers) and Near-Field Optical Microscopy (34 papers). J.C.H. Phang collaborates with scholars based in Singapore, Germany and United States. J.C.H. Phang's co-authors include D.S.H. Chan, Joel Phillips, John T. L. Thong, Victor Ong, L.J. Balk, D.S.H. Chan, K. S. Sim, Colin J. R. Sheppard, Xudong Chen and Daniel S. H. Chan and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Optics Express.

In The Last Decade

J.C.H. Phang

109 papers receiving 2.0k citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Analytical methods for the extraction of solar-cell single- and double-diode model parameters from I-V characteristics

1987 574 citations D.S.H. Chan, J.C.H. Phang IEEE Transactions on Electron Devices profile →

Peers

Countries citing papers authored by J.C.H. Phang

Since Specialization

Citations

This map shows the geographic impact of J.C.H. Phang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.C.H. Phang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.C.H. Phang more than expected).

Fields of papers citing papers by J.C.H. Phang

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.C.H. Phang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.C.H. Phang. The network helps show where J.C.H. Phang may publish in the future.

Co-authorship network of co-authors of J.C.H. Phang

This figure shows the co-authorship network connecting the top 25 collaborators of J.C.H. Phang. A scholar is included among the top collaborators of J.C.H. Phang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J.C.H. Phang. J.C.H. Phang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	A complete and computationally efficient numerical model of aplanatic solid immersion lens scanning microscope 2013 ·Optics Express ·Rui Chen, Krishna Agarwal, Colin J. R. Sheppard, J.C.H. Phang, Xudong Chen	13
2	Complete modeling of subsurface microscopy system based on aplanatic solid immersion lens 2012 ·Journal of the Optical Society of America A ·Rui Chen, Krishna Agarwal, Yu Zhong, Colin J. R. Sheppard, J.C.H. Phang, Xudong Chen	13
3	Resolution of aplanatic solid immersion lens based microscopy 2012 ·Journal of the Optical Society of America A ·Rui Chen, Krishna Agarwal, Colin J. R. Sheppard, J.C.H. Phang, Xudong Chen	10
4	Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs 2008 ·National University of Singapore ·(unknown), (unknown), Katsuaki Toh, Dmitry Isakov, D.S.H. Chan, (unknown), (unknown), J.C.H. Phang	1
5	Combining Refractive Solid Immersion Lens and Pulsed Laser Induced Techniques for Effective Defect Localization on Microprocessors 2008 ·Proceedings - International Symposium for Testing and Failure Analysis ·(unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), J.C.H. Phang	4
6	Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror optics 2004 ·Review of Scientific Instruments ·D.S.H. Chan, Y. Y. Liu, J.C.H. Phang, Э. И. Рау, (unknown), (unknown)	3
7	A review of laser induced techniques for microelectronic failure analysis 2004 ·J.C.H. Phang, D.S.H. Chan, Murugesan Palaniappan, (unknown), (unknown), Mike Bruce, (unknown), (unknown), (unknown), (unknown), Hong Ng, Shuangshuang Tan	40
8	Automatic Integrated Circuit Die Positioning in the Scanning Electron Microscope 2002 ·Scanning ·Hong Tan, J.C.H. Phang, John T. L. Thong	2
9	Single‐image signal‐to‐noise ratio estimation 2001 ·Scanning ·John T. L. Thong, K. S. Sim, J.C.H. Phang	54
10	Front- and backside investigations of thermal and electronic properties of semiconducting devices 1999 ·Microelectronics Reliability ·(unknown), Wolfgang Schade, Murugesan Palaniappan, Vivian Ng, J.C.H. Phang, L.J. Balk	7
11	An integrated (automated) photon emission microscope and MOSFET characterisation system for combined microscopic and macroscopic device analysis 1999 ·Ting Hui Ng, W. K. Chim, D.S.H. Chan, J.C.H. Phang, (unknown), (unknown), (unknown), (unknown)	4
12	A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor 1996 ·(unknown), Y. Y. Liu, D.S.H. Chan, W. K. Chim, J.C.H. Phang, L.J. Balk, (unknown)	5
13	Unconnected junction contrast in ion beam induced charge microscopy 1996 ·Applied Physics Letters ·(unknown), Victor Ong, D.S.H. Chan, J.C.H. Phang, T. Osipowicz, Fiona M. Watt	5
14	Cathodoluminescence Contrast of Localized Defects Part II. Defect Investigation 1995 ·Scanning microscopy ·K. L. Pey, J.C.H. Phang, D.S.H. Chan	2
15	Cathodoluminescence Contrast of Localized Defects Part I. Numerical Model for Simulation 1995 ·Scanning microscopy ·K. L. Pey, D.S.H. Chan, J.C.H. Phang	2
16	Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester 1994 ·Applied Physics Letters ·J.C.H. Phang, Kok Swee Sim, D.S.H. Chan	0
17	Modelling techniques for the quantification of some electron beam induced phenomena 1992 ·Scanning microscopy ·W. K. Chim, D.S.H. Chan, T.S. Low, J.C.H. Phang, Kok Swee Sim, K. L. Pey	1
18	Electron trajectory tracking algorithms for analysing voltage contrast signals in the scanning electron microscope 1988 ·Journal of Physics D Applied Physics ·W. K. Chim, T.S. Low, D.S.H. Chan, J.C.H. Phang	6
19	Comments on the experimental determination of series resistance in solar cells 1984 ·IEEE Transactions on Electron Devices ·J.C.H. Phang, D.S.H. Chan, Yoko Wong	8
20	Experimental and theoretical investigations of parameters controlling line profiles in electron-beam lithography 1981 ·IEE Proceedings I Solid State and Electron Devices ·J.C.H. Phang, H. Ahmed	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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