L.J. Balk

1.5k total citations
117 papers, 1.1k citations indexed

About

L.J. Balk is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, L.J. Balk has authored 117 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 72 papers in Electrical and Electronic Engineering, 56 papers in Atomic and Molecular Physics, and Optics and 54 papers in Biomedical Engineering. Recurrent topics in L.J. Balk's work include Integrated Circuits and Semiconductor Failure Analysis (47 papers), Force Microscopy Techniques and Applications (44 papers) and Near-Field Optical Microscopy (43 papers). L.J. Balk is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (47 papers), Force Microscopy Techniques and Applications (44 papers) and Near-Field Optical Microscopy (43 papers). L.J. Balk collaborates with scholars based in Germany, Singapore and China. L.J. Balk's co-authors include R. Heiderhoff, Ullrich Scherf, Guoli Tu, Michael Förster, J.C.H. Phang, Hongbo Li, Hongbo Li, R. Sigel, E. Kubalek and Sylwia Adamczyk and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

L.J. Balk

110 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
L.J. Balk Germany 16 640 487 372 330 244 117 1.1k
M. Pietralla Germany 15 161 0.3× 471 1.0× 125 0.3× 171 0.5× 261 1.1× 56 890
D.S. Chung South Korea 12 493 0.8× 1.7k 3.5× 384 1.0× 626 1.9× 103 0.4× 19 1.9k
Fuh‐Shyang Juang Taiwan 17 677 1.1× 405 0.8× 263 0.7× 139 0.4× 139 0.6× 107 982
Alireza Nojeh Canada 20 450 0.7× 1.2k 2.5× 306 0.8× 336 1.0× 37 0.2× 106 1.6k
V. Semet France 19 450 0.7× 1.1k 2.2× 333 0.9× 479 1.5× 40 0.2× 50 1.4k
A. Poruba Czechia 19 1.4k 2.2× 1.0k 2.1× 181 0.5× 223 0.7× 197 0.8× 80 1.6k
Frank W. Mont United States 19 804 1.3× 460 0.9× 336 0.9× 323 1.0× 100 0.4× 36 1.4k
Masashi Kuwahara Japan 20 836 1.3× 916 1.9× 301 0.8× 439 1.3× 89 0.4× 95 1.3k
Ping Han China 20 596 0.9× 713 1.5× 329 0.9× 226 0.7× 74 0.3× 127 1.4k
Shawn-Yu Lin United States 10 403 0.6× 408 0.8× 348 0.9× 428 1.3× 80 0.3× 16 1.1k

Countries citing papers authored by L.J. Balk

Since Specialization
Citations

This map shows the geographic impact of L.J. Balk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L.J. Balk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L.J. Balk more than expected).

Fields of papers citing papers by L.J. Balk

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L.J. Balk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L.J. Balk. The network helps show where L.J. Balk may publish in the future.

Co-authorship network of co-authors of L.J. Balk

This figure shows the co-authorship network connecting the top 25 collaborators of L.J. Balk. A scholar is included among the top collaborators of L.J. Balk based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with L.J. Balk. L.J. Balk is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Heiderhoff, R., et al.. (2010). Nanoscale thermally induced stress analysis by complementary Scanning Thermal Microscopy techniques. Microelectronics Reliability. 50(9-11). 1459–1463. 3 indexed citations
2.
Heiderhoff, R., et al.. (2008). Quantitative determination of electric field strengths within dynamically operated devices using EBIC analysis in the SEM. Scanning. 30(4). 324–330. 5 indexed citations
3.
Tu, Guoli, Hongbo Li, Michael Förster, et al.. (2006). Conjugated Triblock Copolymers Containing Both Electron-Donor and Electron-Acceptor Blocks. Macromolecules. 39(13). 4327–4331. 82 indexed citations
4.
Heiderhoff, R., et al.. (2006). Time-Resolved and Stroboscopic EBIC Analyses on Dynamically Biased Active Devices. 24. 602–607. 2 indexed citations
5.
Meincken, Martina, L.J. Balk, & R.D. Sanderson. (2003). Measurement of thermal parameters and mechanical properties of polymers by atomic force microscopy. Surface and Interface Analysis. 35(13). 1034–1040. 10 indexed citations
6.
7.
Heiderhoff, R., et al.. (2002). Dynamic characterization of ferroelectric domains of BaTiO3 by scanning near-field acoustic microscopy. Materials Chemistry and Physics. 75(1-3). 125–130. 1 indexed citations
8.
Heiderhoff, R., et al.. (2000). Comparison between standard and near-field cathodoluminescence. Journal of Crystal Growth. 210(1-3). 303–306. 5 indexed citations
9.
Heiderhoff, R., et al.. (1999). Nanoscopic investigations of diamond properties by scanning probe microscopy techniques. Diamond and Related Materials. 8(8-9). 1581–1586. 6 indexed citations
10.
Schade, Wolfgang, et al.. (1999). Front- and backside investigations of thermal and electronic properties of semiconducting devices. Microelectronics Reliability. 39(6-7). 937–940. 7 indexed citations
11.
Гапоненко, Н. В., В. П. Сергеев, J. Misiewicz, et al.. (1999). <title>Erbium photoluminescence in sol-gel-derived titanium dioxide films</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3725. 239–242. 1 indexed citations
12.
Heiderhoff, R., et al.. (1999). Spectrally resolved cathodoluminescence analyses in the optical near‐field. Journal of Microscopy. 194(2-3). 412–414. 4 indexed citations
13.
Heiderhoff, R., et al.. (1999). Quantitative thermal conductivity measurements with nanometre resolution. Journal of Physics D Applied Physics. 32(5). L13–L17. 86 indexed citations
14.
Balk, L.J., et al.. (1998). Scanning electron acoustic microscopy for the evaluation of domain structures in BaTiO3 single crystal and ceramics. Journal of Materials Science. 33(18). 4543–4549. 8 indexed citations
15.
Balk, L.J., et al.. (1998). Scanning Acoustic Microscopes for the Investigation of Ferroelectric Properties of Materials. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 63-64. 361–368. 3 indexed citations
16.
Heiderhoff, R., et al.. (1996). Nanoscopic EBIC technique in a hybrid SEM/SFM system. 366–366. 7 indexed citations
17.
Balk, L.J., et al.. (1994). Imaging of Local Thermal and Electrical Conductivity with Scanning Force Microscopy. Scanning microscopy. 8(2). 4. 12 indexed citations
18.
Stephan, Régis, et al.. (1994). Evaluation of an epitaxial layer structure by lateral force and contact current measurements in a scanning force microscope. Microelectronic Engineering. 24(1-4). 99–106. 6 indexed citations
19.
Balk, L.J., et al.. (1984). Investigation of Si-Fe transformer sheets by scanning electron acoustic microscopy (SEAM). IEEE Transactions on Magnetics. 20(5). 1466–1468. 13 indexed citations
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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