J. van der Weide
- Materials Chemistry top 10%
- Electrical and Electronic Engineering top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Mechanics of Materials top 10%
- Computational Mechanics top 10%
- Co-authors
- R. J. NemanichP. K. BaumannM. G. WensellZheng ZhangJ. BernholcR. F. DavisSean W. KingMark C. Benjamin
- Topics
- Diamond and Carbon-based Materials Research (8 papers)Electronic and Structural Properties of Oxides (4 papers)Semiconductor materials and devices (4 papers)
- Partner nations
- United States
In The Last Decade
J. van der Weide
8 papers receiving 776 citations
Peers
Comparison fields: 5 of 30
- Materials Chemistry 713
- Electrical and Electronic Engineering 383
- Atomic and Molecular Physics, and Optics 184
- Mechanics of Materials 175
- Computational Mechanics 127
Countries citing papers authored by J. van der Weide
This map shows the geographic impact of J. van der Weide's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. van der Weide with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. van der Weide more than expected).
Fields of papers citing papers by J. van der Weide
This network shows the impact of papers produced by J. van der Weide. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. van der Weide. The network helps show where J. van der Weide may publish in the future.
Co-authorship network of co-authors of J. van der Weide
This figure shows the co-authorship network connecting the top 25 collaborators of J. van der Weide. A scholar is included among the top collaborators of J. van der Weide based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. van der Weide. J. van der Weide is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 77 | |
| 2 | Diamond negative electron affinity surfaces, structures and devices | 5 |
| 3 | 50 | |
| 4 | 95 | |
| 5 | 342 | |
| 6 | 19 | |
| 7 | 123 | |
| 8 | Properties of Diamond Surfaces and Metal-Diamond Interfaces: Schottky Barrier Heights and Negative Electron Affinity Effects. | 0 |
| 9 | 88 |
About J. van der Weide
J. van der Weide is a scholar working on Surfaces, Coatings and Films, Materials Chemistry and Computational Mechanics, having authored 9 papers that have together received 799 indexed citations. Recurring topics across this work include Diamond and Carbon-based Materials Research (8 papers), Electronic and Structural Properties of Oxides (4 papers) and Semiconductor materials and devices (4 papers). The work is most often cited by research in Materials Chemistry (713 citations), Surfaces, Coatings and Films (59 citations) and Structural Biology (11 citations). J. van der Weide has collaborated with scholars based in United States. Frequent co-authors include R. J. Nemanich, P. K. Baumann, M. G. Wensell, Zheng Zhang, J. Bernholc, R. F. Davis, Sean W. King, Mark C. Benjamin, Leah Bergman and T. P. Humphreys. Their work appears in journals such as Physical review. B, Condensed matter, Applied Physics Letters and Physica B Condensed Matter.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.