James C. Sturm
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Materials Chemistry
- Polymers and Plastics
- Biomedical Engineering
- Co-authors
- Ken A. NagamatsuJanam JhaveriGirija SahasrabudheGabriel ManAntoine KahnJeffrey SchwartzS. WagnerAlexander Berg
- Topics
- Semiconductor materials and devices (5 papers)Thin-Film Transistor Technologies (5 papers)Semiconductor materials and interfaces (4 papers)
- Cited by
- Electrical and Electronic EngineeringPolymers and PlasticsAtomic and Molecular Physics, and Optics
- Partner nations
- United StatesCanada
In The Last Decade
James C. Sturm
13 papers receiving 334 citations
Peers
Comparison fields: 5 of 24
- Electrical and Electronic Engineering 296
- Atomic and Molecular Physics, and Optics 126
- Materials Chemistry 123
- Polymers and Plastics 64
- Biomedical Engineering 61
Countries citing papers authored by James C. Sturm
This map shows the geographic impact of James C. Sturm's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by James C. Sturm with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites James C. Sturm more than expected).
Fields of papers citing papers by James C. Sturm
This network shows the impact of papers produced by James C. Sturm. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by James C. Sturm. The network helps show where James C. Sturm may publish in the future.
Co-authorship network of co-authors of James C. Sturm
This figure shows the co-authorship network connecting the top 25 collaborators of James C. Sturm. A scholar is included among the top collaborators of James C. Sturm based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with James C. Sturm. James C. Sturm is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 68 | |
| 2 | 125 | |
| 3 | 14 | |
| 4 | 1 | |
| 5 | 16 | |
| 6 | 6 | |
| 7 | Boron segregation in polycrystalline Si(1-x-y)Ge(x)C(y) alloys | 0 |
| 8 | 19 | |
| 9 | 2 | |
| 10 | Effect of carbon on the valence band offset of Si1-x-yGexCy/Si heterojunctions | 1 |
| 11 | 69 | |
| 12 | 1 | |
| 13 | 16 | |
| 14 | 7 |
About James C. Sturm
James C. Sturm is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 14 papers that have together received 345 indexed citations. Recurring topics across this work include Semiconductor materials and devices (5 papers), Thin-Film Transistor Technologies (5 papers) and Semiconductor materials and interfaces (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (296 citations), Polymers and Plastics (64 citations) and Atomic and Molecular Physics, and Optics (126 citations). James C. Sturm has collaborated with scholars based in United States and Canada. Frequent co-authors include Ken A. Nagamatsu, Janam Jhaveri, Girija Sahasrabudhe, Gabriel Man, Antoine Kahn, Jeffrey Schwartz, S. Wagner, Alexander Berg, Sushobhan Avasthi and Michael J. Marsella. Their work appears in journals such as Journal of the American Chemical Society, Advanced Materials and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.