Mike Bruce

852 total citations
28 papers, 712 citations indexed

About

Mike Bruce is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Spectroscopy. According to data from OpenAlex, Mike Bruce has authored 28 papers receiving a total of 712 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Atomic and Molecular Physics, and Optics, 14 papers in Electrical and Electronic Engineering and 12 papers in Spectroscopy. Recurrent topics in Mike Bruce's work include Integrated Circuits and Semiconductor Failure Analysis (8 papers), Mass Spectrometry Techniques and Applications (6 papers) and Spectroscopy and Laser Applications (6 papers). Mike Bruce is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (8 papers), Mass Spectrometry Techniques and Applications (6 papers) and Spectroscopy and Laser Applications (6 papers). Mike Bruce collaborates with scholars based in United States, Singapore and United Kingdom. Mike Bruce's co-authors include R. A. Bonham, Ce Ma, J. W. Keto, N. Böwering, Lan Mi, Hong Cai, Bo Egardt, James M. Kohel, Stefan Pettersson and Paiboon Tangyunyong and has published in prestigious journals such as The Journal of Chemical Physics, Physical Review A and Chemical Physics Letters.

In The Last Decade

Mike Bruce

27 papers receiving 659 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Mike Bruce United States 14 499 359 269 87 76 28 712
S. Lavi Israel 10 258 0.5× 136 0.4× 272 1.0× 24 0.3× 48 0.6× 22 432
Simi George United States 13 162 0.3× 37 0.1× 282 1.0× 42 0.5× 84 1.1× 55 485
G G Petrash Russia 13 215 0.4× 289 0.8× 566 2.1× 61 0.7× 56 0.7× 105 634
W. R. Sooy United States 10 512 1.0× 64 0.2× 449 1.7× 43 0.5× 33 0.4× 19 673
Scott Halle United States 13 182 0.4× 144 0.4× 306 1.1× 37 0.4× 74 1.0× 59 521
W. P. Lapatovich United States 9 275 0.6× 85 0.2× 188 0.7× 11 0.1× 31 0.4× 23 468
Bernd Bodermann Germany 13 253 0.5× 105 0.3× 240 0.9× 199 2.3× 239 3.1× 89 697
Vadim Smirnov United States 18 693 1.4× 52 0.1× 748 2.8× 47 0.5× 35 0.5× 64 967
П. А. Бохан Russia 15 274 0.5× 144 0.4× 734 2.7× 29 0.3× 49 0.6× 126 834
Jiangfeng Zhu China 17 873 1.7× 49 0.1× 927 3.4× 52 0.6× 40 0.5× 171 1.2k

Countries citing papers authored by Mike Bruce

Since Specialization
Citations

This map shows the geographic impact of Mike Bruce's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mike Bruce with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mike Bruce more than expected).

Fields of papers citing papers by Mike Bruce

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mike Bruce. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mike Bruce. The network helps show where Mike Bruce may publish in the future.

Co-authorship network of co-authors of Mike Bruce

This figure shows the co-authorship network connecting the top 25 collaborators of Mike Bruce. A scholar is included among the top collaborators of Mike Bruce based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Mike Bruce. Mike Bruce is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Bruce, Mike, et al.. (2012). Through silicon in-circuit logic analysis for localizing logic pattern failures. Microelectronics Reliability. 52(9-10). 2043–2049. 2 indexed citations
3.
Bruce, Mike, Bo Egardt, & Stefan Pettersson. (2005). On powertrain oscillation damping using feedforward and LQ feedback control. 1. 1415–1420. 20 indexed citations
4.
Phang, J.C.H., D.S.H. Chan, Murugesan Palaniappan, et al.. (2004). A review of laser induced techniques for microelectronic failure analysis. 255–261. 40 indexed citations
5.
Cole, Edward I., Mike Bruce, Daniel L. Barton, et al.. (2004). Optical tools and techniques for failure analysis of modern integrated circuits. 2. 537–538. 2 indexed citations
6.
Cole, Edward I., et al.. (2003). Resistive interconnection localization. 15–21. 18 indexed citations
7.
Bruce, Mike, et al.. (2003). Controlled silicon thinning for design debug of C4 packaged ICs. 34. 327–332. 3 indexed citations
8.
Palaniappan, Murugesan, et al.. (2001). New Signal Detection Methods for Thermal Beam Induced Phenomenon. 171–177. 5 indexed citations
9.
Bruce, Mike, et al.. (1999). Waveform Acquisition from the Backside of Silicon Using Electro-Optic Probing. Proceedings - International Symposium for Testing and Failure Analysis. 30835. 19–25. 11 indexed citations
10.
Bruce, Mike & R. A. Bonham. (1995). Electron-ion coincidence experiments: absolute detector efficiencies and neutral dissociation cross sections. Journal of Molecular Structure. 352-353. 235–243. 12 indexed citations
11.
Bruce, Mike, et al.. (1994). Covariance mapping mass spectroscopy using a pulsed electron ionizing source: application to CF4. Journal of Physics B Atomic Molecular and Optical Physics. 27(23). 5773–5794. 60 indexed citations
12.
Bruce, Mike & R. A. Bonham. (1993). On the partial ionization cross-sections for CF4 by use of the pulsed-electron-beam time-of-flight method. International Journal of Mass Spectrometry and Ion Processes. 123(2). 97–100. 59 indexed citations
13.
Bruce, Mike, Ce Ma, & R. A. Bonham. (1992). Positive ion pair production by electron impact dissociative ionization of CF4. Chemical Physics Letters. 190(3-4). 285–290. 55 indexed citations
14.
Bruce, Mike & R. A. Bonham. (1992). Problems in the measurement of the Ar2+/Ar+ partial ionization cross-section ratio by use of the pulsed-electron-beam time-of-flight method. Zeitschrift für Physik D Atoms Molecules and Clusters. 24(2). 149–154. 39 indexed citations
15.
Ma, Ce, Mike Bruce, & R. A. Bonham. (1991). Absolute partial and total electron-impact-ionization cross sections forCF4from threshold up to 500 eV. Physical Review A. 44(5). 2921–2934. 91 indexed citations
16.
Bruce, Mike, et al.. (1990). Reactive quenching of two-photon excited xenon atoms by Cl2. The Journal of Chemical Physics. 92(1). 420–427. 19 indexed citations
17.
Bruce, Mike, et al.. (1990). A multichannel harpoon model for reactive quenching of Xe 5p5n p by Cl2. The Journal of Chemical Physics. 92(1). 428–436. 11 indexed citations
18.
Bruce, Mike, et al.. (1988). Moving Into the Mainstream. Management Education and Development. 19(3). 187–200. 7 indexed citations
19.
Böwering, N., Mike Bruce, & J. W. Keto. (1986). Collisional deactivation of two-photon laser excited xenon 5p5 6p. I. State-to-state reaction rates. The Journal of Chemical Physics. 84(2). 709–714. 52 indexed citations
20.
Böwering, N., et al.. (1986). Collisional deactivation of two-photon laser excited xenon 5p5 6p. II. Lifetimes and total quench rates. The Journal of Chemical Physics. 84(2). 715–726. 57 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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