D.S.H. Chan

1.6k total citations
70 papers, 1.3k citations indexed

About

D.S.H. Chan is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, D.S.H. Chan has authored 70 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 61 papers in Electrical and Electronic Engineering, 14 papers in Biomedical Engineering and 14 papers in Materials Chemistry. Recurrent topics in D.S.H. Chan's work include Semiconductor materials and devices (39 papers), Integrated Circuits and Semiconductor Failure Analysis (26 papers) and Advancements in Semiconductor Devices and Circuit Design (26 papers). D.S.H. Chan is often cited by papers focused on Semiconductor materials and devices (39 papers), Integrated Circuits and Semiconductor Failure Analysis (26 papers) and Advancements in Semiconductor Devices and Circuit Design (26 papers). D.S.H. Chan collaborates with scholars based in Singapore, United States and South Korea. D.S.H. Chan's co-authors include Chunxiang Zhu, W. K. Chim, E. T. Kang, K. G. Neoh, N. Balasubramanian, Byung Jin Cho, J.C.H. Phang, Albert Chin, Qingchun Zhang and Dim-Lee Kwong and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Chemistry of Materials.

In The Last Decade

D.S.H. Chan

69 papers receiving 1.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
D.S.H. Chan Singapore 19 1.1k 404 228 180 171 70 1.3k
Hee Chul Lee South Korea 16 705 0.6× 321 0.8× 175 0.8× 140 0.8× 199 1.2× 110 1.0k
Motoyasu Terao Japan 16 660 0.6× 544 1.3× 264 1.2× 330 1.8× 63 0.4× 63 907
Hiroyuki Miyazoe United States 19 752 0.7× 560 1.4× 221 1.0× 117 0.7× 73 0.4× 55 1.0k
Hi‐Deok Lee South Korea 18 1.3k 1.2× 532 1.3× 270 1.2× 249 1.4× 97 0.6× 195 1.5k
Valeri Afanas’ev Belgium 26 1.3k 1.1× 782 1.9× 90 0.4× 225 1.3× 70 0.4× 101 1.6k
V. Ioannou-Sougleridis Greece 15 752 0.7× 495 1.2× 168 0.7× 153 0.8× 70 0.4× 68 854
W. Eccleston United Kingdom 19 1.2k 1.1× 401 1.0× 152 0.7× 195 1.1× 196 1.1× 105 1.3k
H. Grampeix France 19 1.0k 0.9× 297 0.7× 148 0.6× 140 0.8× 68 0.4× 62 1.1k
Jong Duk Lee South Korea 16 836 0.7× 500 1.2× 111 0.5× 115 0.6× 59 0.3× 91 1.0k
Hideki Horii South Korea 20 961 0.8× 1.0k 2.6× 194 0.9× 72 0.4× 197 1.2× 40 1.2k

Countries citing papers authored by D.S.H. Chan

Since Specialization
Citations

This map shows the geographic impact of D.S.H. Chan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.S.H. Chan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.S.H. Chan more than expected).

Fields of papers citing papers by D.S.H. Chan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D.S.H. Chan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.S.H. Chan. The network helps show where D.S.H. Chan may publish in the future.

Co-authorship network of co-authors of D.S.H. Chan

This figure shows the co-authorship network connecting the top 25 collaborators of D.S.H. Chan. A scholar is included among the top collaborators of D.S.H. Chan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D.S.H. Chan. D.S.H. Chan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Li, Liang, Qidan Ling, Chunxiang Zhu, et al.. (2008). Bilayer Memory Device Based on a Conjugated Copolymer and a Carbon Nanotube/Polyaniline Composite. Journal of The Electrochemical Society. 155(4). H205–H205. 11 indexed citations
2.
Toh, Katsuaki, et al.. (2008). Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs. National University of Singapore. 1–5. 1 indexed citations
3.
Hwang, Wan Sik, et al.. (2007). A Novel Hafnium Carbide (HfC<inf>x</inf>) Metal Gate Electrode for NMOS Device Application. National University of Singapore. 156–157. 6 indexed citations
4.
Toh, Katsuaki, Dmitry Isakov, D.S.H. Chan, et al.. (2007). Near-IR Photon Emission Spectroscopy on Strained and Unstrained 60 nm Silicon nMOSFETs. Proceedings - International Symposium for Testing and Failure Analysis. 30903. 81–85. 2 indexed citations
5.
Chin, Albert, Chunxiang Zhu, Jun Shao, et al.. (2006). Physical and electrical characteristics of high-κ gate dielectric Hf(1−x)LaxOy. Solid-State Electronics. 50(6). 986–991. 50 indexed citations
6.
Chan, D.S.H., et al.. (2004). Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror optics. Review of Scientific Instruments. 75(10). 3191–3199. 3 indexed citations
7.
Phang, J.C.H., D.S.H. Chan, Murugesan Palaniappan, et al.. (2004). A review of laser induced techniques for microelectronic failure analysis. 255–261. 40 indexed citations
8.
Gupta, Rohit, Won Jong Yoo, Yingqian Wang, et al.. (2004). Formation of SiGe nanocrystals in HfO2 using in situ chemical vapor deposition for memory applications. Applied Physics Letters. 84(21). 4331–4333. 21 indexed citations
9.
Yoo, Won Jong, et al.. (2004). Investigation of etching properties of HfO based high-Kdielectrics using inductively coupled plasma. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 22(4). 1552–1558. 35 indexed citations
10.
Joo, Moon Sig, Byung Jin Cho, Chia Ching Yeo, et al.. (2003). Formation of hafnium-aluminum-oxide gate dielectric using single cocktail liquid source in MOCVD process. IEEE Transactions on Electron Devices. 50(10). 2088–2094. 51 indexed citations
11.
Liu, Xiao, J.C.H. Phang, D.S.H. Chan, & W. K. Chim. (2002). A new method for the localisation of metallization defects using cathodoluminescence imaging. 264–269.
12.
Chan, D.S.H., et al.. (1999). Capped-porphyrin precursors. Acta Crystallographica Section C Crystal Structure Communications. 55(5). 801–806. 2 indexed citations
14.
Lu, Yongfeng, et al.. (1998). Studies of Carbon Nitride Thin Films Synthesized by KrF Excimer Ablation of Graphite in Nitrogen Atmosphere. MRS Proceedings. 526. 5 indexed citations
15.
Lu, Yongfeng, et al.. (1998). Steam Laser Cleaning of Plasma-Etch-Induced Polymers from Via Holes. Japanese Journal of Applied Physics. 37(5R). 2524–2524. 10 indexed citations
16.
Chim, W. K., et al.. (1998). Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing. Semiconductor Science and Technology. 13(5). 453–459. 5 indexed citations
17.
Lu, Yongfeng, et al.. (1997). Removal of submicron particles from nickel-phosphorus surfaces by pulsed laser irradiation. Applied Surface Science. 120(3-4). 317–322. 13 indexed citations
18.
Chim, W. K., et al.. (1997). Investigation of interface traps in LDD pMOST's by the DCIV method. IEEE Electron Device Letters. 18(12). 583–585. 24 indexed citations
19.
Ong, Victor, et al.. (1996). Unconnected junction contrast in ion beam induced charge microscopy. Applied Physics Letters. 68(4). 532–534. 5 indexed citations
20.
Lau, W. S., et al.. (1995). Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced current. Journal of Applied Physics. 77(2). 739–746. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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